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    • 1. 发明申请
    • APPARATUS TO PERFORM A NON-CONTACT TEST OF A SEMICONDUCTOR PACKAGE
    • 执行半导体封装的非接触测试的设备
    • US20100141937A1
    • 2010-06-10
    • US12632960
    • 2009-12-08
    • Chang-Hyun RyuSsang-Gun LimDong-Hae SonPoom-Seong Park
    • Chang-Hyun RyuSsang-Gun LimDong-Hae SonPoom-Seong Park
    • G01N21/00
    • G01R31/2656G01N21/95684
    • An apparatus to test a semiconductor package includes a vertical illuminator to supply vertical illumination in the same axial direction as a measurement target and a vertical image unit to capture a vertical image of the measurement target so that a testing apparatus may 2-dimensionally determine information on the shape, size, or position of a solder ball. An inclined illuminator may supply inclined illumination in a different axial direction from the measurement target, and an inclined image capture unit may capture a side image of the measurement target so that the testing apparatus may 3-dimensionally determine information on a state of contact of the solder ball with the ball land. The inclined image capture unit may include a color camera using color information, thereby markedly increasing test reliability and yield.
    • 测试半导体封装的装置包括:垂直照明器,用于沿与测量对象相同的轴向方向提供垂直照明;以及垂直图像单元,用于捕获测量对象的垂直图像,使得测试装置可以二维地确定关于 焊球的形状,尺寸或位置。 倾斜照明器可以在与测量对象不同的轴向方向上提供倾斜照明,并且倾斜图像拍摄单元可以捕获测量对象的侧面图像,使得测试装置可以三维地确定关于测量对象的接触状态的信息 焊球与球地。 倾斜图像捕获单元可以包括使用颜色信息的彩色照相机,从而显着提高测试可靠性和产量。
    • 2. 发明授权
    • Apparatus to perform a non-contact test of a semiconductor package
    • 用于执行半导体封装的非接触测试的装置
    • US08319961B2
    • 2012-11-27
    • US12632960
    • 2009-12-08
    • Chang-Hyun RyuSsang-Gun LimDong-Hae SonPoom-Seong Park
    • Chang-Hyun RyuSsang-Gun LimDong-Hae SonPoom-Seong Park
    • G01N21/00
    • G01R31/2656G01N21/95684
    • An apparatus to test a semiconductor package includes a vertical illuminator to supply vertical illumination in the same axial direction as a measurement target and a vertical image unit to capture a vertical image of the measurement target so that a testing apparatus may 2-dimensionally determine information on the shape, size, or position of a solder ball. An inclined illuminator may supply inclined illumination in a different axial direction from the measurement target, and an inclined image capture unit may capture a side image of the measurement target so that the testing apparatus may 3-dimensionally determine information on a state of contact of the solder ball with the ball land. The inclined image capture unit may include a color camera using color information, thereby markedly increasing test reliability and yield.
    • 测试半导体封装的装置包括:垂直照明器,用于沿与测量对象相同的轴向方向提供垂直照明;以及垂直图像单元,用于捕获测量对象的垂直图像,使得测试装置可以二维地确定关于 焊球的形状,尺寸或位置。 倾斜照明器可以在与测量对象不同的轴向方向上提供倾斜照明,并且倾斜图像拍摄单元可以捕获测量对象的侧面图像,使得测试装置可以三维地确定关于测量对象的接触状态的信息 焊球与球地。 倾斜图像捕获单元可以包括使用颜色信息的彩色照相机,从而显着提高测试可靠性和产量。