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    • 2. 发明授权
    • Method for fabricating semiconductor micro epi-optical components
    • 制造半导体微表面光学部件的方法
    • US6074888A
    • 2000-06-13
    • US135696
    • 1998-08-18
    • Dean TranEric R. AndersonRonald L. StrijekEdward A. RezekLuis M. Rochin
    • Dean TranEric R. AndersonRonald L. StrijekEdward A. RezekLuis M. Rochin
    • B81B1/00B81C1/00G02B3/00G02B5/00G02B6/12G02B6/122G02B6/42G03F7/40H01L31/18H01L33/00H01L21/00
    • H01L31/18G02B6/122G02B6/42H01L33/005G02B2006/12102G02B2006/12114G02B2006/12176G02B6/4246
    • A method for fabricating a monolithic micro-optical component. The construction of the micro-optical components is accomplished by using standard semiconductor fabrication techniques. The method comprises the steps of depositing an etch stop layer (44) onto a semiconductor substrate (42); depositing an optical component layer (46) onto the etch stop layer (44); coating the entire surface of the optical component layer with a photoresist material; applying a photoresist mask (50) to the photoresist material on the optical component layer (46); selectively etching away the optical component layer (46) to form at least one optical column (52); forming a pedestal (54) for each of the optical columns (52) by selectively etching away the etch stop layer (44); and finally polishing each of the optical columns (52), thereby forming monolithic optical components (56). The method may optionally include the step of removing the photoresist mask from each of the optical columns prior to polishing the optical columns, as well as the step of depositing an antireflectivity coating onto each of the optical components.
    • 一种用于制造单片微光学部件的方法。 微型光学部件的构造通过使用标准半导体制造技术来实现。 该方法包括以下步骤:在半导体衬底(42)上沉积蚀刻停止层(44); 在所述蚀刻停止层(44)上沉积光学部件层(46); 用光致抗蚀剂材料涂覆光学部件层的整个表面; 将光致抗蚀剂掩模(50)施加到光学部件层(46)上的光致抗蚀剂材料上; 选择性地蚀刻掉光学部件层(46)以形成至少一个光学柱(52); 通过选择性地蚀刻掉蚀刻停止层(44),为每个光学柱(52)形成基座(54); 并最后对每个光学柱(52)进行抛光,由此形成单片光学部件(56)。 该方法可以可选地包括在抛光光学柱之前从每个光学柱去除光致抗蚀剂掩模的步骤,以及在每个光学部件上沉积抗反射涂层的步骤。
    • 5. 发明授权
    • Semiconductor micro epi-optical components
    • 半导体微表面光学元件
    • US06252725B1
    • 2001-06-26
    • US09498634
    • 2000-02-07
    • Dean TranEric R. AndersonRonald L. StrijekEdward A. RezekLuis M. Rochin
    • Dean TranEric R. AndersonRonald L. StrijekEdward A. RezekLuis M. Rochin
    • G02B702
    • H01L31/18G02B6/122G02B6/42G02B6/4246G02B2006/12102G02B2006/12114G02B2006/12176H01L33/005
    • A method for fabricating a monolithic micro-optical component. The construction of the micro-optical components is accomplished by using standard semiconductor fabrication techniques. The method comprises the steps of depositing an etch stop layer (44) onto a semiconductor substrate (42); depositing an optical component layer (46) onto the etch stop layer (44); coating the entire surface of the optical component layer with a photoresist material; applying a photoresist mask (50) to the photoresist material on the optical component layer (46); selectively etching away the optical component layer (46) to form at least one optical column (52); forming a pedestal (54) for each of the optical columns (52) by selectively etching away the etch stop layer (44); and finally polishing each of the optical columns (52), thereby forming monolithic optical components (56). The method may optionally include the step of removing the photoresist mask from each of the optical columns prior to polishing the optical columns, as well as the step of depositing an antireflectivity coating onto each of the optical components.
    • 一种用于制造单片微光学部件的方法。 微型光学部件的构造通过使用标准半导体制造技术来实现。 该方法包括以下步骤:在半导体衬底(42)上沉积蚀刻停止层(44); 在所述蚀刻停止层(44)上沉积光学部件层(46); 用光致抗蚀剂材料涂覆光学部件层的整个表面; 将光致抗蚀剂掩模(50)施加到光学部件层(46)上的光致抗蚀剂材料上; 选择性地蚀刻掉光学部件层(46)以形成至少一个光学柱(52); 通过选择性地蚀刻掉蚀刻停止层(44),为每个光学柱(52)形成基座(54); 并最后对每个光学柱(52)进行抛光,由此形成单片光学部件(56)。 该方法可以可选地包括在抛光光学柱之前从每个光学柱去除光致抗蚀剂掩模的步骤,以及在每个光学部件上沉积抗反射涂层的步骤。
    • 7. 发明授权
    • Apparatus and method for snap-on thermo-compression bonding
    • 用于卡扣热压接的装置和方法
    • US06172414B2
    • 2001-01-09
    • US09067222
    • 1998-04-28
    • Dean TranEric R. AndersonRonald L. StrijekEdward A. Rezek
    • Dean TranEric R. AndersonRonald L. StrijekEdward A. Rezek
    • H01L2304
    • H01L24/75H01L2224/75H01L2224/81141H01L2224/81193H01L2924/01033H01L2924/01079H01L2924/01082H01L2924/14Y10T29/49144Y10T29/49544
    • An interconnected apparatus for producing a low loss, reproducible electrical interconnection between a semiconductor device and a substrate includes a rod and rod receptor. The rod, generally cylindrically shaped, is attached to the semiconductor device and includes an outer circumferential wall which comes into contact with the rod receptor during a bonding process. A lip portion is formed on one end of the rod receptor for interlocking engagement with the rod. The rod receptor is plated on the substrate and includes a generally circularly shaped body which forms a centrally disposed well for receiving the rod. A lip portion is formed on one end or mouth of the rod receptor for interlocking engagement with the rod. When the rod and corresponding receptor are aligned and brought together, the rod deforms and interlocks with its corresponding rod receptor. A thermo-compression bonding process is utilized to bond the rod to the rod receptor, thereby producing a strong interlocking bond.
    • 用于在半导体器件和衬底之间产生低损耗,可再现的电互连的互连设备包括棒和棒接收器。 通常为圆柱形的杆附接到半导体器件,并且包括在接合过程中与杆接收器接触的外周壁。 唇形部分形成在杆接收器的一端上以与杆互锁接合。 杆接收器被电镀在基底上,并且包括大致圆形的主体,其形成用于容纳杆的居中设置的孔。 唇形部分形成在杆接收器的一端或口上,用于与棒互锁接合。 当杆和相应的接收器对准并聚集在一起时,杆变形并与其相应的杆接收器互锁。 利用热压接合方法将棒粘合到杆接收器,从而产生强的互锁键。
    • 8. 发明授权
    • Apparatus for testing semiconductor laser devices
    • 半导体激光器件测试装置
    • US5498973A
    • 1996-03-12
    • US362682
    • 1994-12-22
    • William A. CavaliereJohn S. FerrarioHoward E. FerrisRaymond C. SchulerRonald L. Strijek
    • William A. CavaliereJohn S. FerrarioHoward E. FerrisRaymond C. SchulerRonald L. Strijek
    • G01R31/26H01S5/00H01S5/40G01B9/02G01R31/02
    • G01R31/2635H01S5/4025H01S5/0014
    • An apparatus for testing individual ones of semiconductor laser devices of a laser bar during a manufacturing thereof comprises a laser bar chuck for securing the laser bar in a first manner and orientation. A probe is used for probing a laser device of the laser bar. A translational manipulator receives the laser bar chuck and the probe in a second and third manner and orientation, respectively, the manipulator further for translationally positioning the laser bar chuck and the probe independently in a fourth and fifth controlled manner. An energizing means energizes the probe in a sixth controlled manner. A detector detects a lasing of a probed laser device and provides a characteristic output signal representative of a testing characteristic of the probed laser device. Lastly, a controller controls the manipulator and the energizing means in a prescribed manner: (i) in preparation for a testing of a desired one of the laser devices of the laser bar; (ii) during a testing of a desired one of the laser devices of the laser bar; and (iii) upon a completion of the testing of the desired one of the laser devices.
    • 一种用于在其制造期间测试激光棒的各个半导体激光器件的装置包括用于以第一方式和取向固定激光棒的激光棒卡盘。 探头用于探测激光棒的激光装置。 平移操纵器分别以第二和第三方式和方向接收激光棒卡盘和探针,操纵器还用于以第四和第五受控方式独立地平移地定位激光棒卡盘和探针。 激励装置以第六受控方式激励探头。 检测器检测探测的激光装置的激光,并提供表示探测的激光装置的测试特性的特征输出信号。 最后,控制器以规定的方式控制操纵器和激励装置:(i)准备对激光条的所需激光装置进行测试; (ii)在激光棒的所需激光器件的测试期间; 和(iii)完成所需的一个激光装置的测试。