专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US06609077B1 ATE timing measurement unit and method 有权
标题翻译： ATE定时测量单元和方法
公开(公告)号：US06609077B1
公开(公告)日：2003-08-19
申请号：US09584636
申请日：2000-05-31
申请人： Benjamin Brown , Erik V. Hultine , John Robert Pane , Andrew Damian Firth , Chiyi Jin , Binwei Yang
发明人： Benjamin Brown , Erik V. Hultine , John Robert Pane , Andrew Damian Firth , Chiyi Jin , Binwei Yang
IPC分类号： G01R2728
CPC分类号： G01R31/31937
摘要： Automatic test equipment is disclosed for testing a semiconductor device and including a computer workstation and pin electronics circuitry coupled between the semiconductor device and the computer. The pin electronics circuitry includes a plurality of channels, each channel having timing circuitry operative in response to desired programmed timing information, driver/comparator circuitry coupled to the timing circuitry for driving test waveforms at a period T, and sampling data from the waveforms at a beat period T +/−&Dgr;t, and a timing measurement unit. The timing measurement unit is coupled to the driver/comparator circuitry for measuring the relative timings of the sampled data. The plurality of channels cooperate to produce substantially real-time timing measurement data in parallel.
摘要翻译：公开了用于测试半导体器件并且包括耦合在半导体器件和计算机之间的计算机工作站和引脚电子电路的自动测试设备。引脚电子电路包括多个通道，每个通道具有响应于期望的编程定时信息而工作的定时电路，耦合到用于在时间段T驱动测试波形的定时电路的驱动器/比较器电路，以及来自波形的采样数据拍摄时段T +/- DELTAt，以及定时测量单位。定时测量单元耦合到驱动器/比较器电路，用于测量采样数据的相对定时。多个通道协作以并行产生基本上实时的定时测量数据。

IPRDB

热门服务

关于我们

友情链接

联系方式