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    • 1. 发明申请
    • Production test technique for RF circuits using embedded test sensors
    • 使用嵌入式测试传感器的RF电路的生产测试技术
    • US20070033474A1
    • 2007-02-08
    • US11436309
    • 2006-05-18
    • Donghoon HanAbhijit Chatterjee
    • Donghoon HanAbhijit Chatterjee
    • G01R31/28G06F11/00
    • G01R31/2822G01R27/28G01R31/2856
    • A single test stimulus and a simple test configuration with embedded envelope detectors are used to estimate all the specification values of interest for an RF circuit under test in an integrated circuit chip. Envelope detectors are deployed as sensors inside the circuit under test. Where more than one circuit is in an RF device in the integrated circuit, each RF circuit in the device may have its own envelope detector. A signal having, for example, time-varying envelopes is used as an optimized test stimulus. The test makes use of the time-varying and low frequency envelope of the test response. The response of the circuit under test to the optimized test stimulus has features highly correlated with the specifications of interest. The test stimulus is optimized for a set of training circuits, and each training circuit in the set is selected to provide one of a spectrum of test responses to the stimulus. Non-linear regression-based models are built from the set of specification values and set of envelopes derived from testing the training set of circuits. Thereafter when a circuit under test is tested by applying an optimized stimulus, the non-linear regression models are used to map an envelope from the test response of the circuit under test to specification values for the circuit.
    • 使用嵌入式包络检测器的单个测试刺激和简单的测试配置来估计集成电路芯片中被测RF射频电路的所有规格值。 信封检测器作为传感器部署在被测电路内。 在集成电路中的RF器件中多于一个电路的情况下,器件中的每个RF电路可以具有其自身的包络检测器。 具有例如时变包络的信号被用作优化的测试刺激。 该测试利用测试响应的时变和低频包络。 被测电路对优化的测试刺激的响应具有与感兴趣的规格高度相关的特征。 对一组训练电路优化测试刺激,并且选择组中的每个训练电路以提供对刺激的一系列测试响应。 基于非线性回归的模型是从测试电路训练集得到的一组规范值和一组信封构建的。 此后,当通过应用优化的刺激来测试被测电路时,使用非线性回归模型将来自被测电路的测试响应的包络映射到电路的规范值。
    • 2. 发明授权
    • Production test technique for RF circuits using embedded test sensors
    • 使用嵌入式测试传感器的RF电路的生产测试技术
    • US07554335B2
    • 2009-06-30
    • US11436309
    • 2006-05-18
    • Donghoon HanAbhijit Chatterjee
    • Donghoon HanAbhijit Chatterjee
    • G01R31/02
    • G01R31/2822G01R27/28G01R31/2856
    • A single test stimulus and a simple test configuration with embedded envelope detectors are used to estimate all the specification values of interest for an RF circuit under test in an integrated circuit chip. Envelope detectors are deployed as sensors inside the circuit under test. Where more than one circuit is in an RF device in the integrated circuit, each RF circuit in the device may have its own envelope detector. A signal having, for example, time-varying envelopes is used as an optimized test stimulus. The test uses the time-varying and low frequency envelope of the test response. The circuit's response under test to the optimized test stimulus has features highly correlated with the specifications of interest. The test stimulus is optimized for a set of training circuits, and each training circuit in the set is selected to provide one of a spectrum of test responses to the stimulus.
    • 使用嵌入式包络检测器的单个测试刺激和简单测试配置来估计集成电路芯片中被测RF射频电路的所有规格值。 信封检测器作为传感器部署在被测电路内。 在集成电路中的RF器件中多于一个电路的情况下,器件中的每个RF电路可以具有其自身的包络检测器。 具有例如时变包络的信号被用作优化的测试刺激。 测试使用测试响应的时变和低频包络。 电路对优化测试刺激的测试响应具有与感兴趣的规格高度相关的特征。 对一组训练电路优化测试刺激,并且选择组中的每个训练电路以提供对刺激的一系列测试响应。
    • 4. 发明申请
    • IMAGE ENCODING/DECODING METHOD AND DEVICE USING COEFFICIENTS OF ADAPTIVE INTERPOLATION FILTER
    • 图像编码/解码方法和使用自适应滤波器的系数的设备
    • US20110200099A1
    • 2011-08-18
    • US13125956
    • 2009-10-16
    • Hayoon KimDonghoon HanKioh KimDaeyeon KimYunglyul LeeJoohee MoonHaekwang KimByeungwoo Jeon
    • Hayoon KimDonghoon HanKioh KimDaeyeon KimYunglyul LeeJoohee MoonHaekwang KimByeungwoo Jeon
    • H04N7/26
    • H04N19/117H04N19/139H04N19/14H04N19/172H04N19/176H04N19/523H04N19/61
    • An image encoding/decoding method and apparatus using coefficients of an adaptive interpolation filter are disclosed including: a coefficient calculator for calculating adaptive interpolation filter coefficient of a current frame; an image encoder for interpolating reference frames using the adaptive interpolation filter coefficient of the current frame and encoding the current frame using the interpolated reference frames; a filter flag encoder for generating and encoding a coefficient-inserted flag or coefficient non-inserted flag as a filter flag according to the adaptive interpolation filter coefficient of the current frame; a coefficient encoder for encoding the adaptive interpolation filter coefficient of the current frame when the filter flag is a coefficient-inserted flag; and a bit stream generator for generating and outputting a bit stream, which includes the encoded current frame and encoded filter flag, and further includes encoded adaptive interpolation filter coefficient of the current frame when the filter flag is the coefficient-inserted flag.
    • 公开了一种使用自适应内插滤波器的系数的图像编码/解码方法和装置,包括:用于计算当前帧的自适应内插滤波器系数的系数计算器; 图像编码器,用于使用当前帧的自适应内插滤波器系数内插参考帧,并使用内插的参考帧对当前帧进行编码; 滤波器标志编码器​​,用于根据当前帧的自适应内插滤波器系数产生和编码系数插入标志或系数未插入标志作为滤波器标志; 系数编码器,用于当滤波器标志是系数插入标志时对当前帧的自适应内插滤波器系数进行编码; 以及比特流发生器,用于产生和输出包括编码的当前帧和编码的滤波器标志的比特流,并且当滤波器标志是系数插入标志时,还包括当前帧的编码的自适应内插滤波器系数。