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    • 1. 发明授权
    • Silicon controlled rectifier structure with guard ring controlled circuit
    • 具有保护环控制电路的可控硅整流器结构
    • US06791146B2
    • 2004-09-14
    • US10178235
    • 2002-06-25
    • Chen-Shang LaiMeng-Huang LiuShin SuTao-Cheng Lu
    • Chen-Shang LaiMeng-Huang LiuShin SuTao-Cheng Lu
    • H01L2362
    • H01L27/0262H01L27/0817H01L29/7436
    • The present invention provides a PMSCR (bridging modified lateral modified silicon controlled rectifier having first conductivity type) with a guard ring controlled circuit. The present invention utilizes controlled circuit such as switch to control functionally of guard ring of PMSCR. In normal operation, the switch is of low impedance such that the guard ring is short to anode and collects electrons to enhance the power-zapping immunity. Furthermore, during the ESD (electrostatic discharge) event, the switch is of high impedance such that the guard ring is non-functional. Thus, the PMSCR with guard ring control circuit can enhance both the ESD performance and the power-zapping immunity in the application of the HV (high voltage) pad.
    • 本发明提供了具有保护环控制电路的PMSCR(具有第一导电类型的桥接修改的侧向修改的可控硅整流器)。 本发明利用诸如开关的控制电路来控制PMSCR保护环的功能。 在正常工作中,开关具有低阻抗,使得保护环与阳极短路并收集电子以提高功率跳跃抗扰度。 此外,在ESD(静电放电)事件期间,开关具有高阻抗,使得保护环不起作用。 因此,具有保护环控制电路的PMSCR可以在HV(高电压)焊盘的应用中增强ESD性能和功率切换抗扰性。
    • 2. 发明授权
    • Electrostatic discharge protection circuits with latch-up prevention function
    • 具有防闩锁功能的静电放电保护电路
    • US06410963B1
    • 2002-06-25
    • US09977707
    • 2001-10-16
    • Chen-Shang LaiMeng-Huang LiuShin SuTao-Cheng Lu
    • Chen-Shang LaiMeng-Huang LiuShin SuTao-Cheng Lu
    • H01L2342
    • H01L27/0251
    • An electrostatic discharge protection which is electrically coupled with an interface terminal and a devices area, at least include a first bipolar junction transistor, a second bipolar junction transistor, a first MOS transistor, and a second MOS transistor. Both bipolar junction transistors forms the well-known silicon controlled rectifier, first MOS transistor locates between interface terminal and second bipolar junction transistor and second MOS transistor locates between emitter of second bipolar junction transistor and ground point, and gates of both MOS transistor electrically coupled with voltage base point whose voltage is equal to work voltage of devices area. While devices area is turned off, silicon controlled rectifier would be latch-up and provides function of electrostatic discharge protection. While devices area is turned on, second MOS transistor also is turned on so that part of current flows into ground point but not flows into second bipolar junction transistor. Thus, positive feedback between two bipolar junction transistors is reduced and then latch-up is eliminated.
    • 与接口端子和器件区域电耦合的静电放电保护至少包括第一双极结型晶体管,第二双极结型晶体管,第一MOS晶体管和第二MOS晶体管。 两个双极结型晶体管形成公知的可控硅整流器,第一MOS晶体管位于接口端子和第二双极结型晶体管之间,第二MOS晶体管位于第二双极结型晶体管的发射极和接地点之间,并且两个MOS晶体管的栅极电耦合 电压基点电压等于设备面积的工作电压。 当器件区域关闭时,可控硅整流器将被闩锁并提供静电放电保护功能。 当器件区域导通时,第二MOS晶体管也导通,使得部分电流流入接地点,但不流入第二双极结型晶体管。 因此,两个双极结晶体管之间的正反馈减小,然后消除闭锁。
    • 6. 发明授权
    • ESD protection apparatus and method for dual-polarity input pad
    • 用于双极性输入板的ESD保护装置和方法
    • US06933540B2
    • 2005-08-23
    • US10606922
    • 2003-06-27
    • Meng-Huang LiuChun-Hsiang LaiShin SuTao-Cheng Lu
    • Meng-Huang LiuChun-Hsiang LaiShin SuTao-Cheng Lu
    • H01L27/02H01L29/72
    • H01L27/0262H01L29/87
    • An ESD protection apparatus for dual-polarity input pad comprises a triple-well formed with a first, second and third regions to form an SCR structure. A first and second ground connection regions of opposite conductivity types are formed on the first region, a first and second input connection regions of opposite conductivity types are formed in the third region, and a bridge region is formed across the second region and extends to the first and third regions. Under normal operation, the first, second, and third regions form two back-to-back diodes. Under positive polarity ESD event, breakdown is occurred between the bridge and first regions to thereby trigger an SCR circuit for positive polarity ESD protection. Under negative polarity ESD event, breakdown is occurred between the bridge and third regions to thereby trigger an SCR circuit for negative polarity ESD protection.
    • 用于双极性输入焊盘的ESD保护装置包括形成有第一,第二和第三区域以形成SCR结构的三阱。 在第一区域上形成有相反导电类型的第一和第二接地连接区域,在第三区域中形成相反导电类型的第一和第二输入连接区域,跨越第二区域形成桥接区域并延伸到 第一和第三区域。 在正常操作下,第一,第二和第三区域形成两个背对背二极管。 在正极性ESD事件下,在桥与第一区之间发生击穿,从而触发用于正极性ESD保护的SCR电路。 在负极性ESD事件下,桥和第三区之间发生击穿,从而触发用于负极性ESD保护的SCR电路。