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1. 发明申请

US20130107128A1 TELEVISION TUNER MODULE AND BROADCAST RECEIVING APPARATUS HAVING THE SAME 有权
标题翻译：电视调谐器模块和广播接收装置
公开(公告)号：US20130107128A1
公开(公告)日：2013-05-02
申请号：US13448896
申请日：2012-04-17
申请人： Bright SEO , Hyun-jun KIM , Sung-soo LEE
发明人： Bright SEO , Hyun-jun KIM , Sung-soo LEE
IPC分类号： H04N5/50
CPC分类号： H04N5/455 , H04N5/64
摘要： A television tuner module includes a tuner that is configured to receive a television broadcast signal; a first shield member that surrounds the tuner and a second shield member that surrounds the first shield member.
摘要翻译：电视调谐器模块包括被配置为接收电视广播信号的调谐器; 围绕调谐器的第一屏蔽构件和围绕第一屏蔽构件的第二屏蔽构件。

2. 发明申请

US20070108899A1 DISPLAY DEVICE AND FABRICATING METHOD THEREOF 有权
标题翻译：显示装置及其制作方法
公开(公告)号：US20070108899A1
公开(公告)日：2007-05-17
申请号：US11560153
申请日：2006-11-15
申请人： Jae-hoon JUNG , Sung-soo LEE , Ji-hye CHOI
发明人： Jae-hoon JUNG , Sung-soo LEE , Ji-hye CHOI
IPC分类号： H05B33/00
CPC分类号： H01L51/5203 , H01L27/322 , H01L27/3276 , H01L51/5284 , H01L2251/5315
摘要： A display device includes a thin film transistor formed on a first insulating substrate, a first electrode electrically connected with the thin film transistor, an emission layer formed on the first electrode, a second electrode formed on the emission layer, an auxiliary electrode shaped like a mesh to at least partially expose the first electrode, the auxiliary electrode being electrically connected with the second electrode and receiving a common voltage therefrom, and a second insulating substrate placed on the auxiliary electrode. The exemplary embodiments of a display device, and a method of manufacturing the same, according to the present invention can apply a common voltage efficiently throughout the display and have an improved contrast ratio.
摘要翻译：显示装置包括形成在第一绝缘基板上的薄膜晶体管，与薄膜晶体管电连接的第一电极，形成在第一电极上的发射层，形成在发射层上的第二电极，形状类似于筛网以至少部分地暴露第一电极，辅助电极与第二电极电连接并从其接收公共电压，以及放置在辅助电极上的第二绝缘基板。根据本发明的显示装置的示例性实施例及其制造方法可以在整个显示器上有效地施加公共电压并且具有改善的对比度。

3. 发明申请

US20080079456A1 TEST HANDLER FOR TESTING SEMICONDUCTOR DEVICE AND METHOD OF TESTING SEMICONDUCTOR DEVICE USING THE SAME 审中-公开
标题翻译：用于测试半导体器件的测试操作器和使用其测试半导体器件的方法
公开(公告)号：US20080079456A1
公开(公告)日：2008-04-03
申请号：US11778160
申请日：2007-07-16
申请人： Sung-soo LEE
发明人： Sung-soo LEE
IPC分类号： G01R31/26
CPC分类号： G01R31/2893 , G01R31/2862 , G01R31/2865
摘要： Provided is a test handler for testing a semiconductor device mounted in a test tray with a test head disposed separately below the test tray under predetermined testing condition at high or low temperature. The test handler includes a thermal isolator to maintain constant the predetermined testing condition at high or low temperature when the test chamber and the test head are separated. The thermal isolator is a shutter that is installed below the test chamber to seal or open the test chamber.
摘要翻译：提供了一种用于测试安装在测试托盘中的半导体器件的测试处理器，其中测试头在高温或低温下的预定测试条件下分开设置在测试托盘下方。测试处理器包括热隔离器，以在测试室和测试头分离时在高或低温下保持恒定的预定测试条件。热隔离器是安装在测试室下面以将密封或打开测试室的快门。

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