会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明申请
    • X-RAY APPARATUS AND X-RAY MEASUREMENT METHOD
    • X射线装置和X射线测量方法
    • US20150160141A1
    • 2015-06-11
    • US14407048
    • 2013-06-05
    • CANON KABUSHIKI KAISHA
    • Taihei MukaideYuto Niinuma
    • G01N23/04G21K1/10G21K1/04
    • G01N23/04G21K1/04G21K1/10G21K2207/005
    • The invention provides an X-ray apparatus and an X-ray measurement method that can increase sensitivity to a positional shift of an X-ray as compared with related art.An X-ray apparatus includes a splitting element configured to spatially split an X-ray from an X-ray generator and form an X-ray beam; a detector configured to detect an intensity of the X-ray beam, which has been split by the splitting element and has passed through a detection object, the detector including a plurality of pixels; and an absorbing element arranged at a boundary of two pixels from among the plurality of pixels included in the detector and configured to absorb part of the X-ray beam. The X-ray beam is configured to discretely irradiate the two pixels of the detector.
    • 本发明提供了一种与现有技术相比可提高对X射线位置偏移的灵敏度的X射线装置和X射线测量方法。 X射线设备包括分配元件,其被配置为从X射线发生器空间分割X射线并形成X射线束; 检测器,其被配置为检测由所述分离元件分离并已经通过检测对象的所述X射线束的强度,所述检测器包括多个像素; 以及吸收元件,其布置在包括在所述检测器中的所述多个像素中的两个像素的边界处,并且被配置为吸收所述X射线束的一部分。 X射线束被配置为离散地照射检测器的两个像素。