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1. 发明授权

US08631923B1 Device sorting apparatus 有权
标题翻译：设备分拣设备
公开(公告)号：US08631923B1
公开(公告)日：2014-01-21
申请号：US13630071
申请日：2012-09-28
申请人： Chak Tong Sze , Pei Wei Tsai , Wai Hong Sizto , Chunbai Wang , Wai Chuen Gan , Shing Wai Tam
发明人： Chak Tong Sze , Pei Wei Tsai , Wai Hong Sizto , Chunbai Wang , Wai Chuen Gan , Shing Wai Tam
IPC分类号： B65G37/00
CPC分类号： H01L21/67271 , B07C5/36
摘要： A device sorting apparatus 100 is disclosed herein. In a described embodiment, the device sorting apparatus 100 comprises a plurality of bin connectors 120 for coupling to respective bins for storing sorted devices and a rotary distribution module 102 for receiving a device 200 to be sorted and for discharging the device 200 selectively into one of the bin connectors 120 to enable the device 200 to be unloaded to the respective bin. The device sorting apparatus 100 further comprises a sensor 110 coupled to the rotary distribution module 102 for detecting the discharge of the device 200, and which is rotatable together with the rotary distribution module 102; and a rotary transformer 400 for powering the sensor 110.
摘要翻译：本文公开了一种装置分类装置100。在所描述的实施例中，装置分类装置100包括多个箱连接器120，用于联接到相应的箱，用于存储分类装置;以及旋转分配模块102，用于接收待分类的装置200，并将装置200选择性地排放到箱连接器120以使装置200能够卸载到相应的仓。装置分拣装置100还包括耦合到旋转分配模块102的传感器110，用于检测装置200的排放，并与旋转分配模块102一起旋转; 以及用于为传感器110供电的旋转变压器400。

2. 发明授权

US07733114B2 Test handler including gripper-type test contactor 有权
标题翻译：测试处理器包括夹具式测试接触器
公开(公告)号：US07733114B2
公开(公告)日：2010-06-08
申请号：US12255057
申请日：2008-10-21
申请人： Chak Tong Albert Sze , Pei Wei Tsai , Sai Kit Wong , Wai Hong Sizto
发明人： Chak Tong Albert Sze , Pei Wei Tsai , Sai Kit Wong , Wai Hong Sizto
IPC分类号： G01R31/26
CPC分类号： G01R31/2893 , G01R31/2635
摘要： A test handler is provided for testing electronic devices having light-emitting elements. Electronic devices are mounted at a loading position, optical measurements are conducted at a test contact position where a testing device is located for optical communication with the light-emitting elements and then tested electronic devices are removed at an unloading position. Multiple test contactors hold the electronic devices and move them to and through the loading position, test contact position and unloading position in sequence. Each test contactor comprises a device contact point including electrical conductors which are connected to electrical contacts of the electronic device when the electronic device is mounted at the device contact point, and a retaining mechanism grips the electronic device at the device contact point such that the retaining mechanism does not obstruct the optical communication between the testing device and the light-emitting element at the test contact position.
摘要翻译：提供了一种用于测试具有发光元件的电子设备的测试处理器。电子设备安装在加载位置，光学测量在测试设备所在的测试接触位置处进行，以与发光元件光学通信，然后在卸载位置移除测试的电子设备。多个测试接触器握住电子设备，并将它们依次移动并穿过装载位置，测试接触位置和卸载位置。每个测试接触器包括一个设备接触点，包括当电子设备安装在设备接触点时连接到电子设备的电触头的电导体，并且保持机构在设备接触点处夹持电子设备，使得保持机构不会阻碍测试装置与测试接触位置处的发光元件之间的光通信。

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