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    • 1. 发明授权
    • Meter and method for in situ measurement of the electromagnetic
properties of various process materials using cutoff frequency
characterization and analysis
    • 使用截止频率表征和分析来原位测量各种工艺材料的电磁特性的仪表和方法
    • US5331284A
    • 1994-07-19
    • US871339
    • 1992-04-21
    • Buford R. JeanGary L. WarrenF. Lynn Whitehead
    • Buford R. JeanGary L. WarrenF. Lynn Whitehead
    • G01N22/04G01R27/04
    • G01N22/04
    • An apparatus and method for the measurement of, for example, the moisture in a material or, more generally, for the measurement of any material parameter which may be inferred by measuring the electromagnetic properties of the material under investigation. The meter apparatus comprises a controllable source of electromagnetic energy having stable selectable frequency. The controllable source of electromagnetic energy is coupled to a material measurement chamber by means of probes, loops, antennas, apertures or other structures so as to establish an electromagnetic field inside the measurement chamber thereby causing the field to interact with the material contained in the chamber. The method includes passing the process material through a frequency sensitive measurement cell. Exposing the process material to electromagnetic energy produced by a multi-frequency source. Generating an output signal having a distinctive frequency response characteristic. Detecting and amplifying an output signal by a receiving means and converting the signal to a digital representation. Analyzing the digital representation of the signal by the computer to determine the cutoff frequency. Determining the sharpness of the cutoff characteristic by mathematical algorithms in the computer. From the measured cutoff frequency and the sharpness of the cutoff characteristic, determining the dielectric constant and the conductivity of the material. Using stored calibration data or equations in the computer, computing and displaying the desired material property, e.g., the material's moisture content. And further, using the passband attenuation to determine the density of the material.
    • 用于测量材料中的水分的装置和方法,或更一般地,用于测量任何材料参数的装置和方法,其可以通过测量所研究的材料的电磁特性来推断。 仪表装置包括具有稳定可选择频率的可控电磁能源。 电磁能的可控电源通过探头,环路,天线,孔或其他结构耦合到材料测量室,以便在测量室内建立电磁场,从而使场与包含在腔室中的材料相互作用 。 该方法包括使过程材料通过频敏测量单元。 将处理材料暴露于由多频源产生的电磁能。 产生具有独特频率响应特性的输出信号。 通过接收装置检测和放大输出信号,并将信号转换成数字表示。 通过计算机分析信号的数字表示,以确定截止频率。 通过计算机中的数学算法确定截止特性的清晰度。 从测量的截止频率和截止特性的清晰度,确定材料的介电常数和电导率。 使用计算机中存储的校准数据或等式,计算和显示所需的材料性质,例如材料的水分含量。 此外,使用通带衰减来确定材料的密度。
    • 2. 发明授权
    • Meter and method for in situ measurement of the electromagnetic
properties of various process materials using cutoff frequency
characterization and analysis
    • 使用截止频率表征和分析来原位测量各种工艺材料的电磁特性的仪表和方法
    • US5455516A
    • 1995-10-03
    • US45854
    • 1993-04-09
    • Buford R. JeanGary L. WarrenF. Lynn Whitehead
    • Buford R. JeanGary L. WarrenF. Lynn Whitehead
    • G01R27/02G01N22/00G01N22/04G01R27/26G01R27/04
    • G01N22/04
    • The present invention provides an apparatus and method for the measurement of, for example, the moisture in a material or, more generally, for the measurement of any material parameter which may be inferred by measuring the electromagnetic properties of the material under investigation. The electromagnetic properties of use in the present invention are complex electrical permittivity or the magnetic permeability of the material. The meter apparatus of the present invention comprises a controllable source of electromagnetic energy having stable selectable frequency. The controllable source of electromagnetic energy is coupled to a material measurement chamber by means of probes, loops, antennas, apertures or other structures so as to establish an electromagnetic wave inside the measurement chamber thereby causing the wave to interact with the material contained in the chamber. Its preferred structure comprises coupling of microwave energy from a coaxial transmission line to the measurement chamber over a multi-octave bandwidth via an intermediate microstrip to slotline coupling circuit.
    • 本发明提供了用于测量材料中的水分的装置和方法,或者更一般地,用于测量可以通过测量所研究的材料的电磁特性来推断的任何材料参数。 本发明中使用的电磁特性是复合的介电常数或材料的磁导率。 本发明的仪表装置包括具有稳定可选择频率的可控电磁能源。 可控电磁能源通过探头,环,天线,孔或其他结构耦合到材料测量室,以便在测量室内建立电磁波,从而使波与包含在腔室中的材料相互作用 。 其优选结构包括通过中间微带至槽线耦合电路将来自同轴传输线的微波能量通过多倍频程带宽耦合到测量室。
    • 6. 发明授权
    • Sensor and method for ullage level and flow detection
    • 传感器和方法用于空载水位和流量检测
    • US4833918A
    • 1989-05-30
    • US95848
    • 1987-09-14
    • Buford R. JeanRichard W. NewtonGary L. WarrenBilly V. Clark
    • Buford R. JeanRichard W. NewtonGary L. WarrenBilly V. Clark
    • G01F23/284G01P5/00G01P13/00G01S13/04
    • G01F23/2845G01F23/284G01P13/00G01P5/00G01S13/04
    • A device is provided for detecting the ullage level and flow in a vessel by detecting the presence of a solid or liquid material in proximity to a microwave detector. The device may be mounted to the side of the vessel or suspended inside the vessel so as to bring the microwave sensor into proximity with the surface of the contents of the vessel. A microwave bridge circuit may be used to detect a change in either the amplitude or phase of a signal reflected by the material within the vessel compared to a reference signal tuned to either the presence or absence of the anticipated solid or liquid material. In one embodiment, the reflected material signal is compared to the signal from a sample chamber containing the material to be detected. The device can reliably detect the level of multiple interfaces for various materials having distinct electric or magnetic properties.
    • 提供了一种用于通过检测在微波检测器附近的固体或液体材料的存在来检测容器中的空白水平和流动的装置。 该装置可以安装在容器的侧面或悬挂在容器内,以使微波传感器与容器内容物的表面接近。 可以使用微波桥电路来检测与调节到预期固体或液体材料的存在或不存在的参考信号相反的由容器内的材料反射的信号的幅度或相位的变化。 在一个实施例中,将反射材料信号与来自包含待检测材料的样品室的信号进行比较。 该装置可以可靠地检测具有不同电或磁特性的各种材料的多个界面的水平。
    • 8. 发明授权
    • Microwave process seal
    • 微波加工密封
    • US5262743A
    • 1993-11-16
    • US820308
    • 1992-01-08
    • Buford R. Jean
    • Buford R. Jean
    • G01F23/284H01P1/08
    • G01F23/284H01P1/08
    • A microwave process seal and method is provided for use, for example, in the detection of ullage level and flow in a vessel or conduit by detecting the presence of a solid or liquid material in proximity to a microwave detector. Particularly, a horn design is provided in conjunction with, the microwave process seal of the present invention which fits in the mouth of the horn. The microwave process seal is kept as thin as possible to meet pressure requirements. The surface of the seal is oriented at or near the Brewster angle. The Brewster angle is that angle for which there is total transmission across a dielectric boundary for energy that strikes the boundary with a linear polarization.
    • 提供微波加工密封件和方法,例如用于通过检测在微波检测器附近的固体或液体材料的存在来检测容器或管道中的空白水平和流动。 特别地,与本发明的微波加工密封件结合配合喇叭口的喇叭设计。 微波加工密封保持尽可能薄以满足压力要求。 密封件的表面定位在布鲁斯特角度或接近布鲁斯特角。 布鲁斯特角是指通过电介质边界进行总传输的角度,该角度以线性极化作用于边界的能量。
    • 9. 发明授权
    • Microwave process seal and method
    • 微波加工密封和方法
    • US5115218A
    • 1992-05-19
    • US667589
    • 1991-03-11
    • Buford R. Jean
    • Buford R. Jean
    • G01F23/284H01P1/08
    • G01F23/284H01P1/08
    • A microwave process seal and method is provided for use, for example, in the detection of ullage level and flow in a vessel or conduit by detecting the presence of a solid or liquid material in proximity to a microwave detector. Particularly, a horn design is provided in conjunction with, the microwave process seal of the present invention which fits in the mouth of the horn. The microwave process seal is kept as thin as possible to meet pressure requirements. The surface of the seal is oriented at or near the Brewster angle. The Brewster angle is that angle for which there is total transmission across a dielectric boundary for energy that strikes the boundary with a linear polarization.
    • 提供微波加工密封件和方法,例如用于通过检测在微波检测器附近的固体或液体材料的存在来检测容器或管道中的空白水平和流动。 特别地,与本发明的微波加工密封件结合配合喇叭口的喇叭设计。 微波加工密封保持尽可能薄以满足压力要求。 密封件的表面定位在布鲁斯特角度或接近布鲁斯特角。 布鲁斯特角是指通过电介质边界进行总传输的角度,该角度以线性极化作用于边界的能量。