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1. 发明授权

US07016150B2 Method and apparatus for cleaning head with over-damped harmonic oscillation 有权
标题翻译：清洗具有过阻尼谐波振荡的头的方法和装置
公开(公告)号：US07016150B2
公开(公告)日：2006-03-21
申请号：US10692641
申请日：2003-10-24
申请人： Christopher D. Hahm , Marty L. Stout , Stephanie L. Seaman
发明人： Christopher D. Hahm , Marty L. Stout , Stephanie L. Seaman
IPC分类号： G11B5/41
CPC分类号： G11B5/6005 , G11B5/41 , G11B5/54
摘要： An apparatus has an information storage medium with an information storage surface, and structure operable to effect relative movement of the head and surface within a first zone while maintaining the head adjacent the surface and while using the head to effect at least one of reading information from and writing information to the surface. A head cleaning section includes a cleaning part engageable with the head when the head is in a second zone where the head is spaced from the surface, the structure being operable to effect relative movement of the engaged head and cleaning part in a manner which includes a component of movement that is representative of an applied force subject to a damping influence.
摘要翻译：一种装置具有信息存储介质，其具有信息存储表面，并且结构可操作以在第一区域内实现头部和表面的相对移动，同时保持头部邻近表面，并且在使用头部来实现读取信息中的至少一个时并将信息写入表面。头部清洁部分包括当头部处于头部与表面间隔开的第二区域时可与头部接合的清洁部件，该结构可操作以以包括一个或多个的方式实现被接合头部和清洁部件的相对运动代表受到阻尼影响的施加力的运动分量。

2. 发明授权

US06717419B1 Liquid dielectric capacitor for film thickness mapping 失效
标题翻译：液体介质电容器用于膜厚度映射
公开(公告)号：US06717419B1
公开(公告)日：2004-04-06
申请号：US10165687
申请日：2002-06-07
申请人： Bharat Bhushan , Christopher D. Hahm
发明人： Bharat Bhushan , Christopher D. Hahm
IPC分类号： G01R2726
CPC分类号： H02J1/10 , G01Q10/06 , G11B2005/001
摘要： The present invention includes capacitive film thickness measurement devices and measurement systems. The invention also includes machines or instruments using those aspects of the invention. The present invention additionally includes methods and procedures using those devices of the present invention. The present invention discloses a capacitance measurement device and technique useful in determining lubricant film thickness on substrates such as magnetic thin-film rigid disks. Using the present invention, variations in lubricant thickness on the Angstrom scale or less may be measured quickly and nondestructively.
摘要翻译：本发明包括电容膜厚度测量装置和测量系统。本发明还包括使用本发明的这些方面的机器或仪器。本发明另外包括使用本发明的那些装置的方法和程序。本发明公开了一种用于确定诸如磁性薄膜刚性盘的衬底上的润滑剂膜厚度的电容测量装置和技术。使用本发明，可以快速且非破坏性地测量润滑剂厚度在埃刻度或更小的变化。

3. 发明授权

US06756791B1 Method for measuring film thickness using capacitance technique 失效
标题翻译：使用电容技术测量膜厚度的方法
公开(公告)号：US06756791B1
公开(公告)日：2004-06-29
申请号：US10165497
申请日：2002-06-07
申请人： Bharat Bhushan , Christopher D. Hahm
发明人： Bharat Bhushan , Christopher D. Hahm
IPC分类号： G01R2726
CPC分类号： H02J1/10 , G01Q10/06 , G11B2005/001
摘要： The present invention includes capacitive film thickness measurement devices and measurement systems. The invention also includes machines or instruments using those aspects of the invention. The present invention additionally includes methods and procedures using those devices of the present invention. The present invention discloses a capacitance measurement device and technique useful in determining lubricant film thickness on substrates such as magnetic thin-film rigid disks. Using the present invention, variations in lubricant thickness on the Angstrom scale or less may be measured quickly and nondestructively.
摘要翻译：本发明包括电容膜厚度测量装置和测量系统。本发明还包括使用本发明的这些方面的机器或仪器。本发明另外包括使用本发明的那些装置的方法和程序。本发明公开了一种用于确定诸如磁性薄膜刚性盘的衬底上的润滑剂膜厚度的电容测量装置和技术。使用本发明，可以快速且非破坏性地测量润滑剂厚度在埃刻度或更小的变化。

4. 发明授权

US06724199B1 Pin and cup devices for measuring film thickness 失效
标题翻译：针和杯装置用于测量膜厚度
公开(公告)号：US06724199B1
公开(公告)日：2004-04-20
申请号：US10165690
申请日：2002-06-07
申请人： Bharat Bhushan , Christopher D. Hahm
发明人： Bharat Bhushan , Christopher D. Hahm
IPC分类号： G01R2726
CPC分类号： H02J1/10 , G01Q10/06 , G11B2005/001
摘要： Capacitive film thickness measurement devices and measurement systems used in machines or instruments. A capacitance measurement device and technique useful in determining lubricant film thickness on substrates such as magnetic thin-film rigid disks. Variations in lubricant thickness on the Angstrom scale or less may be measured quickly and nondestructively.
摘要翻译：用于机器或仪器的电容薄膜厚度测量装置和测量系统。一种用于确定诸如磁性薄膜刚性盘的衬底上的润滑剂膜厚度的电容测量装置和技术。润滑剂厚度的变化在埃刻度或更小可以快速和非破坏性地测量。

5. 发明授权

US06504386B1 Liquid dielectric capacitor for film thickness mapping, measurement methods using same 失效
标题翻译：液体介质电容器用于膜厚度测绘，测量方法采用相同方式
公开(公告)号：US06504386B1
公开(公告)日：2003-01-07
申请号：US09422376
申请日：1999-10-21
申请人： Bharat Bhushan , Christopher D. Hahm
发明人： Bharat Bhushan , Christopher D. Hahm
IPC分类号： G01R2726
CPC分类号： H02J1/10 , G01Q10/06 , G11B2005/001
摘要： The present invention includes capacitive film thickness measurement devices and measurement systems used in machines or instruments. A capacitance measurement device and technique useful in determining lubricant film thickness on substrates such as magnetic thin-film rigid disks. Using the present invention, variations in lubricant thickness on the Angstrom scale or less may be measured quickly and nondestructively.
摘要翻译：本发明包括用于机器或仪器中的电容膜厚度测量装置和测量系统。一种用于确定诸如磁性薄膜刚性盘的衬底上的润滑剂膜厚度的电容测量装置和技术。使用本发明，可以快速且非破坏性地测量润滑剂厚度在埃刻度或更小的变化。

6. 发明授权

US06459280B1 Capacitance devices for film thickness mapping, measurement methods using same 失效
标题翻译：电容器用于膜厚测绘，测量方法采用相同的方法
公开(公告)号：US06459280B1
公开(公告)日：2002-10-01
申请号：US09619831
申请日：2000-07-20
申请人： Bharat Bhushan , Christopher D. Hahm
发明人： Bharat Bhushan , Christopher D. Hahm
IPC分类号： G01R2726
CPC分类号： H02J1/10 , G11B2005/001
摘要： The present invention includes capacitive film thickness measurement devices and measurement systems. The invention also includes machines or instruments using those aspects of the invention. The present invention additionally includes methods and procedures using those devices of the present invention. The present invention discloses a capacitance measurement device and technique useful in determining lubricant film thickness on substrates such as magnetic thin-film rigid disks. Also disclosed is a device and technique for determining film thickness by suspending the film in a liquid dielectric. Using the present invention, variations in lubricant thickness on the Angstrom scale or less may be measured quickly and nondestructively.
摘要翻译：本发明包括电容膜厚度测量装置和测量系统。本发明还包括使用本发明的这些方面的机器或仪器。本发明另外包括使用本发明的那些装置的方法和程序。本发明公开了一种用于确定诸如磁性薄膜刚性盘的衬底上的润滑剂膜厚度的电容测量装置和技术。还公开了通过将膜悬浮在液体电介质中来确定膜厚度的装置和技术。使用本发明，可以快速且非破坏性地测量润滑剂厚度在埃刻度或更小的变化。

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