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    • 2. 发明授权
    • Method and apparatus for calibrating a noncontact gauging sensor with
respect to an external coordinate system
    • 相对于外部坐标系校准非接触式测量传感器的方法和装置
    • US5748505A
    • 1998-05-05
    • US597281
    • 1996-02-06
    • Dale R. Greer
    • Dale R. Greer
    • G01B11/00G01B11/03G01B11/25G01B21/04G01S7/497G01S17/66G01C3/02
    • G01B11/002G01B11/2504G01B21/042G01S17/66G01S7/497
    • The sensor array is positioned at a vantage point to detect and calibrate its reference frame to the external reference frame demarcated by light-emitting reference indicia. The sensor array encompasses a wide view calibration field and provides data indicating the spatial position of light sources placed within the calibration field. A tetrahedron framework with light-emitting diodes at the vertices serves as a portable reference target that is placed in front of the feature sensor to be calibrated. The sensor array reads and calibrates the position of the light-emitting diodes at the vertices while the structured light of the feature sensor is projected onto the framework of the reference target. The structured light intersects with and reflects from the reference target, providing the feature sensor with positional and orientation data. These data are correlated to map the coordinate system of the feature sensor to the coordinate system of the external reference frame. A computer-generated virtual image display compares desired and actual sensor positions through a real time feedback system allowing the user to properly position the feature sensor without trial and error.
    • 传感器阵列位于有利位置,以检测和校准其参考帧到由发光参考标记划分的外部参考系。 传感器阵列包括宽视场校准场,并提供指示放置在校准场内的光源的空间位置的数据。 在顶点具有发光二极管的四面体框架用作便携式参考目标,其放置在要校准的特征传感器的前面。 传感器阵列读取和校准发光二极管在顶点处的位置,同时将特征传感器的结构光投影到参考目标的框架上。 结构光与参考目标相交并从参考目标反射,为特征传感器提供位置和方位数据。 这些数据相关,将特征传感器的坐标系映射到外部参考系的坐标系。 计算机生成的虚拟图像显示器通过实时反馈系统比较期望的和实际的传感器位置,允许用户正确地定位特征传感器而不经过试验和错误。
    • 4. 发明授权
    • Method and apparatus for temperature compensation of measurements from a non-contact sensor
    • 用于从非接触传感器测量的温度补偿的方法和装置
    • US06180939B2
    • 2001-01-30
    • US09205742
    • 1998-12-04
    • Myles Markey, Jr.Dale R. GreerStephen James TenniswoodJesper Christensen
    • Myles Markey, Jr.Dale R. GreerStephen James TenniswoodJesper Christensen
    • H01J724
    • G01B5/0014
    • A temperature compensation system (300) is provided for compensating measurements from a sensor (240). A temperature transducer (310) is placed in close proximity to a manufacturing workstation as a means of measuring the ambient temperature associated with the workstation (200). A reference workpiece (100) is placed within a sensing zone of the sensor (240). The system (300) includes a temperature compensating module (320) that is connected to the sensor (240) and to the temperature transducer (310) for determining a baseline measurement of the reference workpiece at a reference temperature. The temperature compensating module (320) is further adapted for collecting a plurality of measurements of the reference workpiece over a plurality of temperatures for establishing a relationship between these measurements and their corresponding temperature values. In addition, a workpiece measuring module (330) is also connected to the sensor (240) and to the temperature transducer (310) for measuring a first workpiece at a first temperature, whereby the sensor measurement is compensated for temperature using this relationship. In this way, the temperature compensation system (300) compensates the sensor measurement for physical changes in any of the components of the workstation that are caused by fluctuations in ambient temperature. Rather than compensate for ambient temperature changes, the temperature compensation system (300) may also be adapted to compensate sensor measurements based on process driven temperature changes (i.e., a “hot” workpiece).
    • 提供了用于补偿来自传感器(240)的测量值的温度补偿系统(300)。 作为测量与工作站(200)相关联的环境温度的手段,将温度传感器(310)放置在靠近制造工作站的位置。 参考工件(100)被放置在传感器(240)的感测区域内。 系统(300)包括连接到传感器(240)和温度传感器(310)的温度补偿模块(320),用于确定参考温度下的参考工件的基线测量。 温度补偿模块(320)还适于在多个温度上收集参考工件的多个测量值,以建立这些测量值与它们对应的温度值之间的关系。 此外,工件测量模块(330)还连接到传感器(240)和温度传感器(310),用于在第一温度下测量第一工件,由此使用该关系来补偿传感器测量温度。 以这种方式,温度补偿系统(300)补偿由环境温度波动引起的工作站的任何部件的物理变化的传感器测量。 温度补偿系统(300)也可以适应于基于过程驱动的温度变化(即,“热”工件))补偿传感器测量值而不是补偿环境温度变化。
    • 5. 发明授权
    • Method and apparatus for calibrating a non-contact gauging sensor with respect to an external coordinate system
    • 相对于外部坐标系校准非接触式测量传感器的方法和装置
    • US06285959B1
    • 2001-09-04
    • US09378451
    • 1999-08-20
    • Dale R. Greer
    • Dale R. Greer
    • G01B1103
    • G01B11/2504G01B11/002G01B21/042G01S7/497G01S17/66
    • The photogrammetric measurement system is positioned at a vantage point to detect and calibrate its reference frame to the external reference frame demarcated by light-reflecting retroreflective target dot on a spherical target. A tetrahedron framework with the spherical target mounted on one of the vertices serves as a reference target that is placed in front of the non-contact sensor to be calibrated. The photogrammetric measurement system reads and calibrates the position of the retroreflective target dot (and thus the tetrahedron) while the structured light of the sensor is projected onto the framework of the reference target. The structured light intersects with and reflects from the reference target, providing the non-contact sensor with positional and orientation data. This data is correlated to map the coordinate system of the non-contact sensor to the coordinate system of the external reference frame.
    • 摄影测量测量系统位于有利位置,以检测和校准其参考框架到通过球形靶上的光反射回射目标点划定的外部参考框架。 安装在一个顶点上的具有球面目标的四面体框架用作被放置在待校准的非接触式传感器前面的参考目标。 摄影测量测量系统读取和校准回射目标点(以及四面体)的位置,同时将传感器的结构光投影到参考目标的框架上。 结构光与参考目标相交并从其反射,为非接触传感器提供位置和方位数据。 将该数据相关联以将非接触式传感器的坐标系映射到外部参考系的坐标系。
    • 6. 发明授权
    • Method and apparatus for calibrating a noncontact gauging sensor with
respect to an external coordinate system
    • 相对于外部坐标系校准非接触式测量传感器的方法和装置
    • US6128585A
    • 2000-10-03
    • US30439
    • 1998-02-25
    • Dale R. Greer
    • Dale R. Greer
    • G01B11/00G01B11/03G01B11/25G01B21/04G01S7/497G01S17/66
    • G01B11/002G01B11/2504G01B21/042G01S17/66G01S7/497
    • The sensor array is positioned at a vantage point to detect and calibrate its reference frame to the external reference frame demarcated by light-emitting reference indicia. The sensor array encompasses a wide view calibration field and provides data indicating the spatial position of light sources placed within the calibration field. A tetrahedron framework with light-emitting diodes at the vertices serves as a portable reference target that is placed in front of the feature sensor to be calibrated. The sensor array reads and calibrates the position of the light-emitting diodes at the vertices while the structured light of the feature sensor is projected onto the framework of the reference target. The structured light intersects with and reflects from the reference target, providing the feature sensor with positional and orientation data. These data are correlated to map the coordinate system of the feature sensor to the coordinate system of the external reference frame. A computer-generated virtual image display compares desired and actual sensor positions through a real time feedback system allowing the user to properly position the feature sensor.
    • 传感器阵列位于有利位置,以检测和校准其参考帧到由发光参考标记划分的外部参考系。 传感器阵列包括宽视场校准场,并提供指示放置在校准场内的光源的空间位置的数据。 在顶点具有发光二极管的四面体框架用作便携式参考目标,其放置在要校准的特征传感器的前面。 传感器阵列读取和校准发光二极管在顶点处的位置,同时将特征传感器的结构光投影到参考目标的框架上。 结构光与参考目标相交并从参考目标反射,为特征传感器提供位置和方位数据。 这些数据相关,将特征传感器的坐标系映射到外部参考系的坐标系。 计算机生成的虚拟图像显示器通过实时反馈系统比较期望的和实际的传感器位置,允许用户适当地定位特征传感器。
    • 7. 发明授权
    • Method and apparatus for calibrating a non-contact gauging sensor with respect to an external coordinate system
    • 相对于外部坐标系校准非接触式测量传感器的方法和装置
    • US06460004B2
    • 2002-10-01
    • US09761128
    • 2001-01-16
    • Dale R. GreerGregory A. Dale
    • Dale R. GreerGregory A. Dale
    • G01B1103
    • G01B11/002G01B11/00G01B11/2504G01B21/042G01S7/497G01S17/66
    • A calibration system is provided for calibrating a sensor with respect to an external reference frame associated with manufacturing gauging station. A target calibration device is positioned at a vantage point to detect and calibrate its reference frame in relation to the external reference frame. A reference target having at least three non-coplanar reflective surfaces is illuminated by the structured light emanating from the sensor. In this way, the calibration system is able to determine the spatial location and orientation of the reference target in relation to the sensor. The calibration system further includes a coordinate transformation system for coordinating the measurement data from the target calibration device and from the feature sensor, whereby the feature sensor is calibrated with respect to the external reference frame.
    • 提供校准系统用于相对于与制造测量站相关联的外部参考系校准传感器。 目标校准装置位于有利位置,以相对于外部参考系检测和校准其参考系。 具有至少三个非共面反射表面的参考目标被从传感器发出的结构化光照射。 以这种方式,校准系统能够确定参考目标相对于传感器的空间位置和取向。 校准系统还包括用于协调来自目标校准装置和特征传感器的测量数据的坐标变换系统,由此特征传感器相对于外部参考系被校准。