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    • 2. 发明授权
    • Lens inspection system
    • 镜片检查系统
    • US08976250B2
    • 2015-03-10
    • US13597704
    • 2012-08-29
    • Joel S. Armstrong-MuntnerJames J. DudleyRichard RuhAnant Rai
    • Joel S. Armstrong-MuntnerJames J. DudleyRichard RuhAnant Rai
    • H04N17/00G01M11/02G01M11/00
    • G01M11/02G01M11/005G01M11/0278G01N21/958G01N2021/9583
    • A lens testing system may have a test pattern source that generates a test pattern of light. A lens may have a lens surface that reflects the test pattern of light. A digital camera system may capture an image of the reflected test pattern of light. Computing equipment may perform image processing operations to evaluate the captured image of the reflected test pattern. The test pattern may contain a known pattern of test elements such as a rectangular array of spots or test elements of other configurations. During image processing operations, the computing equipment may analyze the reflected version of the spots or other test elements to measure characteristics of the lens such as radius of curvature, whether the lens contains flat regions, pits, or bumps, lens placement in a support structure, and other lens performance data. The computing equipment may compare the measured lens data to predetermined criteria.
    • 透镜测试系统可以具有产生光的测试图案的测试图案源。 透镜可以具有反射光的测试图案的透镜表面。 数码相机系统可以捕获反射的测试图案的图像。 计算设备可以执行图像处理操作以评估所反映的测试图案的捕获图像。 测试图案可以包含已知的测试元件图案,例如矩形阵列的斑点或其他配置的测试元件。 在图像处理操作期间,计算设备可以分析点或其他测试元件的反射版本以测量透镜的特性,例如曲率半径,透镜是否包含平坦区域,凹坑或凸起,透镜放置在支撑结构中 ,和其他镜头性能数据。 计算设备可以将测量的透镜数据与预定标准进行比较。
    • 4. 发明申请
    • VIRTUAL DETECTOR FOR SENSOR SYSTEM
    • 用于传感器系统的虚拟探测器
    • US20140070080A1
    • 2014-03-13
    • US13610607
    • 2012-09-11
    • Richard Ruh
    • Richard Ruh
    • G01J1/04
    • G01J1/0414G01J1/0422G01S7/4813G01S17/026G01V8/12
    • A proximity and light sensing device including a light emitting compartment having a light emitter positioned on a substrate and an optical element positioned along a side of the light emitter opposite the substrate. The device further including a light receiving compartment including a light detector positioned on the substrate and an optical element positioned along a side of the light detector opposite the substrate. A mid wall extends in a direction substantially normal to the substrate and is positioned between the light emitting compartment and the light receiving compartment. The device further includes a reflective element positioned at a side of the mid wall facing the light receiving compartment, the reflective element capable of reflecting an off-axis light beam onto the light detector so as to form a real image on the light detector of an otherwise virtual image formed behind the reflector. Other embodiments are also described.
    • 一种接近和光感测装置,包括具有位于基板上的发光体的发光室和沿着与发光体相对的基板侧的光学元件。 该装置还包括一个光接收室,该光接收室包括位于基板上的光检测器和沿着该光检测器与该基板相对的一侧定位的光学元件。 中间壁沿基本上垂直于基板的方向延伸并且位于发光室和光接收室之间。 该装置还包括位于面向光接收室的中间壁的一侧的反射元件,该反射元件能够将离轴光束反射到光检测器上,以便在光检测器上形成实像 否则在反射器后面形成虚拟图像。 还描述了其它实施例。
    • 5. 发明申请
    • Lens Inspection System
    • 镜片检查系统
    • US20130293726A1
    • 2013-11-07
    • US13597704
    • 2012-08-29
    • Joel S. Armstrong-MuntnerJames J. DudleyRichard RuhAnant Rai
    • Joel S. Armstrong-MuntnerJames J. DudleyRichard RuhAnant Rai
    • H04N17/02
    • G01M11/02G01M11/005G01M11/0278G01N21/958G01N2021/9583
    • A lens testing system may have a test pattern source that generates a test pattern of light. A lens may have a lens surface that reflects the test pattern of light. A digital camera system may capture an image of the reflected test pattern of light. Computing equipment may perform image processing operations to evaluate the captured image of the reflected test pattern. The test pattern may contain a known pattern of test elements such as a rectangular array of spots or test elements of other configurations. During image processing operations, the computing equipment may analyze the reflected version of the spots or other test elements to measure characteristics of the lens such as radius of curvature, whether the lens contains flat regions, pits, or bumps, lens placement in a support structure, and other lens performance data. The computing equipment may compare the measured lens data to predetermined criteria.
    • 透镜测试系统可以具有产生光的测试图案的测试图案源。 透镜可以具有反射光的测试图案的透镜表面。 数码相机系统可以捕获反射的测试图案的图像。 计算设备可以执行图像处理操作以评估所反映的测试图案的捕获图像。 测试图案可以包含已知的测试元件图案,例如矩形阵列的斑点或其他配置的测试元件。 在图像处理操作期间,计算设备可以分析点或其他测试元件的反射版本以测量透镜的特性,例如曲率半径,透镜是否包含平坦区域,凹坑或凸起,透镜放置在支撑结构中 ,和其他镜头性能数据。 计算设备可以将测量的透镜数据与预定标准进行比较。
    • 8. 发明授权
    • Proximity sensor with asymmetric optical element
    • 具有不对称光学元件的接近传感器
    • US09366752B2
    • 2016-06-14
    • US13243382
    • 2011-09-23
    • Richard Ruh
    • Richard Ruh
    • H01J40/14G01S7/481G01S17/02
    • G01S7/4814G01S17/026
    • A proximity sensor may be mounted below a display cover layer in an electronic device. The proximity sensor may have a light source that emits light and a detector configured to detect reflections of the emitted light from nearby external objects. Optical structures may be interposed between the proximity sensor and the window in the display cover layer. The optical structures may include a first portion such as a convex lens that is configured to collimate light from the light source so that the light propagates along a surface normal to the display cover layer. The optical structures may also include a second portion such as a prism structure for deflecting uncollimated light away from the propagation axis of the collimated light.
    • 接近传感器可以安装在电子设备中的显示器覆盖层下方。 接近传感器可以具有发光的光源和被配置为检测来自附近外部物体的发射光的反射的检测器。 光学结构可以介于接近传感器和显示器覆盖层中的窗口之间。 光学结构可以包括诸如凸透镜的第一部分,其被配置为准直来自光源的光,使得光沿着垂直于显示器覆盖层的表面传播。 光学结构还可以包括诸如棱镜结构的第二部分,用于偏转未准直的光远离准直光的传播轴。
    • 9. 发明授权
    • Virtual detector for sensor system
    • 传感器系统虚拟探测器
    • US09046415B2
    • 2015-06-02
    • US13610607
    • 2012-09-11
    • Richard Ruh
    • Richard Ruh
    • G01J1/04G01S17/02G01S7/481G01V8/12
    • G01J1/0414G01J1/0422G01S7/4813G01S17/026G01V8/12
    • A proximity and light sensing device including a light emitting compartment having a light emitter positioned on a substrate and an optical element positioned along a side of the light emitter opposite the substrate. The device further including a light receiving compartment including a light detector positioned on the substrate and an optical element positioned along a side of the light detector opposite the substrate. A mid wall extends in a direction substantially normal to the substrate and is positioned between the light emitting compartment and the light receiving compartment. The device further includes a reflective element positioned at a side of the mid wall facing the light receiving compartment, the reflective element capable of reflecting an off-axis light beam onto the light detector so as to form a real image on the light detector of an otherwise virtual image formed behind the reflector. Other embodiments are also described.
    • 一种接近和光感测装置,包括具有位于基板上的发光体的发光室和沿着与发光体相对的基板侧的光学元件。 该装置还包括一个光接收室,该光接收室包括位于基板上的光检测器和沿着该光检测器与该基板相对的一侧定位的光学元件。 中间壁沿基本上垂直于基板的方向延伸并且位于发光室和光接收室之间。 该装置还包括位于面向光接收室的中间壁的一侧的反射元件,该反射元件能够将离轴光束反射到光检测器上,以便在光检测器上形成实像 否则在反射器后面形成虚拟图像。 还描述了其它实施例。
    • 10. 发明申请
    • Proximity Sensor with Asymmetric Optical Element
    • 具有非对称光学元件的接近传感器
    • US20130075595A1
    • 2013-03-28
    • US13243382
    • 2011-09-23
    • Richard Ruh
    • Richard Ruh
    • H01J40/14
    • G01S7/4814G01S17/026
    • A proximity sensor may be mounted below a display cover layer in an electronic device. The proximity sensor may have a light source that emits light and a detector configured to detect reflections of the emitted light from nearby external objects. Optical structures may be interposed between the proximity sensor and the window in the display cover layer. The optical structures may include a first portion such as a convex lens that is configured to collimate light from the light source so that the light propagates along a surface normal to the display cover layer. The optical structures may also include a second portion such as a prism structure for deflecting uncollimated light away from the propagation axis of the collimated light.
    • 接近传感器可以安装在电子设备中的显示器覆盖层下方。 接近传感器可以具有发光的光源和被配置为检测来自附近外部物体的发射光的反射的检测器。 光学结构可以介于接近传感器和显示器覆盖层中的窗口之间。 光学结构可以包括诸如凸透镜的第一部分,其被配置为准直来自光源的光,使得光沿着垂直于显示器覆盖层的表面传播。 光学结构还可以包括诸如棱镜结构的第二部分,用于偏转未准直的光远离准直光的传播轴。