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    • 3. 发明申请
    • BURIED SUBCOLLECTOR FOR HIGH FREQUENCY PASSIVE DEVICES
    • 用于高频无源器件的BURIED SUBCOLLECTOR
    • US20070105354A1
    • 2007-05-10
    • US11164108
    • 2005-11-10
    • Douglas CoolbaughXuefeng LiuRobert RasselDavid Sheridan
    • Douglas CoolbaughXuefeng LiuRobert RasselDavid Sheridan
    • H01L21/425
    • H01L21/8249H01L29/0821H01L29/66272
    • A method of fabricating a buried subcollector in which the buried subcollector is implanted to a depth in which during subsequent epi growth the buried subcollector remains substantially below the fictitious interface between the epi layer and the substrate is provided. In particular, the inventive method forms a buried subcollector having an upper surface (i.e., junction) that is located at a depth from about 3000 Å or greater from the upper surface of the semiconductor substrate. This deep buried subcollector having an upper surface that is located at a depth from about 3000 Å or greater from the upper surface of the substrate is formed using a reduced implant energy (as compared to a standard deep implanted subcollector process) at a relative high dose. The present invention also provides a semiconductor structure including the inventive buried subcollector which can be used as cathode for passive devices in high frequency applications.
    • 一种制造掩埋子集电极的方法,其中将埋入的子集电极注入深度,其中在随后的外延生长期间,掩埋子集电极基本上保持在外延层和衬底之间的虚拟界面的下方。 特别地,本发明的方法形成了具有从半导体衬底的上表面位于距离大约或更大的深度的上表面(即结)的掩埋子集电极。 该深埋底部集电器具有从衬底的上表面位于距离大约等于或更大的深度的上表面,其使用相对高剂量的减少的注入能量(与标准深度植入子集电极过程相比) 。 本发明还提供了一种半导体结构,其包括本发明的掩埋子集电极,其可以用作高频应用中的无源器件的阴极。
    • 10. 发明申请
    • MOS VARACTOR USING ISOLATION WELL
    • 使用隔离的MOS变压器
    • US20060043454A1
    • 2006-03-02
    • US10711144
    • 2004-08-27
    • Douglas CoolbaughDouglas HershbergerRobert Rassel
    • Douglas CoolbaughDouglas HershbergerRobert Rassel
    • H01L29/94H01L21/20
    • H01L29/93H01L29/94
    • The present invention provides a varactor that has increased tunability and a high quality factor Q as well as a method of fabricating the varactor. The method of the present invention can be integrated into a conventional CMOS processing scheme or into a conventional BiCMOS processing scheme. The method includes providing a structure that includes a semiconductor substrate of a first conductivity type and optionally a subcollector or isolation well (i.e., doped region) of a second conductivity type located below an upper region of the substrate, the first conductivity type is different from said second conductivity type. Next, a plurality of isolation regions are formed in the upper region of the substrate and then a well region is formed in the upper region of the substrate. In some cases, the doped region is formed at this point of the inventive process. The well region includes outer well regions of the second conductivity type and an inner well region of the first conductivity type. Each well of said well region is separated at an upper surface by an isolation region. A field effect transistor having at least a gate conductor of the first conductivity type is then formed above the inner well region.
    • 本发明提供一种具有增加的可调性和高品质因数Q的变容二极管以及制造变容二极管的方法。 本发明的方法可以集成到常规的CMOS处理方案中,或者被整合到常规的BiCMOS处理方案中。 该方法包括提供包括第一导电类型的半导体衬底和位于衬底的上部区域下方的第二导电类型的子集电极或隔离阱(即,掺杂区)的结构,第一导电类型不同于 所述第二导电类型。 接下来,在基板的上部区域形成多个隔离区域,然后在基板的上部区域形成阱区域。 在一些情况下,在本发明方法的这一点形成掺杂区域。 阱区包括第二导电类型的外阱区和第一导电类型的内阱区。 所述阱区的每个阱在上表面被隔离区分开。 然后形成至少具有第一导电类型的栅极导体的场效应晶体管,并在内部阱区域的上方形成。