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    • 4. 发明申请
    • SEMICONDUCTOR PACKAGE
    • 半导体封装
    • US20130161816A1
    • 2013-06-27
    • US13773896
    • 2013-02-22
    • Chi-Chih ChuCheng-Yi Weng
    • Chi-Chih ChuCheng-Yi Weng
    • H01L23/498
    • H01L23/3128H01L23/49816H01L24/48H01L24/73H01L2224/32225H01L2224/48225H01L2224/48227H01L2224/73265H01L2924/00014H01L2924/15311H01L2924/15331H01L2924/181H01L2924/00012H01L2924/00H01L2224/45099H01L2224/45015H01L2924/207
    • The present invention relates to a semiconductor package. The semiconductor package includes a substrate, at least one chip, a plurality of conductive elements, a plurality of first conductors and a molding compound. The substrate has a plurality of first pads and a solder mask. The first pads are exposed to a first surface of the substrate, and the material of the first pads is copper. The solder mask is disposed on the first surface, contacts the first pads directly, and has at least on opening so as to expose part of the first pads. The chip is mounted on the first surface of the substrate. The conductive elements electrically connect the chip and the substrate. The first conductors are disposed on the first pads. The molding compound is disposed on the first surface of the substrate, and encapsulates the chip, the conductive elements and part of the first conductors. Whereby, the solder mask contacts the first pads directly, and thus results in higher bonding strength, so as to avoid the bridge between the first conductors caused by the first conductors permeating into the interface between the solder mask and the first pads.
    • 本发明涉及一种半导体封装。 半导体封装包括衬底,至少一个芯片,多个导电元件,多个第一导体和模制化合物。 基板具有多个第一焊盘和焊接掩模。 第一焊盘暴露于衬底的第一表面,并且第一焊盘的材料是铜。 焊接掩模设置在第一表面上,直接接触第一焊盘,并且至少具有开口以暴露第一焊盘的部分。 芯片安装在基板的第一表面上。 导电元件电连接芯片和基板。 第一导体设置在第一焊盘上。 模塑料配置在基板的第一表面上,并封装芯片,导电元件和第一导体的一部分。 由此,焊接掩模直接接触第一焊盘,从而导致更高的焊接强度,以避免第一导体之间由第一导体渗入焊料掩模和第一焊盘之间的界面引起的桥。
    • 8. 发明授权
    • Semiconductor package
    • 半导体封装
    • US08405212B2
    • 2013-03-26
    • US12818422
    • 2010-06-18
    • Chi-Chih ChuCheng-Yi Weng
    • Chi-Chih ChuCheng-Yi Weng
    • H01L23/48H01L23/52H01L29/40
    • H01L23/3128H01L23/49816H01L24/48H01L24/73H01L2224/32225H01L2224/48225H01L2224/48227H01L2224/73265H01L2924/00014H01L2924/15311H01L2924/15331H01L2924/181H01L2924/00012H01L2924/00H01L2224/45099H01L2224/45015H01L2924/207
    • The present invention relates to a semiconductor package. The semiconductor package includes a substrate, at least one chip, a plurality of conductive elements, a plurality of first conductors and a molding compound. The substrate has a plurality of first pads and a solder mask. The first pads are exposed to a first surface of the substrate, and the material of the first pads is copper. The solder mask is disposed on the first surface, contacts the first pads directly, and has at least one opening so as to expose part of the first pads. The chip is mounted on the first surface of the substrate. The conductive elements electrically connect the chip and the substrate. The first conductors are disposed on the first pads. The molding compound is disposed on the first surface of the substrate, and encapsulates the chip, the conductive elements and part of the first conductors. Whereby, the solder mask contacts the first pads directly, and thus results in higher bonding strength, so as to avoid the bridge between the first conductors caused by the first conductors permeating into the interface between the solder mask and the first pads.
    • 本发明涉及半导体封装。 半导体封装包括衬底,至少一个芯片,多个导电元件,多个第一导体和模制化合物。 基板具有多个第一焊盘和焊接掩模。 第一焊盘暴露于衬底的第一表面,并且第一焊盘的材料是铜。 焊接掩模设置在第一表面上,直接接触第一焊盘,并且具有至少一个开口以暴露第一焊盘的部分。 芯片安装在基板的第一表面上。 导电元件电连接芯片和基板。 第一导体设置在第一焊盘上。 模塑料配置在基板的第一表面上,并封装芯片,导电元件和第一导体的一部分。 由此,焊接掩模直接接触第一焊盘,从而导致更高的焊接强度,以避免第一导体之间由第一导体渗入焊料掩模和第一焊盘之间的界面引起的桥。
    • 9. 发明申请
    • Semiconductor Package
    • 半导体封装
    • US20110156251A1
    • 2011-06-30
    • US12818422
    • 2010-06-18
    • Chi-Chih ChuCheng-Yi Weng
    • Chi-Chih ChuCheng-Yi Weng
    • H01L23/485
    • H01L23/3128H01L23/49816H01L24/48H01L24/73H01L2224/32225H01L2224/48225H01L2224/48227H01L2224/73265H01L2924/00014H01L2924/15311H01L2924/15331H01L2924/181H01L2924/00012H01L2924/00H01L2224/45099H01L2224/45015H01L2924/207
    • The present invention relates to a semiconductor package. The semiconductor package includes a substrate, at least one chip, a plurality of conductive elements, a plurality of first conductors and a molding compound. The substrate has a plurality of first pads and a solder mask. The first pads are exposed to a first surface of the substrate, and the material of the first pads is copper. The solder mask is disposed on the first surface, contacts the first pads directly, and has at least one opening so as to expose part of the first pads. The chip is mounted on the first surface of the substrate. The conductive elements electrically connect the chip and the substrate. The first conductors are disposed on the first pads. The molding compound is disposed on the first surface of the substrate, and encapsulates the chip, the conductive elements and part of the first conductors. Whereby, the solder mask contacts the first pads directly, and thus results in higher bonding strength, so as to avoid the bridge between the first conductors caused by the first conductors permeating into the interface between the solder mask and the first pads.
    • 本发明涉及半导体封装。 半导体封装包括衬底,至少一个芯片,多个导电元件,多个第一导体和模制化合物。 基板具有多个第一焊盘和焊接掩模。 第一焊盘暴露于衬底的第一表面,并且第一焊盘的材料是铜。 焊接掩模设置在第一表面上,直接接触第一焊盘,并且具有至少一个开口以暴露第一焊盘的部分。 芯片安装在基板的第一表面上。 导电元件电连接芯片和基板。 第一导体设置在第一焊盘上。 模塑料配置在基板的第一表面上,并封装芯片,导电元件和第一导体的一部分。 由此,焊接掩模直接接触第一焊盘,从而导致更高的焊接强度,以避免第一导体之间由第一导体渗入焊料掩模和第一焊盘之间的界面引起的桥。