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    • 4. 发明申请
    • Wafer probecard interface
    • 晶圆问答界面
    • US20050285614A1
    • 2005-12-29
    • US10877299
    • 2004-06-25
    • David Ma
    • David Ma
    • G01R31/26G01R31/28G11C29/56
    • G01R31/2889G11C29/56G11C2029/5602
    • Apparatus and method for testing a device wafer having a plurality of devices formed thereon. One embodiment of the invention provides an interface wafer comprising a plurality of contact pads disposed on a first surface for contacting a plurality of device pads on the device wafer and a plurality of interface pads disposed on a second surface for contacting probe needles on a probe card, wherein the plurality of interface pads are electrically connected to the plurality of contact pads and wherein the plurality of interface pads are disposed in a relaxed-pitch arrangement as compared to the plurality of contact pads.
    • 用于测试其上形成有多个器件的器件晶片的装置和方法。 本发明的一个实施例提供一种接口晶片,其包括设置在第一表面上的多个接触焊盘,用于接触器件晶片上的多个器件焊盘,以及设置在第二表面上的多个接口焊盘,用于接触探针卡上的探针 ,其中所述多个接口焊盘电连接到所述多个接触焊盘,并且其中所述多个接口焊盘与所述多个接触焊盘相比以放松间距布置设置。
    • 5. 发明授权
    • System and method of data access for mobile stations
    • 移动台数据接入系统和方法
    • US07978648B2
    • 2011-07-12
    • US12818307
    • 2010-06-18
    • Hossain AsifDavid Ma
    • Hossain AsifDavid Ma
    • H04Q7/00
    • H04W48/18
    • Method and apparatus for data access for a mobile terminal comprising a module for determining whether first and second modes of wireless network coverage is available, a module for selecting the first mode if available, a module for attempting access via the second mode on failure to establish access via the first mode and a module for monitoring availability of the first mode. Even when a connection is established via the second mode, availability of the first mode is monitored and access attempted, when second mode connection is idle.
    • 包括用于确定无线网络覆盖的第一和第二模式是否可用的模块的用于移动终端的数据访问的方法和装置,用于选择所述第一模式(如果可用)的模块,用于在未能建立所述第一模式时尝试经由所述第二模式的访问的模块 通过第一模式的访问和用于监视第一模式的可用性的模块。 即使当通过第二模式建立连接时,当第二模式连接空闲时,监视第一模式的可用性并尝试访问。
    • 6. 发明授权
    • System and method of data access for mobile stations
    • 移动台数据接入系统和方法
    • US07756075B2
    • 2010-07-13
    • US11226270
    • 2005-09-15
    • Asif HossainDavid Ma
    • Asif HossainDavid Ma
    • H04Q7/00
    • H04W48/18
    • Method and apparatus for data access for a mobile terminal comprising a module for determining whether first and second modes of wireless network coverage is available, a module for selecting the first mode if available, a module for attempting access via the second mode on failure to establish access via the first mode and a module for monitoring availability of the first mode. Even when a connection is established via the second mode, availability of the first mode is monitored and access attempted, when second mode connection is idle.
    • 包括用于确定无线网络覆盖的第一和第二模式是否可用的模块的用于移动终端的数据访问的方法和装置,用于选择所述第一模式(如果可用)的模块,用于在未能建立所述第一模式时尝试经由所述第二模式的访问的模块 通过第一模式的访问和用于监视第一模式的可用性的模块。 即使当通过第二模式建立连接时,当第二模式连接空闲时,监视第一模式的可用性并尝试访问。
    • 10. 发明申请
    • Test circuitry wafer
    • 测试电路晶圆
    • US20050285610A1
    • 2005-12-29
    • US10877649
    • 2004-06-25
    • David Ma
    • David Ma
    • G01R31/02G01R31/28
    • G01R31/2889
    • Method and apparatus for testing a plurality of devices on a device wafer. One embodiment provides a test circuitry wafer having a first surface and a second surface, the test circuitry wafer comprising a plurality of contact pads disposed on the first surface for contacting a plurality of device pads on the device wafer, a plurality of interface pads disposed on the second surface for contacting probe needles on a probe card and one or more test features disposed in the test circuitry wafer, wherein the one or more test features are electrically connected to at least one of the contact pads and the interface pads.
    • 用于测试器件晶片上的多个器件的方法和装置。 一个实施例提供具有第一表面和第二表面的测试电路晶片,测试电路晶片包括设置在第一表面上的多个接触焊盘,用于接触器件晶片上的多个器件焊盘,多个接口焊盘设置在 用于接触探针卡上的探针的第二表面和设置在测试电路晶片中的一个或多个测试特征,其中所述一个或多个测试特征电连接到至少一个接触垫和界面垫。