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1. 发明申请

US20060232279A1 Method and machine for repetitive testing of an electrical component 有权
标题翻译：用于电气部件重复测试的方法和机器
公开(公告)号：US20060232279A1
公开(公告)日：2006-10-19
申请号：US11284789
申请日：2005-11-21
申请人： Douglas Garcia , Kyung Kim , Locke Lowman
发明人： Douglas Garcia , Kyung Kim , Locke Lowman
IPC分类号： H01H31/02
CPC分类号： G01R31/01
摘要： A method automatically tests a parameter of an electronic component to determine whether the component has an acceptable value. The method employs an automatic electronic component testing machine having at least first and second measurement positions where the parameter can be measured. The testing process itself may falsely cause the value to appear to be unacceptable when the value is actually acceptable. The method places the component in a first measurement position and measures the parameter in the first position, thereby generating a first measured parameter value. The method also places the component in a second measurement position and measures the parameter in the second position, thereby generating a second measured parameter value. The method rejects the component only if all measured values are unacceptable, whereby the probability of falsely rejecting the component is less than if only a single measuring step were performed.
摘要翻译：方法自动测试电子元件的参数，以确定组件是否具有可接受的值。该方法采用具有至少第一和第二测量位置的自动电子部件测试机，其中可以测量该参数。测试过程本身可能会错误地导致该值在实际可接受时似乎是不可接受的。该方法将组件置于第一测量位置并测量第一位置中的参数，从而生成第一测量参数值。该方法还将组件置于第二测量位置并测量第二位置中的参数，从而生成第二测量参数值。只有当所有测量值不可接受时，该方法才会拒绝该组件，从而错误地拒绝组件的概率小于仅执行单个测量步骤的可能性。

2. 发明授权

US07173432B2 Method and machine for repetitive testing of an electrical component 有权
标题翻译：用于电气部件重复测试的方法和机器
公开(公告)号：US07173432B2
公开(公告)日：2007-02-06
申请号：US11284789
申请日：2005-11-21
申请人： Douglas John Garcia , Kyung Young Kim , Locke Lowman
发明人： Douglas John Garcia , Kyung Young Kim , Locke Lowman
IPC分类号： G01R31/12 , G01R31/02
CPC分类号： G01R31/01
摘要： A method automatically tests a parameter of an electronic component to determine whether the component has an acceptable value. The method employs an automatic electronic component testing machine having at least first and second measurement positions where the parameter can be measured. The testing process itself may falsely cause the value to appear to be unacceptable when the value is actually acceptable. The method places the component in a first measurement position and measures the parameter in the first position, thereby generating a first measured parameter value. The method also places the component in a second measurement position and measures the parameter in the second position, thereby generating a second measured parameter value. The method rejects the component only if all measured values are unacceptable, whereby the probability of falsely rejecting the component is less than if only a single measuring step were performed.
摘要翻译：方法自动测试电子元件的参数，以确定组件是否具有可接受的值。该方法采用具有至少第一和第二测量位置的自动电子部件测试机，其中可以测量该参数。测试过程本身可能会错误地导致该值在实际可接受时似乎是不可接受的。该方法将组件置于第一测量位置并测量第一位置中的参数，从而生成第一测量参数值。该方法还将组件置于第二测量位置并测量第二位置中的参数，从而生成第二测量参数值。只有当所有测量值不可接受时，该方法才会拒绝该组件，从而错误地拒绝组件的概率小于仅执行单个测量步骤的可能性。

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