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1. 发明申请

US20130003923A1 X-ray analysis apparatus with radiation monitoring feature 有权
标题翻译：具有辐射监测功能的X射线分析仪
公开(公告)号：US20130003923A1
公开(公告)日：2013-01-03
申请号：US13135345
申请日：2011-07-01
申请人： Don Sackett
发明人： Don Sackett
IPC分类号： G01N23/223 , H05G1/38
CPC分类号： G01N23/223 , G01N2223/076
摘要： An XRF analysis apparatus includes a housing with a source of penetrating radiation to be directed at a sample and a detector for detecting fluoresced radiation from the sample. A shield is attachable to the housing to protect the user from radiation and a safety interlock is configured to detect whether or not the shield is attached to the housing. A controller is responsive to the safety interlock, and configured to monitor usage of the source of radiation at or above a predetermined power level when the shield is not attached to the housing and provide an output signal when the monitored usage of the source of penetrating radiation at or above the predetermined power level without the shield attached to the housing exceeds one or more predetermined thresholds.
摘要翻译： XRF分析装置包括具有针对样品的穿透辐射源的外壳和用于检测来自样品的荧光辐射的检测器。屏蔽件可附接到壳体以保护用户免受辐射，并且安全联锁被配置为检测屏蔽件是否附接到壳体。控制器响应于安全互锁，并且被配置为当屏蔽件未附接到壳体时监视等于或高于预定功率水平的辐射源的使用，并且当监视到的穿透辐射源的使用时提供输出信号处于或高于预定功率水平，而没有附接到壳体的屏蔽件超过一个或多个预定阈值。

2. 发明申请

US20080205592A1 XRF analyzer 有权
标题翻译： XRF分析仪
公开(公告)号：US20080205592A1
公开(公告)日：2008-08-28
申请号：US11711242
申请日：2007-02-27
申请人： Brendan Connors , Brad Hubbard-Nelson , Don Sackett
发明人： Brendan Connors , Brad Hubbard-Nelson , Don Sackett
IPC分类号： G01N23/223
CPC分类号： G01N23/223 , G01N2223/076
摘要： An XRF system, preferably handheld, includes an X-ray source for directing X-rays to a sample, a detector responsive to X-rays emitted by the sample, and a filter assembly with multiple filter materials located between the X-ray source and the detector. An analyzer is responsive to detector and is configured to analyze the intensities of X-rays irradiated by the sample at one power setting and to choose a filter material which suppresses certain intensities with respect to other intensities. A device, controlled by the analyzer, automatically moves the filter assembly to the chosen filter material and then the analyzer increases the power setting to analyze certain non-suppressed intensities.
摘要翻译： XRF系统，优选是手持式的，包括用于将X射线引导到样品的X射线源，响应于由样品发射的X射线的检测器，以及具有位于X射线源和X射线源之间的多个过滤材料的过滤器组件检测器。分析仪响应于检测器，并且被配置为在一个功率设置下分析由样品照射的X射线的强度，并且选择抑制相对于其他强度的某些强度的过滤材料。由分析仪控制的设备将过滤器组件自动移动到所选择的过滤材料上，然后分析仪增加功率设置以分析某些不受抑制的强度。

3. 发明申请

US20140022531A1 Dual source system and method 有权
标题翻译：双源系统和方法
公开(公告)号：US20140022531A1
公开(公告)日：2014-01-23
申请号：US13507654
申请日：2012-07-17
申请人： Don Sackett
发明人： Don Sackett
IPC分类号： G01J3/42 , G01J3/44
CPC分类号： G01J3/44 , G01J3/0208 , G01J3/0227 , G01J3/18 , G01J3/2803 , G01J3/443 , G01N21/359 , G01N21/65 , G01N21/718 , G01N2201/0221
摘要： A dual source system and method includes a high power laser used to determine elemental concentrations in a sample and a lower power device used to determine compounds present in the sample. A detector subsystem receives photons from the sample after laser energy from the high power laser strikes the sample and provides a first signal. The detector subsystem then receives photons from the sample after energy from the lower power device strikes the sample and provides a second signal. The high power laser is pulsed and the first signal is processed to determine elemental concentrations present in the sample. The lower power device is energized and the second signal is processed to determine compounds present in the signal. Based on the elemental concentrations and the compounds present, the compounds present in the sample are quantified.
摘要翻译：双源系统和方法包括用于确定样品中的元素浓度的高功率激光器和用于确定存在于样品中的化合物的较低功率器件。检测器子系统在来自大功率激光器的激光能量照射样品后提供第一信号，从样品接收光子。检测器子系统然后在来自下功率器件的能量撞击样品并提供第二信号之后从样品接收光子。高功率激光器被脉冲处理并且处理第一信号以确定样品中存在的元素浓度。较低功率的设备通电，第二个信号被处理以确定信号中存在的化合物。基于元素浓度和存在的化合物，定量样品中存在的化合物。

4. 发明申请

US20100017020A1 Sorting system 审中-公开
标题翻译：排序系统
公开(公告)号：US20100017020A1
公开(公告)日：2010-01-21
申请号：US12218512
申请日：2008-07-16
申请人： Bradley Hubbard-Nelson , Don Sackett , John Francis Egan
发明人： Bradley Hubbard-Nelson , Don Sackett , John Francis Egan
IPC分类号： B65G43/08 , G06F17/00
CPC分类号： B07C5/346 , B07C2501/0036 , B07C2501/0054
摘要： A sorting system and method with a conveyance for transporting items to be sorted at a predetermined speed. An XRF spectrometer subsystem includes at least one x-ray source directing x-ray energy at an item carried by the conveyance and a detector responsive to x-rays emitted by the item and producing a spectral signal characterizing a leading edge of the item and a trailing edge of the item. A diverter subsystem downstream of the XRF subsystem is for diverting sorted items. An electronic processing subsystem is responsive to the detector signal and is configured to determine if the item is to be diverted based on the elemental makeup of the item from its x-ray spectrum. The same processing subsystem is also configured to calculate the position of the item on the conveyance based on the detector signal and together with the predetermined speed of the conveyance controlling the diverter subsystem to divert selected items.
摘要翻译：一种分拣系统和方法，具有用于以预定速度运送待分拣的物品的输送器。 X射线荧光光谱仪子系统包括至少一个x射线源，其指导由运送物携带的物品上的x射线能量，以及响应于该物品发射的x射线的检测器，并产生表征该物品前缘的光谱信号，以及物品的后边缘。 XRF子系统下游的分流子系统用于转移排序的项目。电子处理子系统响应于检测器信号，并且被配置为基于物品从其X射线光谱的元素构成来确定物品是否被转移。相同的处理子系统还被配置为基于检测器信号计算物品在运送物上的位置，以及控制转向器子系统的传送的预定速度以转移所选择的物品。

5. 发明授权

US09285272B2 Dual source system and method 有权
标题翻译：双源系统和方法
公开(公告)号：US09285272B2
公开(公告)日：2016-03-15
申请号：US13507654
申请日：2012-07-17
申请人： Don Sackett
发明人： Don Sackett
IPC分类号： G01J3/42 , G01J3/44 , G01J3/02 , G01J3/18 , G01J3/28 , G01J3/443 , G01N21/71 , G01N21/359 , G01N21/65
CPC分类号： G01J3/44 , G01J3/0208 , G01J3/0227 , G01J3/18 , G01J3/2803 , G01J3/443 , G01N21/359 , G01N21/65 , G01N21/718 , G01N2201/0221
摘要： A dual source system and method includes a high power laser used to determine elemental concentrations in a sample and a lower power device used to determine compounds present in the sample. A detector subsystem receives photons from the sample after laser energy from the high power laser strikes the sample and provides a first signal. The detector subsystem then receives photons from the sample after energy from the lower power device strikes the sample and provides a second signal. The high power laser is pulsed and the first signal is processed to determine elemental concentrations present in the sample. The lower power device is energized and the second signal is processed to determine compounds present in the signal. Based on the elemental concentrations and the compounds present, the compounds present in the sample are quantified.
摘要翻译：双源系统和方法包括用于确定样品中的元素浓度的高功率激光器和用于确定样品中存在的化合物的较低功率器件。检测器子系统在来自大功率激光器的激光能量照射样品后提供第一信号，从样品接收光子。检测器子系统然后在来自下功率器件的能量撞击样品并提供第二信号之后从样品接收光子。高功率激光器被脉冲处理并且处理第一信号以确定样品中存在的元素浓度。较低功率的设备通电，第二个信号被处理以确定信号中存在的化合物。基于元素浓度和存在的化合物，定量样品中存在的化合物。

6. 发明授权

US08787523B2 X-ray analysis apparatus with radiation monitoring feature 有权
标题翻译：具有辐射监测功能的X射线分析仪
公开(公告)号：US08787523B2
公开(公告)日：2014-07-22
申请号：US13135345
申请日：2011-07-01
申请人： Don Sackett
发明人： Don Sackett
IPC分类号： G01N23/223
CPC分类号： G01N23/223 , G01N2223/076
摘要： An XRF analysis apparatus includes a housing with a source of penetrating radiation to be directed at a sample and a detector for detecting fluoresced radiation from the sample. A shield is attachable to the housing to protect the user from radiation and a safety interlock is configured to detect whether or not the shield is attached to the housing. A controller is responsive to the safety interlock, and configured to monitor usage of the source of radiation at or above a predetermined power level when the shield is not attached to the housing and provide an output signal when the monitored usage of the source of penetrating radiation at or above the predetermined power level without the shield attached to the housing exceeds one or more predetermined thresholds.
摘要翻译： XRF分析装置包括具有针对样品的穿透辐射源的外壳和用于检测来自样品的荧光辐射的检测器。屏蔽件可附接到壳体以保护用户免受辐射，并且安全联锁被配置为检测屏蔽件是否附接到壳体。控制器响应于安全互锁，并且被配置为当屏蔽件未附接到壳体时监视等于或高于预定功率水平的辐射源的使用，并且当监视到的穿透辐射源的使用时提供输出信号处于或高于预定功率水平，而没有附接到外壳的屏蔽件超过一个或多个预定阈值。

7. 发明授权

US07430274B2 XRF analyzer 有权
公开(公告)号：US07430274B2
公开(公告)日：2008-09-30
申请号：US11711242
申请日：2007-02-27
申请人： Brendan Connors , Brad Hubbard-Nelson , Don Sackett
发明人： Brendan Connors , Brad Hubbard-Nelson , Don Sackett
IPC分类号： G01N23/223 , G21K4/00 , G21K3/00 , H05G1/10
CPC分类号： G01N23/223 , G01N2223/076
摘要： An XRF system, preferably handheld, includes an X-ray source for directing X-rays to a sample, a detector responsive to X-rays emitted by the sample, and a filter assembly with multiple filter materials located between the X-ray source and the detector. An analyzer is responsive to detector and is configured to analyze the intensities of X-rays irradiated by the sample at one power setting and to choose a filter material which suppresses certain intensities with respect to other intensities. A device, controlled by the analyzer, automatically moves the filter assembly to the chosen filter material and then the analyzer increases the power setting to analyze certain non-suppressed intensities.

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