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1. 发明授权

US09318508B2 Array substrate and method for producing the same, display 有权
标题翻译：阵列基板及其制造方法，显示
公开(公告)号：US09318508B2
公开(公告)日：2016-04-19
申请号：US14203948
申请日：2014-03-11
申请人： Hefei BOE Optoelectronics Technology Co., LTD. , BOE Technology Group Co., LTD.
发明人： Qingchao Meng , Kiyoung Kwon , Chengda Zhu , Baoquan Zhou
IPC分类号： H05K1/02 , H01L27/12 , G02F1/1368
CPC分类号： H01L27/124 , G02F1/1368
摘要： An array substrate, comprising: a substrate; a metal pattern formed on the substrate; an insulation layer formed on the metal pattern and formed with a via therein; and a transparent conductive pattern formed on the insulation layer and electrically connected to the metal pattern through the via, wherein the via has a cross section exhibiting an irregular geometry shape having a curved side edge.
摘要翻译：阵列基板，包括：基板; 形成在所述基板上的金属图案; 形成在金属图案上并在其中形成有通孔的绝缘层; 以及透明导电图案，其形成在所述绝缘层上并且通过所述通孔电连接到所述金属图案，其中所述通孔具有呈现具有弯曲侧边缘的不规则几何形状的横截面。

2. 发明申请

US20150000969A1 ARRAY SUBSTRATE AND METHOD FOR PRODUCING THE SAME, DISPLAY 有权
标题翻译：阵列基板及其制造方法，显示器
公开(公告)号：US20150000969A1
公开(公告)日：2015-01-01
申请号：US14203948
申请日：2014-03-11
申请人： BOE Technology Group Co., LTD. , Hefei BOE Optoelectronics Technology Co., LTD.
发明人： Qingchao Meng , Kiyoung Kwon , Chengda Zhu , Baoquan Zhou
IPC分类号： H05K1/02 , H05K3/10
CPC分类号： H01L27/124 , G02F1/1368
摘要： An array substrate, comprising: a substrate; a metal pattern formed on the substrate; an insulation layer formed on the metal pattern and formed with a via therein; and a transparent conductive pattern formed on the insulation layer and electrically connected to the metal pattern through the via, wherein the via has a cross section exhibiting an irregular geometry shape having a curved side edge.
摘要翻译：阵列基板，包括：基板; 形成在所述基板上的金属图案; 形成在金属图案上并在其中形成有通孔的绝缘层; 以及透明导电图案，其形成在所述绝缘层上并且通过所述通孔电连接到所述金属图案，其中所述通孔具有呈现具有弯曲侧边缘的不规则几何形状的横截面。

3. 发明申请

US20140167807A1 PROBE FRAME FOR ARRAY SUBSTRATE DETECTING APPARATUS AND DETECTING APPARATUS HAVING THE SAME 有权
标题翻译：用于阵列基板检测装置的探测框架及其检测装置
公开(公告)号：US20140167807A1
公开(公告)日：2014-06-19
申请号：US14105947
申请日：2013-12-13
申请人： Beijing BOE Display Technology Co., Ltd. , BOE Technology Group Co., Ltd.
发明人： Xing Ge , Zhen Wei , Chengda Zhu , Jian Sheng , Yuanyi Cai , Lixing Zhang , Qingsheng Li
IPC分类号： G01R1/073
CPC分类号： G09G3/006 , G01R31/2889 , G09G3/3611
摘要： The present invention discloses a probe frame for an array substrate detecting apparatus, the probe frame including a frame body and a signal distribution circuit board provided to the frame body, wherein the probe frame further includes: a circuit board provided to the frame body, the circuit board being provided with through holes, and the circuit board being provided therein with a plurality of signal transmission wires in a one to one correspondence with the through holes, one end of each signal transmission wire is inserted into its respective through hole and the other end thereof is electrically connected with an output end of the signal distribution circuit board; and a plurality of probes in a one to one correspondence with the through holes, wherein for each pair of the probe and the through hole, one end of the probe is inserted into the through hole so as to be electrically connected with the signal transmission wire within the through hole. Electrical connection between respective probes and the signal distribution circuit board are achieved through signal transmission wires in the circuit board, wiring on the probe frame is simple, and stability in signal connections between probes and the signal distribution circuit board can be improved. The present invention further provides an array substrate detecting apparatus including the above probe frame.
摘要翻译：本发明公开了一种用于阵列基板检测装置的探针架，所述探针框架包括框架体和设置在所述框体上的信号分配电路板，其中所述探针架还包括：电路板，设置在所述框体上，电路板设有通孔，电路板中设有多个与通孔一一对应的信号传输线，每个信号传输线的一端插入其各自的通孔中，而另一个其端部与信号分配电路板的输出端电连接; 以及与通孔一一对应的多个探针，其中对于每对探针和通孔，探针的一端插入到通孔中，以便与信号传输线电连接在通孔内。各个探头和信号分配电路板之间的电气连接通过电路板中的信号传输线实现，探头框架上的布线简单，可以提高探头与信号分配电路板之间的信号连接稳定性。本发明还提供一种包括上述探针架的阵列基板检测装置。

4. 发明授权

US09589489B2 Probe frame for array substrate detecting apparatus and detecting apparatus having the same 有权
标题翻译：用于阵列基板检测装置的探针框架和具有该探针框架的检测装置
公开(公告)号：US09589489B2
公开(公告)日：2017-03-07
申请号：US14105947
申请日：2013-12-13
申请人： BOE Technology Group Co., Ltd. , Beijing BOE Display Technology Co., Ltd.
发明人： Xing Ge , Zhen Wei , Chengda Zhu , Jian Sheng , Yuanyi Cai , Lixing Zhang , Qingsheng Li
IPC分类号： G01R31/00 , G09G3/00 , G01R31/28 , G09G3/36
CPC分类号： G09G3/006 , G01R31/2889 , G09G3/3611
摘要： The present invention discloses a probe frame for an array substrate detecting apparatus, the probe frame including a frame body and a signal distribution circuit board provided to the frame body, wherein the probe frame further includes: a circuit board provided to the frame body, the circuit board being provided with through holes, and the circuit board being provided therein with a plurality of signal transmission wires in a one to one correspondence with the through holes, one end of each signal transmission wire is inserted into its respective through hole and the other end thereof is electrically connected with an output end of the signal distribution circuit board; and a plurality of probes in a one to one correspondence with the through holes, wherein for each pair of the probe and the through hole, one end of the probe is inserted into the through hole so as to be electrically connected with the signal transmission wire within the through hole. Electrical connection between respective probes and the signal distribution circuit board are achieved through signal transmission wires in the circuit board, wiring on the probe frame is simple, and stability in signal connections between probes and the signal distribution circuit board can be improved. The present invention further provides an array substrate detecting apparatus including the above probe frame.
摘要翻译：本发明公开了一种用于阵列基板检测装置的探针架，所述探针框架包括框架体和设置在所述框体上的信号分配电路板，其中所述探针架还包括：电路板，设置在所述框体上，电路板设有通孔，电路板中设有多个与通孔一一对应的信号传输线，每个信号传输线的一端插入其各自的通孔中，而另一个其端部与信号分配电路板的输出端电连接; 以及与通孔一一对应的多个探针，其中对于每对探针和通孔，探针的一端插入到通孔中，以便与信号传输线电连接在通孔内。各个探头和信号分配电路板之间的电气连接通过电路板中的信号传输线实现，探头框架上的布线简单，可以提高探头与信号分配电路板之间信号连接的稳定性。本发明还提供一种包括上述探针架的阵列基板检测装置。

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