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    • 7. 发明申请
    • THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICES
    • 三维半导体存储器件
    • US20120068255A1
    • 2012-03-22
    • US13220376
    • 2011-08-29
    • Changhyun LEEByoungkeun SONHyejin CHO
    • Changhyun LEEByoungkeun SONHyejin CHO
    • H01L29/792
    • H01L27/11582H01L27/11565H01L27/1157H01L29/7926
    • Three-dimensional (3D) nonvolatile memory devices include a substrate having a well region of second conductivity type (e.g., P-type) therein and a common source region of first conductivity type (e.g., N-type) on the well region. A recess is provided, which extends partially (or completely) through the common source region. A vertical stack of nonvolatile memory cells are provided on the substrate. This vertical stack of nonvolatile memory cells includes a vertical stack of spaced-apart gate electrodes and a vertical active region, which extends on sidewalls of the vertical stack of spaced-apart gate electrodes and on a sidewall of the recess. Gate dielectric layers are provided, which extend between respective ones of the vertical stack of spaced-apart gate electrodes and the vertical active region. The gate dielectric layers may include a composite of a tunnel insulating layer, a charge storage layer, a relatively high bandgap barrier dielectric layer and a blocking insulating layer having a relatively high dielectric strength.
    • 三维(3D)非易失性存储器件包括其中具有第二导电类型(例如,P型)的阱区和在该区域上具有第一导电类型(例如,N型)的公共源极区的衬底。 设置有通过共同源极区域部分(或完全)延伸的凹部。 在基板上提供了一堆非易失性存储单元。 这种垂直堆叠的非易失性存储单元包括间隔开的栅电极的垂直叠层和垂直有源区,该垂直有源区延伸在间隔开的栅电极的垂直叠层的侧壁上并在凹槽的侧壁上延伸。 提供栅介电层,其在相互间隔开的栅电极的垂直叠层和垂直有源区之间延伸。 栅极电介质层可以包括隧道绝缘层,电荷存储层,相对高的带隙势垒介电层和具有相对高的介电强度的阻挡绝缘层的复合材料。
    • 10. 发明申请
    • NONVOLATILE MEMORY DEVICE, PROGRAMMING METHOD THEREOF AND MEMORY SYSTEM INCLUDING THE SAME
    • 非易失性存储器件,其编程方法和包括其的存储器系统
    • US20140029344A1
    • 2014-01-30
    • US14043256
    • 2013-10-01
    • Changhyun LEEJinman HANDoogon KIMSunghoi HURJongin YUN
    • Changhyun LEEJinman HANDoogon KIMSunghoi HURJongin YUN
    • G11C16/10
    • G11C16/107G11C16/0483G11C16/10G11C2213/71H01L27/11578H01L27/11582H01L29/7926
    • Provided is a programming method of a nonvolatile memory device. The nonvolatile memory device includes a substrate and a plurality of memory cells which are stacked in the direction perpendicular to the substrate. The programming method applies a first voltage to a selected bit line connected to at least two memory strings in same column including a memory cell of the plurality of memory cell to be programmed, applies a second voltage to an unselected bit line connected to at least two memory strings in same column including a memory cell of the plurality of memory cell to be program-prohibited, applies a third voltage to a selected string selection line connected to at least two memory strings in same row, applies a fourth voltage to an unselected string selection line connected to at least two memory strings in same row, and applies a program operation voltage to a plurality of word lines, each word line connected to each corresponding memory cell in the memory string, wherein the first to third voltages are positive voltages.
    • 提供了一种非易失性存储器件的编程方法。 非易失性存储器件包括基板和沿垂直于基板的方向堆叠的多个存储单元。 编程方法将第一电压施加到连接到包括要编程的多个存储器单元的存储单元的同一列中的至少两个存储器串的选定位线,将第二电压施加到连接至少两个的未选定位线 包含要被编程禁止的多个存储单元的存储单元的同一列中的存储器串向同一行中连接到至少两个存储器串的所选择的串选择线施加第三电压,将第四电压施加到未选择的串 选择线连接到同一行中的至少两个存储器串,并且将编程操作电压施加到多个字线,每个字线连接到存储器串中的每个对应的存储单元,其中第一至第三电压是正电压。