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1. 发明申请

US20200064609A1 Light Microscope and Method for Providing Structured Illumination Light 审中-公开
公开(公告)号：US20200064609A1
公开(公告)日：2020-02-27
申请号：US16610223
申请日：2018-04-24
申请人： Carl Zeiss Microscopy GmbH , LioniX International B.V.
发明人： Gerhard Krampert , Kai Wicker , Ralf Netz , Ronald Dekker , Edwin Jan Klein , Douwe Harmen Geuzebroek
IPC分类号： G02B21/00 , G02B27/58
摘要： A light microscope comprises: a structuring optical unit comprising a waveguide chip for providing a structured illumination; an input selection device for variably directing light to one of several inputs of the waveguide chip; the waveguide chip further comprising a light guide path following each of the inputs; each light guide path divides into several path divisions; and each path division leads to one output of the wave-guide chip. The outputs of the waveguide chip can be arranged at a pupil plane of the light microscope, and an exit direction of light from the outputs is transverse to a plane defined by the waveguide chip. A method for providing structured illumination light using the light microscope is also described.

2. 发明授权

US11454792B2 Light microscope and method for providing structured illumination light 有权
公开(公告)号：US11454792B2
公开(公告)日：2022-09-27
申请号：US16610223
申请日：2018-04-24
申请人： Carl Zeiss Microscopy GmbH , LioniX International B.V.
发明人： Gerhard Krampert , Kai Wicker , Ralf Netz , Ronald Dekker , Edwin Jan Klein , Douwe Harmen Geuzebroek
IPC分类号： G02B21/00 , G02B27/58 , G01N21/64 , G02B21/36
摘要： A light microscope comprises: a structuring optical unit comprising a waveguide chip for providing a structured illumination; an input selection device for variably directing light to one of several inputs of the waveguide chip; the waveguide chip further comprising a light guide path following each of the inputs; each light guide path divides into several path divisions; and each path division leads to one output of the wave-guide chip. The outputs of the waveguide chip can be arranged at a pupil plane of the light microscope, and an exit direction of light from the outputs is transverse to a plane defined by the waveguide chip. A method for providing structured illumination light using the light microscope is also described.

3. 发明授权

US11555991B2 Method for illuminating samples in microscopic imaging methods 有权
公开(公告)号：US11555991B2
公开(公告)日：2023-01-17
申请号：US17057847
申请日：2019-05-24
申请人： Carl Zeiss Microscopy GmbH
发明人： Joerg Siebenmorgen , Ralf Netz
IPC分类号： G02B21/06 , G02B21/00
摘要： A method for illuminating samples in microscopic imaging methods, wherein a number m of different wavelengths λi, with m>I and i=I, . . . , m, is selected for the illumination. For each of the wavelengths λi a target phase function Δφi(x, y, λi) is predefined, wherein x and y denote spatial coordinates in a plane perpendicular to an optical axis z and each target phase function Δφi(x, y, λi) is effective only for the corresponding wavelength λi. The target phase functions Δφi are predefined depending on the structure of the sample and/or the beam shape and/or illumination light structure to be impressed on the light used for illumination. A total phase mask is then produced which realises all target phase functions Δφi(x, y, λi). This total phase mask is then illuminated simultaneously or successively with coherent light of wavelengths λi such that the predefined structure of the illumination light is generated in the region of the sample.

4. 发明授权

US11525988B2 Assembly for increasing the resolution of a laser scanning microscope 有权
公开(公告)号：US11525988B2
公开(公告)日：2022-12-13
申请号：US16481795
申请日：2018-01-25
申请人： Carl Zeiss Microscopy GmbH
发明人： Kai Wicker , Ralf Netz
IPC分类号： G02B21/00 , G02B27/10 , G02B27/12
摘要： An arrangement for increasing resolution of a laser scanning microscope has a simplified adjustment and lower susceptibility to errors. The pupil beam from the laser scanning microscope is coupled into a shortened common path interferometer, to make wavefronts of a pupil image mirrored at at least one axis and wavefronts of an unchanged pupil image interfere. The area of a pupil from the pupil beam is split into two complementary portions P and Q producing two partial beams separately supplied to at least one beam deflection means by total-internal reflection along the common path interferometer. The light of the interferometer branches from transmitted light of the one interferometer branch and reflected light of the other interferometer branch is made to interfere at a partly transmissive beam splitter layer to cause constructive interference C and destructive interference D of the wavefronts from the two different portions P and Q of the pupil.

5. 发明授权

US10095017B2 Microscope and microscopy method 有权
公开(公告)号：US10095017B2
公开(公告)日：2018-10-09
申请号：US14400167
申请日：2013-05-07
申请人： Carl Zeiss Microscopy GmbH
发明人： Tiemo Anhut , Thomas Kalkbrenner , Ralf Netz
IPC分类号： G02B21/00 , G02B26/06 , G02F1/01
摘要： A microscope, preferably a laser scanning microscope, with at least one illuminating beam, which in a partial area along the cross-section thereof, is phase-modulated with a modulation frequency. A microscope objective is provided for focusing the illumination beam onto a sample. The microscope further has a detection beam path and at least one demodulation means, wherein a pulsed illumination beam is present. In the illumination beam path upstream of the microscope objective, a first polarization beam splitter is provided, which generates at least first and second partial beam paths that have differing, preferably adjustable, optical paths. A combination element, such as a second pole splitter, for rejoining the partial beams is provided. In one partial beam path, a phase element is provided, which has at least two areas having differing phase interferences.

6. 发明授权

US09989746B2 Light microscope and microscopy method 有权
公开(公告)号：US09989746B2
公开(公告)日：2018-06-05
申请号：US15442937
申请日：2017-02-27
申请人： Carl Zeiss Microscopy GmbH
发明人： Wolfgang Bathe , Ralf Netz
IPC分类号： G02B21/00 , G02B21/02 , G02B27/58
CPC分类号： G02B21/0072 , G02B21/0032 , G02B21/0044 , G02B21/0076 , G02B21/008 , G02B21/025 , G02B27/58
摘要： An optical microscope having a sample plane for positioning a sample, and a light source for emitting illumination light, includes optical imaging means for guiding the illumination light into the sample plane. A detector device having a plurality of detector elements for detecting sample light coming from the sample. Adjacent detector elements are at a distance from one another which is smaller than an Airy-Disk produced by a point of the sample plane on the detector device. A scanning device has at least a first and a second optical arrangement simultaneously movable in a common direction for producing an illumination scanning movement and a detection scanning movement, which are opposite to one another. Sample regions spaced apart from one another can be examined simultaneously, such that both a beam path of the sample light from the sample plane to the detector device and a beam path of the illumination light from the light source to the sample plane run via the first optical arrangement and only one of these two beam paths runs via the second optical arrangement.

7. 发明授权

US09864182B2 High-resolution scanning microscopy 有权
公开(公告)号：US09864182B2
公开(公告)日：2018-01-09
申请号：US14489885
申请日：2014-09-18
申请人： Carl Zeiss Microscopy GmbH
发明人： Ingo Kleppe , Ralf Netz , Thomas Kalkbrenner , Ralf Wolleschensky , Yauheni Novikau
IPC分类号： G02B21/00 , G02B21/06 , G02B21/16 , G02B21/02 , G02B27/58 , G02B6/06 , G02B26/08 , G02B27/10
CPC分类号： G02B21/0072 , G02B6/06 , G02B21/0032 , G02B21/0076 , G02B21/008 , G02B21/025 , G02B21/06 , G02B21/16 , G02B26/0833 , G02B27/1013 , G02B27/58
摘要： A microscope and method for high resolution scanning microscopy of a sample, having: an illumination device for the purpose of illuminating the sample, an imaging device for the purpose of scanning at least one point or linear spot across the sample and of imaging the point or linear spot into a diffraction-limited, static single image below a reproduction scale in a detection plane. A detector device for detecting the single image in the detection plane for various scan positions is also provided. An evaluation device for the purpose of evaluating a diffraction structure of the single image for the scan positions is provided. The detector device has a detector array which has pixels and which is larger than the single image. At least one phase mask with a variable lateral profile of the phase influence is included in or near to the objective pupil, or in a plane which is conjugated to the objective pupil, for generating a spatial distribution of the illumination light and/or the detection light perpendicular to the optical axis, and/or in the direction of the optical axis.

8. 发明授权

US09507137B2 Microscope with structured illumination using displaceable grid structures 有权
标题翻译：具有结构化照明的显微镜，采用位移栅格结构
公开(公告)号：US09507137B2
公开(公告)日：2016-11-29
申请号：US14222142
申请日：2014-03-21
申请人： Carl Zeiss Microscopy GmbH
发明人： Thomas Kalkbrenner , Ingo Kleppe , Ralf Netz
IPC分类号： G02B21/08 , G02B21/16 , G02B27/09
CPC分类号： G02B21/082 , G02B21/16 , G02B27/0988
摘要： A microscope and a method of microscopy use structured illumination, involving imaging a grid structure or periodic light distribution on a sample. By displacing the image of the grid structure, imaging is carried out under different phase positions, and a high-resolution sample image is calculated from the recorded images. The grid structure or light distribution is generated by using at least two phase grids arranged one in front of the other, and different orientations of the light distribution perpendicular to the illumination direction are generated by displacing the phase grids relative to one another, with displacement, imaging and calculation being carried out for different orientations.
摘要翻译：显微镜和显微镜方法使用结构照明，包括对样品上的栅格结构或周期性光分布进行成像。通过移位网格结构的图像，在不同的相位位置进行成像，并从记录的图像计算出高分辨率的采样图像。栅格结构或光分布通过使用一个在另一个之前布置的至少两个相位栅格而产生，并且通过相对于彼此移位相位而产生垂直于照明方向的光分布的不同取向，针对不同的方向进行成像和计算。

9. 发明申请

US20150185454A1 HIGH-RESOLUTION SCANNING MICROSCOPY 有权
标题翻译：高分辨率扫描显微镜
公开(公告)号：US20150185454A1
公开(公告)日：2015-07-02
申请号：US14490806
申请日：2014-09-19
申请人： Carl Zeiss Microscopy GmbH
发明人： Thomas KALKBRENNER , Ingo Kleppe , Helmut Lippert , Ralf Netz
IPC分类号： G02B21/00 , G01J9/02 , G02B21/02 , G02B6/06 , G02B26/08
CPC分类号： G02B21/008 , G01J9/02 , G02B6/06 , G02B21/0032 , G02B21/0072 , G02B21/0076 , G02B21/0084 , G02B21/025 , G02B26/0816 , G02B26/0833 , G02B27/58
摘要： A microscope for high resolution scanning microscopy of a sample, having:an illumination device for the purpose of illuminating the sample, an imaging device for the purpose of scanning at least one point or linear spot over the sample and of imaging the point or linear spot into a diffraction-limited, static single image below am imaging scale in a detection plane. A detector device for detecting the single image in the detection plane for various scan positions, with a spatial resolution which, taking into account the imaging scale in at least one dimension/measurement, is at least twice as high as a full width at half maximum of the diffraction-limited single image. The amplitude and/or phase of a wavefront influenced by the sample is detected with spatial resolution by means for wavefront detection, and wherein the influence of the sample on the phase is determined by means of a wavefront sensor.
摘要翻译：用于样品的高分辨率扫描显微镜的显微镜，具有：用于照亮样品的照明装置，用于扫描样品上至少一个点或线性斑点并成像点或线性斑点的成像装置在检测平面内成像低于成像尺度的衍射极限静态单一图像。用于检测用于各种扫描位置的检测平面中的单个图像的检测器装置，其具有考虑到至少一个维度/测量中的成像刻度的空间分辨率至少为半高的全宽度的两倍的衍射极限单图像。通过用于波前检测的方式通过空间分辨率来检测受样本影响的波前的幅度和/或相位，并且其中样本对相位的影响通过波前传感器确定。

10. 发明授权

US11933956B2 Method and device for illuminating a sample plane 有权
公开(公告)号：US11933956B2
公开(公告)日：2024-03-19
申请号：US17247210
申请日：2020-12-03
申请人： CARL ZEISS MICROSCOPY GMBH
发明人： Jörg Siebenmorgen , Ralf Netz
IPC分类号： G02B21/08 , G02B21/16 , G02B27/42
CPC分类号： G02B21/08 , G02B21/16 , G02B27/425 , G02B27/4294
摘要： An illumination apparatus for illuminating a sample plane and a sample that is optionally arranged therein along an illumination beam path includes: a first light source (for outputting light of at least one first wavelength (λphoto), a second light source for outputting light of at least one second wavelength (λexc), and a diffraction grating in the illumination beam path between the first and second light sources and the sample plane. Light of the first wavelength (λphoto) is not diffracted by the diffraction grating, and light of the second wavelength (λexc) is diffracted due to the effect of the diffraction grating. The illumination apparatus can be used in a microscope.

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