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    • 4. 发明申请
    • Device manufacturing process utilizing a double patterning process
    • 利用双重图案化工艺的器件制造工艺
    • US20080199814A1
    • 2008-08-21
    • US11999104
    • 2007-12-04
    • Dave BrzozowyThomas R. SarubbiSanjay MalikGregory Spaziano
    • Dave BrzozowyThomas R. SarubbiSanjay MalikGregory Spaziano
    • H01L21/00
    • G03F7/0035G03F7/095
    • Manufacturing semiconductor device by steps of: a) providing substrate with antireflective coating or underlayer, b) applying first photosensitive composition over substrate, c) exposing first composition to radiation to produce first pattern, d) developing exposed first composition to produce an imaged bilayer stack, e) rinsing the stack, f) applying fixer to the stack, g) applying optional bake, h) rinsing the stack, i) applying second optional bake, j) applying second photosensitive composition onto the stack to produce multilayer stack, k) exposing second composition to produce second pattern offset from first pattern, l) developing exposed second composition to produce multilayer stack, and m) rinsing multilayer stack; the photosensitive compositions have photoacid generator and substantially aqueous base insoluble polymer whose solubility increases upon treatment with acid and further comprises an anchor group, and the fixer is a polyfunctional compound reactive with anchor group, but does not contain silicon and the substrate stays within a lithographic cell from at least first coating step until at least after final exposure.
    • 通过以下步骤制造半导体器件:a)向衬底提供抗反射涂层或底层,b)在衬底上施加第一感光组合物,c)将第一组合物暴露于辐射以产生第一图案,d)显影暴露的第一组合物以产生成像双层叠层 e)冲洗堆叠,f)将定影剂施加到堆叠,g)施加任选的烘烤,h)冲洗该堆叠,i)施加第二可选烘烤,j)将第二光敏组合物施加到堆叠上以产生多层堆叠,k) 暴露第二组合物以产生从第一图案偏移的第二图案,l)显影暴露的第二组合物以产生多层堆叠,以及m)漂洗多层堆叠; 光敏组合物具有光酸产生剂和基本上不溶于碱的水溶性聚合物,其在用酸处理时溶解度增加,并且还包含锚定基团,并且定影剂是与锚定基团反应但不含硅的多官能化合物,并且底物保留在光刻 至少在第一次涂覆步骤至少在最终曝光后。