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1. 发明申请

US20120113556A1 APPARATUS FOR TESTING ELECTRONIC DEVICES 有权
标题翻译：用于测试电子设备的装置
公开(公告)号：US20120113556A1
公开(公告)日：2012-05-10
申请号：US13353269
申请日：2012-01-18
申请人： Donald P. Richmond, II , Kenneth W. Deboe , Frank O. Uher , Jovan Jovanovic , Scott E. Lindsey , Thomas T. Maenner , Patrick M. Shepherd , Jeffrey L. Tyson , Mark C. Carbone , Paul W. Burke , Doan D. Cao , James F. Tomic , Long V. Vu
发明人： Donald P. Richmond, II , Kenneth W. Deboe , Frank O. Uher , Jovan Jovanovic , Scott E. Lindsey , Thomas T. Maenner , Patrick M. Shepherd , Jeffrey L. Tyson , Mark C. Carbone , Paul W. Burke , Doan D. Cao , James F. Tomic , Long V. Vu
IPC分类号： H02H3/08 , G06F19/00 , G01R31/26
CPC分类号： G01R31/287 , G01R31/003 , G01R31/26 , G01R31/2642 , G01R31/2851 , G01R31/2855 , G01R31/2863 , G01R31/2868 , G01R31/2872 , G01R31/2877 , G01R31/2886 , G01R31/2889 , G01R31/2891 , G01R31/31924 , G06F8/30
摘要： An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.
摘要翻译：描述了一种用于老化和/或功能测试未调制晶片的微电子电路的装置。可以对晶片上的大量触点进行大量的电源，接地和信号连接。该装置具有允许电通路进入的盒。分配板具有多个接口，其被策略地定位以提供密集配置。这些接口通过柔性附件连接到第一连接器模块的阵列。第一连接器模块中的每一个可以独立地连接到多个第二连接器模块中的相应的一个，从而减少装置的框架上的应力。其他特征包括例如允许对端子施加到晶片的触点上的力的严格控制的活塞。

2. 发明授权

US08506335B2 Apparatus for testing electronic devices 有权
公开(公告)号：US08506335B2
公开(公告)日：2013-08-13
申请号：US13754765
申请日：2013-01-30
申请人： Donald P. Richmond, II , Kenneth W. Deboe , Frank O. Uher , Jovan Jovanovic , Scott E. Lindsey , Thomas T. Maenner , Patrick M. Shepherd , Jeffrey L. Tyson , Mark C. Carbone , Paul W. Burke , Doan D. Cao , James F. Tomic , Long V. Vu
发明人： Donald P. Richmond, II , Kenneth W. Deboe , Frank O. Uher , Jovan Jovanovic , Scott E. Lindsey , Thomas T. Maenner , Patrick M. Shepherd , Jeffrey L. Tyson , Mark C. Carbone , Paul W. Burke , Doan D. Cao , James F. Tomic , Long V. Vu
IPC分类号： H01R4/50
CPC分类号： G01R31/287 , G01R31/003 , G01R31/26 , G01R31/2642 , G01R31/2851 , G01R31/2855 , G01R31/2863 , G01R31/2868 , G01R31/2872 , G01R31/2877 , G01R31/2886 , G01R31/2889 , G01R31/2891 , G01R31/31924 , G06F8/30
摘要： An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

3. 发明申请

US20130141135A1 APPARATUS FOR TESTING ELECTRONIC DEVICES 有权
公开(公告)号：US20130141135A1
公开(公告)日：2013-06-06
申请号：US13754765
申请日：2013-01-30
申请人： Donald P. Richmond, II , Kenneth W. Deboe , Frank O. Uher , Jovan Jovanovic , Scott E. Lindsey , Thomas T. Maenner , Patrick M. Shepherd , Jeffrey L. Tyson , Mark C. Carbone , Paul W. Burke , Doan D. Cao , James F. Tomic , Long V. Vu
发明人： Donald P. Richmond, II , Kenneth W. Deboe , Frank O. Uher , Jovan Jovanovic , Scott E. Lindsey , Thomas T. Maenner , Patrick M. Shepherd , Jeffrey L. Tyson , Mark C. Carbone , Paul W. Burke , Doan D. Cao , James F. Tomic , Long V. Vu
IPC分类号： G01R31/26
CPC分类号： G01R31/287 , G01R31/003 , G01R31/26 , G01R31/2642 , G01R31/2851 , G01R31/2855 , G01R31/2863 , G01R31/2868 , G01R31/2872 , G01R31/2877 , G01R31/2886 , G01R31/2889 , G01R31/2891 , G01R31/31924 , G06F8/30
摘要： An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

4. 发明申请

US20100213957A1 APPARATUS FOR TESTING ELECTRONIC DEVICES 有权
标题翻译：用于测试电子设备的装置
公开(公告)号：US20100213957A1
公开(公告)日：2010-08-26
申请号：US12772932
申请日：2010-05-03
申请人： Donald P. Richmond, II , Kenneth W. Deboe , Frank O. Uher , Jovan Jovanovic , Scott E. Lindsey , Thomas T. Maenner , Patrick M. Shepherd , Jeffrey L. Tyson , Mark C. Carbone , Paul W. Burke , Doan D. Cao , James F. Tomic , Long V. Vu
发明人： Donald P. Richmond, II , Kenneth W. Deboe , Frank O. Uher , Jovan Jovanovic , Scott E. Lindsey , Thomas T. Maenner , Patrick M. Shepherd , Jeffrey L. Tyson , Mark C. Carbone , Paul W. Burke , Doan D. Cao , James F. Tomic , Long V. Vu
IPC分类号： G01R31/02
CPC分类号： G01R31/287 , G01R31/003 , G01R31/26 , G01R31/2642 , G01R31/2851 , G01R31/2855 , G01R31/2863 , G01R31/2868 , G01R31/2872 , G01R31/2877 , G01R31/2886 , G01R31/2889 , G01R31/2891 , G01R31/31924 , G06F8/30
摘要： An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.
摘要翻译：描述了一种用于老化和/或功能测试未调制晶片的微电子电路的装置。可以对晶片上的大量触点进行大量的电源，接地和信号连接。该装置具有允许电通路进入的盒。分配板具有多个接口，其被策略地定位以提供密集配置。这些接口通过柔性附件连接到第一连接器模块的阵列。第一连接器模块中的每一个可以独立地连接到多个第二连接器模块中的相应的一个，从而减少装置的框架上的应力。其他特征包括例如允许对端子施加到晶片的触点上的力的严格控制的活塞。

5. 发明授权

US08388357B2 Apparatus for testing electronic devices 有权
公开(公告)号：US08388357B2
公开(公告)日：2013-03-05
申请号：US13353269
申请日：2012-01-18
申请人： Donald P. Richmond, II , Kenneth W. Deboe , Frank O. Uher , Jovan Jovanovic , Scott E. Lindsey , Thomas T. Maenner , Patrick M. Shepherd , Jeffrey L. Tyson , Mark C. Carbone , Paul W. Burke , Doan D. Cao , James F. Tomic , Long V. Vu
发明人： Donald P. Richmond, II , Kenneth W. Deboe , Frank O. Uher , Jovan Jovanovic , Scott E. Lindsey , Thomas T. Maenner , Patrick M. Shepherd , Jeffrey L. Tyson , Mark C. Carbone , Paul W. Burke , Doan D. Cao , James F. Tomic , Long V. Vu
IPC分类号： H01R12/00
CPC分类号： G01R31/287 , G01R31/003 , G01R31/26 , G01R31/2642 , G01R31/2851 , G01R31/2855 , G01R31/2863 , G01R31/2868 , G01R31/2872 , G01R31/2877 , G01R31/2886 , G01R31/2889 , G01R31/2891 , G01R31/31924 , G06F8/30
摘要： An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

6. 发明授权

US08118618B2 Apparatus for testing electronic devices 有权
标题翻译：电子设备测试装置
公开(公告)号：US08118618B2
公开(公告)日：2012-02-21
申请号：US12772932
申请日：2010-05-03
申请人： Donald P. Richmond, II , Kenneth W. Deboe , Frank O. Uher , Jovan Jovanovic , Scott E. Lindsey , Thomas T. Maenner , Patrick M. Shepherd , Jeffrey L. Tyson , Mark C. Carbone , Paul W. Burke , Doan D. Cao , James F. Tomic , Long V. Vu
发明人： Donald P. Richmond, II , Kenneth W. Deboe , Frank O. Uher , Jovan Jovanovic , Scott E. Lindsey , Thomas T. Maenner , Patrick M. Shepherd , Jeffrey L. Tyson , Mark C. Carbone , Paul W. Burke , Doan D. Cao , James F. Tomic , Long V. Vu
IPC分类号： H01R24/00
CPC分类号： G01R31/287 , G01R31/003 , G01R31/26 , G01R31/2642 , G01R31/2851 , G01R31/2855 , G01R31/2863 , G01R31/2868 , G01R31/2872 , G01R31/2877 , G01R31/2886 , G01R31/2889 , G01R31/2891 , G01R31/31924 , G06F8/30
摘要： An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.
摘要翻译：描述了一种用于老化和/或功能测试未调制晶片的微电子电路的装置。可以对晶片上的大量触点进行大量的电源，接地和信号连接。该装置具有允许电通路进入的盒。分配板具有多个接口，其被策略地定位以提供密集配置。这些接口通过柔性附件连接到第一连接器模块的阵列。第一连接器模块中的每一个可以独立地连接到多个第二连接器模块中的相应的一个，从而减少装置的框架上的应力。其他特征包括例如允许对端子施加到晶片的触点上的力的严格控制的活塞。

7. 发明授权

US08628336B2 Apparatus for testing electronic devices 有权
标题翻译：电子设备测试装置
公开(公告)号：US08628336B2
公开(公告)日：2014-01-14
申请号：US13939364
申请日：2013-07-11
申请人： Donald P. Richmond, II , Kenneth W. Deboe , Frank O. Uher , Jovan Jovanovic , Scott E. Lindsey , Thomas T. Maenner , Patrick M. Shepherd , Jeffrey L. Tyson , Mark C. Carbone , Paul W. Burke , Doan D. Cao , James F. Tomic , Long V. Vu
发明人： Donald P. Richmond, II , Kenneth W. Deboe , Frank O. Uher , Jovan Jovanovic , Scott E. Lindsey , Thomas T. Maenner , Patrick M. Shepherd , Jeffrey L. Tyson , Mark C. Carbone , Paul W. Burke , Doan D. Cao , James F. Tomic , Long V. Vu
IPC分类号： H01R12/00
CPC分类号： G01R31/287 , G01R31/003 , G01R31/26 , G01R31/2642 , G01R31/2851 , G01R31/2855 , G01R31/2863 , G01R31/2868 , G01R31/2872 , G01R31/2877 , G01R31/2886 , G01R31/2889 , G01R31/2891 , G01R31/31924 , G06F8/30
摘要： An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.
摘要翻译：描述了一种用于老化和/或功能测试未调制晶片的微电子电路的装置。可以对晶片上的大量触点进行大量的电源，接地和信号连接。该装置具有允许电通路进入的盒。分配板具有多个接口，其被策略地定位以提供密集配置。这些接口通过柔性附件连接到第一连接器模块的阵列。第一连接器模块中的每一个可以独立地连接到多个第二连接器模块中的相应的一个，从而减少装置的框架上的应力。其他特征包括例如允许对端子施加到晶片的触点上的力的严格控制的活塞。

8. 发明授权

US07762822B2 Apparatus for testing electronic devices 有权
标题翻译：电子设备测试装置
公开(公告)号：US07762822B2
公开(公告)日：2010-07-27
申请号：US11413323
申请日：2006-04-27
申请人： Donald P. Richmond, II , Kenneth W. Deboe , Frank O. Uher , Jovan Jovanovic , Scott E. Lindsey , Thomas T. Maenner , Long V. Vu
发明人： Donald P. Richmond, II , Kenneth W. Deboe , Frank O. Uher , Jovan Jovanovic , Scott E. Lindsey , Thomas T. Maenner , Long V. Vu
IPC分类号： H01R13/44
CPC分类号： G01R31/287 , G01R31/003 , G01R31/26 , G01R31/2642 , G01R31/2851 , G01R31/2855 , G01R31/2863 , G01R31/2868 , G01R31/2872 , G01R31/2877 , G01R31/2886 , G01R31/2889 , G01R31/2891 , G01R31/31924 , G06F8/30
摘要： An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.
摘要翻译：描述了一种用于老化和/或功能测试未加掩模晶片的微电子电路的装置。可以对晶片上的大量接触件进行大量的电源，接地和信号连接。该装置具有允许电通路进入的盒。分配板具有多个接口，其被策略地定位以提供密集配置。这些接口通过柔性附件连接到第一连接器模块的阵列。第一连接器模块中的每一个可以独立地连接到多个第二连接器模块中的相应的一个，从而减少装置的框架上的应力。其他特征包括例如允许对端子施加到晶片的触点上的力的严格控制的活塞。

9. 发明申请

US20080079451A1 Apparatus for testing electronic devices 有权
标题翻译：电子设备测试装置
公开(公告)号：US20080079451A1
公开(公告)日：2008-04-03
申请号：US11522216
申请日：2006-09-14
申请人： Thomas T. Maenner
发明人： Thomas T. Maenner
IPC分类号： G01R31/02
CPC分类号： G01R31/31908 , G01R31/2877 , G01R31/2891 , G01R31/31905 , G01R31/31926
摘要： The invention provides an apparatus for testing an integrated circuits on devices including a plurality of electrical subassemblies including a plurality of pattern generator, driver, and power boards divided into physical zones with each physical zone including one pattern generator board, at least one driver board, and at least one power board connected to one another; and a configuration file having information representing flow of current through the electrical subassemblies connected to one another in an interconnection scheme, wherein the electrical subassemblies are organized into at least one logical zone, and wherein the logical zone comprises a plurality of pattern generators.
摘要翻译：本发明提供了一种用于测试装置上的集成电路的装置，包括多个电子组件，包括划分成物理区域的多个图案发生器，驱动器和电源板，每个物理区包括一个图案发生器板，至少一个驱动器板，和至少一个彼此连接的电源板; 以及配置文件，其具有表示在互连方案中彼此连接的通过所述电子组件的电流的信息的信息，其中所述电子组件被组织成至少一个逻辑区域，并且其中所述逻辑区域包括多个模式生成器。

10. 发明授权

US07826995B2 Apparatus for testing electronic devices 有权
标题翻译：电子设备测试装置
公开(公告)号：US07826995B2
公开(公告)日：2010-11-02
申请号：US11522216
申请日：2006-09-14
申请人： Thomas T. Maenner
发明人： Thomas T. Maenner
IPC分类号： G01R27/28 , G06F11/00
CPC分类号： G01R31/31908 , G01R31/2877 , G01R31/2891 , G01R31/31905 , G01R31/31926
摘要： The invention provides an apparatus for testing an integrated circuits on devices including a plurality of electrical subassemblies including a plurality of pattern generator, driver, and power boards divided into physical zones with each physical zone including one pattern generator board, at least one driver board, and at least one power board connected to one another; and a configuration file having information representing flow of current through the electrical subassemblies connected to one another in an interconnection scheme, wherein the electrical subassemblies are organized into at least one logical zone, and wherein the logical zone comprises a plurality of pattern generators.
摘要翻译：本发明提供了一种用于测试装置上的集成电路的装置，包括多个电子组件，包括划分成物理区域的多个图案发生器，驱动器和电源板，每个物理区包括一个图案发生器板，至少一个驱动器板，和至少一个彼此连接的电源板; 以及配置文件，其具有表示在互连方案中彼此连接的通过所述电子组件的电流的信息的信息，其中所述电子组件被组织成至少一个逻辑区域，并且其中所述逻辑区域包括多个模式生成器。

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