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2. 发明授权

US06724594B2 Over voltage protection test multiplexer and methods of operating the same 有权
标题翻译：过电压保护测试多路复用器及其操作方法
公开(公告)号：US06724594B2
公开(公告)日：2004-04-20
申请号：US09742037
申请日：2000-12-20
申请人： Laurence D. Lewicki , Manoj N. Rana , Arlo Aude
发明人： Laurence D. Lewicki , Manoj N. Rana , Arlo Aude
IPC分类号： H02H320
CPC分类号： G01R31/318572 , H02H9/048
摘要： There is disclosed a test multiplexer having over voltage protection for use in integrated circuitry, along with methods of operating the same. An exemplary test multiplexer according to one embodiment of the present invention includes a plurality of MOSFET devices and over voltage protection circuitry. The plurality of MOSFET devices, including both p-type and n-type MOSFET devices, cooperate to pass an input signal to an output signal line of the test multiplexer while the test multiplexer is enabled. The over voltage protection circuitry is biased so that a difference between the input signal voltage and a bias voltage does not exceed breakdown when the test multiplexer is disabled. An important aspect hereof is that the test multiplexer is compliant to input voltages that exceed the positive supply rail, and is capable of sustaining a high or otherwise out of threshold single ended voltage at the input without latching up.
摘要翻译：公开了一种具有用于集成电路中的过电压保护的测试多路复用器及其操作方法。根据本发明的一个实施例的示例性测试多路复用器包括多个MOSFET器件和过电压保护电路。包括p型和n型MOSFET器件的多个MOSFET器件在测试复用器被使能的同时，将输入信号传送到测试多路复用器的输出信号线。过电压保护电路被偏置，使得当测试复用器被禁用时，输入信号电压和偏置电压之间的差异不会超过击穿。这里的一个重要方面是测试多路复用器符合超过正电源轨的输入电压，并且能够在输入端保持高电平或以其他方式超出阈值单端电压而不锁存。

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