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    • 7. 发明授权
    • Protective structure having a semiconductor substrate
    • 具有半导体衬底的保护结构
    • US08531011B2
    • 2013-09-10
    • US13566039
    • 2012-08-03
    • Andre SchmennDamian SojkaCarsten Ahrens
    • Andre SchmennDamian SojkaCarsten Ahrens
    • H01L31/075H01L31/105H01L31/117
    • H01L27/0255H01L21/22H01L21/265H01L29/66121H01L29/868
    • A protective structure is produced by providing a semiconductor substrate having doping of a first conductivity type. A semiconductor layer having doping of a second conductivity type is applied at a surface of the semiconductor substrate. A buried layer with doping of a second conductivity type is formed in a first region of the semiconductor layer, producing a layer at the junction between the semiconductor layer and semiconductor substrate. A first dopant zone having doping of a first conductivity type is formed in the first region of the semiconductor layer above the buried layer. A second dopant zone having doping of a second conductivity type is formed in a second region of the semiconductor layer. An electrical insulation is formed between the first and second regions of the semiconductor layer. A common connection device is formed for the first and second dopant zones.
    • 通过提供具有第一导电类型的掺杂的半导体衬底来制造保护结构。 在半导体衬底的表面上施加具有第二导电类型掺杂的半导体层。 在半导体层的第一区域中形成具有第二导电类型的掺杂的掩埋层,在半导体层和半导体衬底之间的接合处产生一层。 在掩埋层上方的半导体层的第一区域中形成具有第一导电类型掺杂的第一掺杂区。 在半导体层的第二区域中形成具有第二导电类型掺杂的第二掺杂区。 在半导体层的第一和第二区域之间形成电绝缘。 形成用于第一和第二掺杂剂区域的公共连接装置。