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    • 4. 发明授权
    • Method for improving erase characteristics of buried bit line flash
EPROM devices without using sacrificial oxide growth and removal steps
    • 用于改善掩埋位线闪速EPROM器件的擦除特性的方法,而不使用牺牲氧化物生长和去除步骤
    • US5075245A
    • 1991-12-24
    • US642521
    • 1991-01-17
    • Been-Jon WooMark A. Holler
    • Been-Jon WooMark A. Holler
    • H01L21/32H01L21/336H01L21/8247
    • H01L27/11521H01L21/32H01L29/66825Y10S148/114
    • A process for fabricating contactless electrically programmable and electrically erasable memory cells of the flash EPROM type. The cells use elongated source and drain regions disposed beneath field oxide regions. Ammonia formed during the field oxidation process reacts with the silicon substrate to form a thin silicon nitride layer in the beak region. A thin tunnel oxide is then grown without the use of a sacrificial-oxide growth and removal method. During tunnel oxide formation lateral growth of the field oxide is inhibited by the thin nitride layer previously formed. However, the tunnel oxide thinning (due to the existence of the thin nitride layer) induced low breakdown voltage is overcome by the enhanced oxide growth in the beak due to the buried source/drain dopants. The tunnel oxide in the erase regon is therefore uniform and thin. The thin, uniform oxide in the tunnel region leads to improved erase characteristics.
    • 用于制造闪存EPROM类型的非接触式电可编程和电可擦除存储器单元的方法。 电池使用设置在场氧化物区域下方的细长的源极和漏极区域。 在场氧化过程中形成的氨与硅衬底反应,以在喙部区域形成薄的氮化硅层。 然后在不使用牺牲氧化物生长和去除方法的情况下生长薄的隧道氧化物。 在隧道氧化物形成期间,场氧化物的横向生长被预先形成的薄氮化物层抑制。 然而,隧道氧化物变薄(由于存在薄氮化物层)诱导的低击穿电压被由于埋入的源极/漏极掺杂剂引起的喙中增强的氧化物生长所克服。 因此,擦除离子中的隧道氧化物是均匀和薄的。 隧道区域中的薄均匀氧化物导致改善的擦除特性。
    • 5. 发明授权
    • Method for improving erase characteristics of buried bit line flash
EPROM devices by use of a thin nitride layer formed during field oxide
growth
    • 通过使用在场氧化物生长期间形成的薄氮化物层来改善掩埋位线闪速EPROM器件的擦除特性的方法
    • US5077230A
    • 1991-12-31
    • US563098
    • 1990-08-03
    • Been-Jon WooMark A. Holler
    • Been-Jon WooMark A. Holler
    • H01L21/32H01L21/336H01L21/8247
    • H01L27/11521H01L21/32H01L29/66825Y10S148/114
    • A process for fabricating contactless electrically programmable and electrically erasable memory cells of the flash EPROM type. The cells use elongated source and drain regions disposed beneath field oxide regions. Ammonia formed during the field oxidation process reacts with the silicon substrate to form a thin silicon nitride layer in the beak region. A thin tunnel oxide is then grown. During tunnel oxide formation lateral growth of the field oxide is inhibited by the thin nitride layer previously formed. However, the tunnel oxide thinning (due to the existence of the thin nitride layer) induced low breakdown voltage is overcome by the enhanced oxide growth in the beak due to the buried source/drain dopants. The tunnel oxide in the erase region is therefore uniform and thin. The thin, uniform oxide in the tunnel region leads to improved erase characteristics.
    • 用于制造闪存EPROM类型的非接触式电可编程和电可擦除存储器单元的方法。 电池使用设置在场氧化物区域下方的细长的源极和漏极区域。 在场氧化过程中形成的氨与硅衬底反应,以在喙部区域形成薄的氮化硅层。 然后生长薄的隧道氧化物。 在隧道氧化物形成期间,场氧化物的横向生长被预先形成的薄氮化物层抑制。 然而,隧道氧化物变薄(由于存在薄氮化物层)诱导的低击穿电压被由于埋入的源极/漏极掺杂剂引起的喙中增强的氧化物生长所克服。 因此,擦除区域中的隧道氧化物是均匀和薄的。 隧道区域中的薄均匀氧化物导致改善的擦除特性。
    • 6. 发明授权
    • Method of increasing the accuracy of an analog neural network and the
like
    • 提高模拟神经网络精度的方法等
    • US5146602A
    • 1992-09-08
    • US634033
    • 1990-12-26
    • Mark A. HollerSimon M. Tam
    • Mark A. HollerSimon M. Tam
    • G06F15/18G06G7/60G06N3/063G06N99/00G11C27/00H01L29/788
    • H01L29/7887G06N3/0635G11C27/005
    • A method for increasing the accuracy of an analog neural network which computers a sum-of-products between an input vector and a stored weight pattern is described. In one embodiment of the present invention, the method comprises initially training the network by programming the synapses with a certain weight pattern. The training may be carried out using any standard learning algorithm. Preferably, a back-propagation learning algorithm is employed.Next, network is baked at an elevated temperature to effectuate a change in the weight pattern previously programmed during initial training. This change results from a charge redistribution which occurs within each of the synapses of the network. After baking, the network is then retrained to compensate for the change resulting from the charge redistribution. The baking and retraining steps may be successively repeated to increase the accuracy of the neural network to any desired level.
    • 描述了一种用于增加计算输入向量和存储的权重模式之和的乘积的模拟神经网络的精度的方法。 在本发明的一个实施例中,该方法包括通过以某种权重模式编程突触来初始训练网络。 可以使用任何标准学习算法进行训练。 优选地,采用反向传播学习算法。 接下来,在升高的温度下烘烤网络,以实现在初始训练期间先前编程的重量模式的变化。 这种变化是由于网络每个突触中发生的电荷再分配产生的。 烘烤后,网络再次进行补充,以补偿由电荷重新分配引起的变化。 烘焙和再培训步骤可以连续重复,以将神经网络的精度提高到任何所需的水平。
    • 10. 发明授权
    • Four quadrant synapse cell employing single column summing line
    • 使用单列求和线的四象限突触细胞
    • US5028810A
    • 1991-07-02
    • US526070
    • 1990-05-18
    • Hernan A. CastroMark A. Holler
    • Hernan A. CastroMark A. Holler
    • G06N3/063G11C15/04
    • G11C15/046G06N3/063G06N3/0635
    • The present invention covers a synapse cell for providing a weighted connection between a differential input voltage and a single output summing line having an associated capacitance. The connection is made using one or more floating-gate transistors which provide both excitatory as well as inhibitory connections. As configured, each transistor's drain is coupled to an input line and its source is coupled to the output summing line. The floating-gate of the transistor is used for storing a charge which corresponds to the strength or weight of the neural connection. When a voltage pulse having a certain duration is applied to the control gate of the floating-gate transistor, a current is generated which acts to discharge the capacitance associated with the output summing line. The current is directly proportional to the charge stored on the floating-gate member and the duration of the input pulse.
    • 本发明涵盖用于在差分输入电压和具有相关电容的单输出求和线之间提供加权连接的突触电池。 使用一个或多个提供兴奋性和抑制性连接的浮栅晶体管进行连接。 如所配置的,每个晶体管的漏极耦合到输入线,并且其源极耦合到输出求和线。 晶体管的浮置栅极用于存储对应于神经连接的强度或重量的电荷。 当具有一定持续时间的电压脉冲被施加到浮栅晶体管的控制栅极时,产生用于放电与输出求和线相关的电容的电流。 电流与存储在浮栅器件上的电荷和输入脉冲的持续时间成正比。