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1. 发明授权

US08153338B2 Apparatus and method for repairing photo mask 有权
标题翻译：修复光罩的装置及方法
公开(公告)号：US08153338B2
公开(公告)日：2012-04-10
申请号：US12805416
申请日：2010-07-29
申请人： Byong Chon Park , Sang Jung Ahn , Jin Ho Choi , Joon Lyou , Jae Wan Hong , Won Young Song , Ki Young Jung
发明人： Byong Chon Park , Sang Jung Ahn , Jin Ho Choi , Joon Lyou , Jae Wan Hong , Won Young Song , Ki Young Jung
IPC分类号： G03F1/00 , G06K9/00 , G21G5/00
CPC分类号： G03F1/72
摘要： An apparatus for repairing a photo mask, including a repairing atomic force microscope configured to repair a defective portion of the photo mask in a photo mask repair process, an electron microscope configured to navigate the repairing atomic electron microscope to the defective portion of the photo mask and to observe the photo mask repair process, and an imaging atomic microscope configured to image in-situ a shape of a repaired photo mask.
摘要翻译：一种用于修复光掩模的装置，包括修复原子力显微镜，其被配置为在光掩模修复过程中修复光掩模的缺陷部分，电子显微镜被配置为将修复原子电子显微镜导航到光掩模的缺陷部分并观察光掩模修复过程，以及成像原子显微镜，被配置为原位成像修复的光罩的形状。

2. 发明申请

US20110027698A1 Apparatus and method for repairing photo mask 有权
标题翻译：修复光罩的装置及方法
公开(公告)号：US20110027698A1
公开(公告)日：2011-02-03
申请号：US12805416
申请日：2010-07-29
申请人： Byong Chon Park , Sang Jung Ahn , Jin Ho Choi , Joon Lyou , Jae Wan Hong , Won Young Song , Ki-Young Jung
发明人： Byong Chon Park , Sang Jung Ahn , Jin Ho Choi , Joon Lyou , Jae Wan Hong , Won Young Song , Ki-Young Jung
IPC分类号： G03F1/00 , G06K9/00
CPC分类号： G03F1/72
摘要： An apparatus for repairing a photo mask, including a repairing atomic force microscope configured to repair a defective portion of the photo mask in a photo mask repair process, an electron microscope configured to navigate the repairing atomic electron microscope to the defective portion of the photo mask and to observe the photo mask repair process, and an imaging atomic microscope configured to image in-situ a shape of a repaired photo mask.
摘要翻译：一种用于修复光掩模的装置，包括修复原子力显微镜，其被配置为在光掩模修复过程中修复光掩模的缺陷部分，电子显微镜被配置为将修复原子电子显微镜导航到光掩模的缺陷部分并观察光掩模修复过程，以及成像原子显微镜，被配置为原位成像修复的光罩的形状。

3. 发明授权

US09009861B2 Substrate measurement apparatus with electron distortion unit 有权
标题翻译：具有电子失真单元的基板测量装置
公开(公告)号：US09009861B2
公开(公告)日：2015-04-14
申请号：US14128290
申请日：2011-06-24
申请人： Byong Chon Park , Ju Youb Lee , Woon Song , Jin Ho Choi , Sang Jung Ahn , Joon Lyou , Won Young Song , Jae Wan Hong , Seung Hun Baek
发明人： Byong Chon Park , Ju Youb Lee , Woon Song , Jin Ho Choi , Sang Jung Ahn , Joon Lyou , Won Young Song , Jae Wan Hong , Seung Hun Baek
IPC分类号： G01Q30/02 , B82Y35/00 , H01J37/28
CPC分类号： G01Q30/02 , B82Y35/00 , H01J37/28
摘要： Provided is a fusion measurement apparatus which increases or maximizes the reliability of a measurement. The fusion measurement apparatus includes an atomic microscope for measuring a surface of a substrate at an atomic level, an electron microscope for measuring the atomic microscope and the substrate, and at least one electrode which distorts the path of a secondary electron on the substrate covered by a cantilever of the atomic microscope so that the secondary electron proceeds to an electron detector of the electron microscope.
摘要翻译：提供了一种增加或最大化测量可靠性的融合测量装置。融合测量装置包括用于测量原子水平的基板的表面的原子显微镜，用于测量原子显微镜和基板的电子显微镜，以及至少一个电极，其使基板上覆盖的基板上的二次电子的路径变形原子显微镜的悬臂，使得二次电子进入电子显微镜的电子检测器。

4. 发明申请

US20140130212A1 FUSION MEASUREMENT APPARATUS 有权
标题翻译：熔断测量装置
公开(公告)号：US20140130212A1
公开(公告)日：2014-05-08
申请号：US14128290
申请日：2011-06-24
申请人： Byong Chon Park , Ju Youb Lee , Woon Song , Jin Ho Choi , Sang Jung Ahn , Joon Lyou , Won Young Song , Jae Wan Hong , Seung Hun Baek
发明人： Byong Chon Park , Ju Youb Lee , Woon Song , Jin Ho Choi , Sang Jung Ahn , Joon Lyou , Won Young Song , Jae Wan Hong , Seung Hun Baek
IPC分类号： G01Q30/02
CPC分类号： G01Q30/02 , B82Y35/00 , H01J37/28
摘要： Provided is a fusion measurement apparatus which increases or maximizes the reliability of a measurement. The fusion measurement apparatus includes an atomic microscope for measuring a surface of a substrate at an atomic level, an electron microscope for measuring the atomic microscope and the substrate, and at least one electrode which distorts the path of a secondary electron on the substrate covered by a cantilever of the atomic microscope so that the secondary electron proceeds to an electron detector of the electron microscope.
摘要翻译：提供了一种增加或最大化测量可靠性的融合测量装置。融合测量装置包括用于测量原子水平的基板的表面的原子显微镜，用于测量原子显微镜和基板的电子显微镜，以及至少一个电极，其使基板上覆盖的基板上的二次电子的路径变形原子显微镜的悬臂，使得二次电子进入电子显微镜的电子检测器。

5. 发明授权

US08196592B2 Hair brush for hot curling 有权
标题翻译：毛刷烫发
公开(公告)号：US08196592B2
公开(公告)日：2012-06-12
申请号：US12832969
申请日：2010-07-08
申请人： Jin Ho Choi
发明人： Jin Ho Choi
IPC分类号： A45D6/02 , A45D24/16
CPC分类号： A46B17/00 , A45D20/52 , A45D24/16 , A46B13/005 , A46B2200/104
摘要： A hair brush for hot curling includes a body, a closing cap, a connection member and a brush part. The body made of ceramic coated aluminum includes holes through which a steel teeth of the brush part protrudes. The closing cap engages with the body formed by assembling segmented portions. The connection member for connecting the segmented portions of the body includes a body part and an insertion groove to which the body is inserted. The brush part includes a handle part and a fastening part, a first end of which is connected to the handle part and a second end is engaged with one end of the assembled body. An iron core is formed by twisting two or more wires, one end of which is securely engaged within the fastening part, a plurality of the steel teeth being formed on the iron core in a circumferential direction thereof.
摘要翻译：用于热卷曲的毛刷包括主体，封闭盖，连接构件和刷部。由陶瓷涂层铝制成的主体包括刷部的钢齿突出的孔。封闭盖与通过组装分段部分形成的主体接合。用于连接主体的分段部分的连接构件包括主体部分和插入主体的插入槽。刷部分包括手柄部分和紧固部分，其第一端连接到手柄部分，并且第二端部与组装体的一端接合。铁芯通过将两根或多根线材扭曲而形成，其中一根线材牢固地接合在紧固部件内，多个钢齿沿铁芯沿圆周方向形成。

6. 发明申请

US20110203021A1 SPM NANOPROBES AND THE PREPARATION METHOD THEREOF 审中-公开
标题翻译： SPM纳米微粒及其制备方法
公开(公告)号：US20110203021A1
公开(公告)日：2011-08-18
申请号：US13122682
申请日：2009-07-31
申请人： Sang Jung An , Buong Chon Park , Yung-ho Kahng , Jin Ho Choi , Kwang Hoon Jeong
发明人： Sang Jung An , Buong Chon Park , Yung-ho Kahng , Jin Ho Choi , Kwang Hoon Jeong
IPC分类号： G01Q70/12 , G01Q70/16 , B82Y99/00 , B82Y15/00
CPC分类号： G01Q70/12
摘要： The present invention relates to SPM nanoprobes and the preparation method thereof, more particularly, to SPM nanoprobes comprising a spheroid deposit capped-nanoneedle bonded to one end of a mother tip, wherein the spheroid deposit is formed by particle beam induced deposition and is characterized in that the ratio of the diameter of the spheroid deposit to that of the nanoneedle is in the range of 1.5 to 8.5. The SPM nanoprobe according to the present invention is capable of imaging or measuring an irregularly curved or complicated surface, pattern and/or a frictional or adhesive force thereof and controlling size of a spheroid deposit formed at the end portion of nanoneedle and the ratio of the diameter of the spheroid deposit to that of the nanoneedle arbitrarily.
摘要翻译：本发明涉及SPM纳米探针及其制备方法，更具体地说，涉及一种SPM纳米探针，其包含与母体尖端的一端结合的球状体沉积物封端的纳米针，其中，球状体沉积物是通过粒子束诱导沉积形成的，其特征在于球状体沉积物的直径与纳米针的直径的比率在1.5至8.5的范围内。根据本发明的SPM纳米探针能够成像或测量不规则弯曲或复杂的表面，图案和/或其摩擦或粘合力，并且控制在纳米针的端部处形成的球体沉积物的尺寸和球状物的直径任意地沉积到纳米针的直径。

7. 发明授权

US07229519B2 Burning equipment for green sheet of plasma display panel and method of burning the same 失效
标题翻译：等离子显示面板绿板燃烧设备及其燃烧方法
公开(公告)号：US07229519B2
公开(公告)日：2007-06-12
申请号：US11050825
申请日：2005-01-27
申请人： Sang Jin Kong , Jin Ho Choi
发明人： Sang Jin Kong , Jin Ho Choi
IPC分类号： B32B37/06 , B32B37/08
CPC分类号： B32B37/0007 , B32B37/06 , B32B2038/168 , B32B2305/77 , Y10T156/1744
摘要： An apparatus for burning green sheets of a plasma display panel comprises a feeding part that feeds a green sheet to a plasma display panel substrate, a heat and pressure roller that heats and compresses the green sheet and the plasma display panel substrate from above the plasma display panel substrate, and a heating module that applies heat to a contact portion between the green sheet and the plasma display panel substrate. The heat and pressure roller applies heat and pressure to the green sheet to bring the green sheet into intimate contact with the plasma display panel substrate and to remove residual solvent from the green sheet.
摘要翻译：用于燃烧等离子体显示面板的生片的装置包括将生片供给到等离子体显示面板基板的供给部，从等离子体显示器的上方对生片和等离子体显示面板基板进行加热压缩的热压辊面板基板和对生片和等离子体显示面板基板之间的接触部分施加热量的加热模块。热压辊向生片施加热和压力，使生片与等离子体显示面板基板紧密接触，并从生片中除去残留的溶剂。

8. 发明授权

US06380892B1 Adaptive beamforming method in an IMT-2000 system 有权
标题翻译： IMT-2000系统中的自适应波束成形方法
公开(公告)号：US06380892B1
公开(公告)日：2002-04-30
申请号：US09540986
申请日：2000-03-31
申请人： Jin Ho Choi , Hee Gul Park , Yoon Oh Yang
发明人： Jin Ho Choi , Hee Gul Park , Yoon Oh Yang
IPC分类号： H01Q324
CPC分类号： H01Q3/2605
摘要： An adaptive beamforming apparatus and method of an array antenna in a communication system. First, a tentative symbol decision value is obtained by processing a traffic signal vector, and a final updated coefficient value is obtained by performing a least mean square (LMS) algorithm at least once with respect to the tentative symbol decision value and a pilot signal vector on the assumption that the tentative symbol decision value is a transmitted symbol value. Then an adaptive beam which corresponds to a final symbol decision value is formed using the traffic signal vector and the final updated coefficient value.
摘要翻译：一种通信系统中的阵列天线的自适应波束成形装置和方法。首先，通过处理交通信号矢量获得暂定符号判定值，并且通过相对于暂定符号判定值至少一次执行最小均方（LMS）算法和导频信号矢量来获得最终更新系数值假设假定符号判定值是发送符号值。然后使用交通信号矢量和最终更新的系数值形成对应于最终符号判定值的自适应波束。

9. 发明授权

US07696727B2 Apparatus and method for measuring the amount of the current in battery cells using a plurality of sensing resistors 有权
标题翻译：使用多个感测电阻器测量电池单元中的电流量的装置和方法
公开(公告)号：US07696727B2
公开(公告)日：2010-04-13
申请号：US11394907
申请日：2006-03-31
申请人： Jin Ho Choi
发明人： Jin Ho Choi
IPC分类号： H02J7/16 , H02J7/00
CPC分类号： G01R15/002 , G01R1/203 , G01R19/16542 , G01R31/3606 , G01R31/3631
摘要： Disclosed is an apparatus for measuring an amount of current in battery cells. The apparatus includes: a plurality of resistors (R1, R2, and R3) connected in parallel; a main chip connected to both ends of one (R1) of the plurality of resistors, detecting voltage across the connected resistor, and adding up the amount of current on the basis of the detected voltage; a multiplexer selecting one of the other resistors (R2 and R3) when the amount of current added up at the main chip exceeds a predetermined threshold value; and a plurality of switches connected to the plurality of resistors respectively, and switched on/off by an output signal of the multiplexer. Thereby, it is possible to prevent damage to the surrounding components caused by the generation of heat from the single detection resistor, and detect a more precise amount of current in the battery cells.
摘要翻译：公开了一种用于测量电池单元中的电流量的装置。该装置包括：并联连接的多个电阻器（R1，R2和R3）; 连接到所述多个电阻器中的一个（R1）的两端的主芯片，检测所连接的电阻器两端的电压，并根据检测到的电压相加电流量; 当在主芯片上相加的电流量超过预定阈值时，多路复用器选择其它电阻器（R2和R3）之一; 以及分别连接到多个电阻器的多个开关，并由多路复用器的输出信号接通/断开。因此，可以防止由于单个检测电阻器产生的热量而导致的周围部件的损坏，并且能够检测电池单元中更精确的电流量。

10. 发明申请

US20090046083A1 Digital-to-Analog Converter for display device 有权
标题翻译：用于显示设备的数模转换器
公开(公告)号：US20090046083A1
公开(公告)日：2009-02-19
申请号：US12222379
申请日：2008-08-07
申请人： Sang Suk Kim , Jin Ho Choi
发明人： Sang Suk Kim , Jin Ho Choi
IPC分类号： G06F3/038
CPC分类号： G09G3/20 , G09G2330/028
摘要： A digital-to-analog converter (DAC) for a display device is provided. The DAC includes an amplifier and a current decoder. The amplifier receives a gradation voltage with respect to upper bits in data of k bits through a non-inverting input terminal, and varies the input gradation voltage according to a voltage applied to an inverting input terminal. The current decoder allows a predetermined constant current to flow therethrough according to input data of lower bits, which do not include the upper bits, to thereby vary the voltage applied to the inverting input terminal. The current decoder further adjusts the gradation voltage outputted by the amplifier according to the varied voltage.
摘要翻译：提供了一种用于显示设备的数模转换器（DAC）。 DAC包括放大器和电流解码器。放大器通过非反相输入端子接收关于k位数据中的高位的灰度电压，并且根据施加到反相输入端子的电压来改变输入灰度电压。当前的解码器允许预定的恒定电流根据不包括高位的较低位的输入数据流过，从而改变施加到反相输入端的电压。电流解码器还根据变化的电压进一步调节放大器输出的灰度电压。

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