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    • 1. 发明授权
    • Docking handle
    • 对接手柄
    • US5381585A
    • 1995-01-17
    • US96589
    • 1993-07-23
    • David P. OlsonEd K. TafoyaCraig C. Staab
    • David P. OlsonEd K. TafoyaCraig C. Staab
    • G01R31/28E05B1/00E05B7/00
    • G01R31/2887Y10T16/50
    • A docking handle assembly is integrally formed from a single piece of metal for providing orthoganal movement of first and second levers. The docking handle has a set of three pivot points arranged in the form of a right triangle; and the main body portion has first and second handles extending outwardly therefrom in a mutually perpendicular arrangement, with each of the handles parallel to a different leg of the right triangle forming the pivot points. In operation, the pivot point located at the right angle of the triangle is pivotally attached to a support surface. The ends of first and second levers to be moved by the docking handle are pivotally attached to the other pivot points, respectively, for push-pull movement, as the main body portion is rotated by the handles about the pivot point attached to the underlying support surface.
    • 对接手柄组件由单块金属一体地形成,用于提供第一和第二杠杆的原始运动。 对接手柄具有一组以直角三角形形式布置的三个枢轴点; 并且主体部分具有以相互垂直的布置从其向外延伸的第一和第二手柄,其中每个手柄平行于形成枢转点的直角三角形的不同的腿。 在操作中,位于三角形的直角处的枢转点枢转地附接到支撑表面。 由于主体部分由手柄围绕附接到下面的支撑件的枢轴点旋转,所以分别由对接手柄移动的第一和第二杠杆的端部分别枢转地附接到另一个枢轴点用于推挽动作 表面。
    • 2. 发明授权
    • Universal contactor system for testing ball grid array (BGA) devices on
multiple handlers and method therefor
    • 用于在多个处理器上测试球栅阵列(BGA)器件的通用接触器系统及其方法
    • US5688127A
    • 1997-11-18
    • US505863
    • 1995-07-24
    • Craig C. StaabDavid P. Olson
    • Craig C. StaabDavid P. Olson
    • G01R1/04H01R12/00H01R9/09
    • G01R1/04
    • The present invention relates to a universal contactor system for testing multiple size BGA devices on multiple types of testing equipment. The universal contactor system is comprised of a plurality of pogo pin which provide a connection between the BGA device to be tested and a DUT (Device Under Test) board. A contactor block having a plurality of apertures therethrough is used for holding the plurality of pogo pins. A guide plate having a center opening is coupled to the contactor block. The center opening in the guide plate is used for aligning the BGA device to be tested on the contactor block. The guide plate may be replaced with guide plates having a larger or smaller opening to align BGA devices of a larger or smaller size on the contactor block.
    • 本发明涉及一种用于在多种类型的测试设备上测试多尺寸BGA设备的通用接触器系统。 通用接触器系统由多个弹簧销构成,其提供待测试的BGA设备与被测设备(被测器件)板之间的连接。 用于保持多个弹簧销的具有穿过其中的多个孔的接触器块。 具有中心开口的引导板联接到接触器块。 引导板中的中心开口用于对准接触器块上待测试的BGA器件。 引导板可以用具有较大或较小开口的引导板代替以对准接触器块上较大或较小尺寸的BGA器件。