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1. 发明授权

US5748124A Analog channel for mixed-signal-VLSI tester 失效
公开(公告)号：US5748124A
公开(公告)日：1998-05-05
申请号：US762395
申请日：1996-12-09
申请人： Daniel Rosenthal , Kannan Konath , Robert Whyte , Eric Norton , Stuart Robert Pearce
发明人： Daniel Rosenthal , Kannan Konath , Robert Whyte , Eric Norton , Stuart Robert Pearce
IPC分类号： G01R31/316 , G01R31/3167 , G01R31/317 , G06F3/05 , G06F11/22 , H03M1/10
CPC分类号： G01R31/3167 , G01R31/31716
摘要： Mixed-signal tester architecture and methods are provided which minimize transfer of data, offer parallel data post-processing within the analog channels, and allow flexible synchronization. Multiple analog channels each have a source digital signal processor (DSP), a digital source sequencer, digital source instrumentation, analog source instrumentation, analog measure instrumentation, digital measure instrumentation, a digital pin multiplexer, a digital measure sequencer, DSP-addressable multi-bank capture memory, a capture digital signal processor, and an inter-DSP feedback path for communication between the source DSP and the capture DSP. Each analog channel can be arranged in a feedback loop through either its analog and/or digital instrumentation using the inter-DSP feedback path. DUT response is processed in the channel, the result is used to define parameters for a subsequent test cycle, and a signal corresponding to these parameters is generated and applied to the DUT. This loop-back of the result of a test cycle within the analog channel to define the next test cycle speeds up the test process. The source DSP can synthesize signals in real time and apply these to the DUT through analog or digital source instrumentation, and can synthesize source sequencer memory addresses (pointers to waveform-data stored in memory which represent waveforms or waveform segments) in real time and apply these signals to the DUT through analog or digital source instrumentation. DUT response is written to capture-memory in the channel which is directly addressable by the capture DSP, avoiding transfer of data before processing and further speeding the test process. Multi-bank capture memory controlled by the capture DSP allows data representing DUT response to be written into one bank while previously-written data in another bank is processed. This interleaving of data capture and data processing allows simultaneous capture and processing, further speeding the test process.

2. 发明授权

US5646521A Analog channel for mixed-signal-VLSI tester 失效
公开(公告)号：US5646521A
公开(公告)日：1997-07-08
申请号：US510397
申请日：1995-08-01
申请人： Daniel Rosenthal , Kannan Konath , Robert Whyte , Eric Norton , Stuart Robert Pearce
发明人： Daniel Rosenthal , Kannan Konath , Robert Whyte , Eric Norton , Stuart Robert Pearce
IPC分类号： G01R31/316 , G01R31/3167 , G01R31/317 , G06F3/05 , G06F11/22 , G01R31/28
CPC分类号： G01R31/3167 , G01R31/31716
摘要： Mixed-signal tester architecture and methods are provided which minimize transfer of data, offer parallel data post-processing within the analog channels, and allow flexible synchronization. Multiple analog channels each have a source digital signal processor (DSP), a digital source sequencer, digital source instrumentation, analog source instrumentation, analog measure instrumentation, digital measure instrumentation, a digital pin multiplexer, a digital measure sequencer, DSP-addressable multi-bank capture memory, a capture digital signal processor, and an inter-DSP feedback path for communication between the source DSP and the capture DSP. Each analog channel can be arranged in a feedback loop through either its analog and/or digital instrumentation using the inter-DSP feedback path. DUT response is processed in the channel, the result is used to define parameters for a subsequent test cycle, and a signal corresponding to these parameters is generated and applied to the DUT. This loop-back of the result of a test cycle within the analog channel to define the next test cycle speeds up the test process. The source DSP can synthesize signals in real time and apply these to the DUT through analog or digital source instrumentation, and can synthesize source sequencer memory addresses (pointers to waveform-data stored in memory which represent waveforms or waveform segments) in real time and apply these signals to the DUT through analog or digital source instrumentation. DUT response is written to capture-memory in the channel which is directly addressable by the capture DSP, avoiding transfer of data before processing and further speeding the test process. Multi-bank capture memory controlled by the capture DSP allows data representing DUT response to be written into one bank while previously-written data in another bank is processed. This interleaving of data capture and data processing allows simultaneous capture and processing, further speeding the test process.

3. 发明申请

US20060250215A1 Remote controlled security lock 审中-公开
标题翻译：遥控安全锁
公开(公告)号：US20060250215A1
公开(公告)日：2006-11-09
申请号：US11415783
申请日：2006-05-02
申请人： Eric Norton
发明人： Eric Norton
IPC分类号： G05B19/00
CPC分类号： B60R25/24 , G07C9/00182 , G07C2009/00222 , G07C2009/00984
摘要： A home or building security system that enables a user to activate and deactivate various items, such as the locking and unlocking of a door utilizing a wireless transmitter. The key fob includes various buttons such that when depressed, signals are transmitted from the key fob. A receiver/controller is positioned in the home or building proximate the locking mechanism of a door, such that upon the reception of a signal from the wireless transmitter a predetermined function is carried out by the receiver/controller, such as the locking and unlocking of the door.
摘要翻译：家庭或建筑物安全系统，其使用户能够激活和停用各种物品，例如利用无线发射器锁定和解锁门。密钥卡包括各种按钮，使得当按下时，信号从密钥卡发送。接收器/控制器位于靠近门的锁定机构的家庭或建筑物中，使得在接收到来自无线发射机的信号时，接收机/控制器执行预定功能，例如锁定和解锁门。

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