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1. 发明授权

US6095679A Method and apparatus for performing localized thermal analysis and sub-surface imaging by scanning thermal microscopy 失效
标题翻译：通过扫描热显微镜进行局部热分析和亚表面成像的方法和装置
公开(公告)号：US6095679A
公开(公告)日：2000-08-01
申请号：US837547
申请日：1997-04-21
申请人： Azzedine Hammiche , Hubert Murray Montagu Pollock , Michael Reading , Mo Song
发明人： Azzedine Hammiche , Hubert Murray Montagu Pollock , Michael Reading , Mo Song
IPC分类号： G01N25/20 , G01N25/48 , G01Q60/58 , G01N25/18
CPC分类号： G01Q60/58 , B82Y35/00 , G01N25/4833 , Y10S977/732 , Y10S977/849 , Y10S977/852 , Y10S977/86 , Y10S977/867 , Y10S977/869 , Y10S977/881 , Y10S977/957
摘要： A platinum/Rhodium resistance thermal probe is used as an active device which acts both as a highly localized heat source and as a detector to perform localized differential calorimetry, by thermally inducing and detecting events such as glass transitions, meltings, recystallizations and thermal decomposition within volumes of material estimated at a few .mu.m.sup.3. Furthermore, the probe is used to image variations in thermal conductivity and diffusivity, to perform depth profiling and sub-surface imaging. The maximum depth of the sample that is imaged is controlled by generating and detecting evanescent temperature waves in the sample.
摘要翻译：使用铂/铑电阻热探针作为主动装置，其作为高度局部化的热源和作为检测器来执行局部差示量热法，通过热诱导和检测诸如玻璃化转变，熔融，再结晶和热分解之类的事件材料量估计在几亩。此外，探头用于对导热系数和扩散系数的变化进行成像，以进行深度剖面和次表面成像。通过产生和检测样品中的ev逝温度波来控制成像样品的最大深度。

2. 发明授权

US06491425B1 Method and apparatus for performing localized thermal analysis and sub-surface imaging by scanning thermal microscopy 有权
标题翻译：通过扫描热显微镜进行局部热分析和亚表面成像的方法和装置
公开(公告)号：US06491425B1
公开(公告)日：2002-12-10
申请号：US09584396
申请日：2000-06-01
申请人： Azzedine Hammiche , Hubert Murray Montagu-Pollock , Michael Reading , Mo Song
发明人： Azzedine Hammiche , Hubert Murray Montagu-Pollock , Michael Reading , Mo Song
IPC分类号： G01H2520
CPC分类号： G01Q60/58 , G01N25/4833 , Y10S977/732 , Y10S977/849 , Y10S977/852 , Y10S977/86 , Y10S977/867 , Y10S977/869 , Y10S977/881 , Y10S977/957
摘要： A platinum/Rhodium resistance thermal probe is used as an active device which acts both as a highly localized heat source and as a detector to perform localized differential calorimetry, by thermally inducing and detecting events such as glass transitions, meltings, recystallizations and thermal decomposition within volumes of material estimated at a few &mgr;m3. Furthermore, the probe is used to image variations in thermal conductivity and diffusivity, to perform depth profiling and sub-surface imaging. The maximum depth of the sample that is imaged is controlled by generating and detecting evanescent temperature waves in the sample.
摘要翻译：使用铂/铑电阻热探针作为主动装置，其作为高度局部化的热源和作为检测器来执行局部差示量热法，通过热诱导和检测诸如玻璃化转变，熔融，再结晶和热分解之类的事件材料数量估计在几个3。此外，探头用于对导热系数和扩散系数的变化进行成像，以进行深度剖面和次表面成像。通过产生和检测样品中的ev逝温度波来控制成像样品的最大深度。

3. 发明授权

US06260997B1 Method and apparatus for high spatial resolution spectroscopic microscopy 有权
标题翻译：高分辨率光谱显微镜的方法和装置
公开(公告)号：US06260997B1
公开(公告)日：2001-07-17
申请号：US09178349
申请日：1998-10-23
申请人： Michael Claybourn , Azzedine Hammiche , Hubert Murray Montagu-Pollock , Michael Reading
发明人： Michael Claybourn , Azzedine Hammiche , Hubert Murray Montagu-Pollock , Michael Reading
IPC分类号： G01N2520
CPC分类号： G01N25/4833 , G01N3/60 , G01N2203/0286 , G01Q30/02 , G01Q60/58 , Y10S977/852 , Y10S977/867
摘要： A sample and a scanning probe microscope system are used as the detector for an infrared spectrometer to circumvent the diffraction limit of conventional infrared microscopy, and to provide spectroscopic images with a greatly improved spatial resolution, potentially as low as a few tens of nanometers. The beam from an infrared spectrometer is directed at the sample. The sample is heated to the extent that it absorbs infrared radiation. Thus the resulting temperature rise of an individual region depends upon the particular molecular species present, as well as the range of wavelengths of the infrared beam. These individual temperature differences are detected by a miniature thermal probe. The thermal probe is mounted in a scanning thermal microscope. The scanning thermal microscope is then operated used to produce multiple surface and sub-surface images of the sample, such that the image contrast corresponds to variations in either thermal diffusivity, surface topography or chemical composition.
摘要翻译：使用样品和扫描探针显微镜系统作为红外光谱仪的检测器以避免常规红外显微镜的衍射极限，并提供可能低至几十纳米的大大改善的空间分辨率的光谱图像。来自红外光谱仪的光束被引导到样品。将样品加热到其吸收红外辐射的程度。因此，单个区域的所得温度升高取决于存在的特定分子种类以及红外光束的波长范围。这些单独的温度差通过微型热探测器检测。热探头安装在扫描热显微镜中。然后扫描热显微镜用于产生样品的多个表面和亚表面图像，使得图像对比度对应于热扩散率，表面形貌或化学组成的变化。

4. 发明授权

US06200022B1 Method and apparatus for localized dynamic mechano-thermal analysis with scanning probe microscopy 有权
标题翻译：用扫描探针显微镜进行局部动态力学热分析的方法和装置
公开(公告)号：US06200022B1
公开(公告)日：2001-03-13
申请号：US09224600
申请日：1998-12-31
申请人： Azzedine Hammiche , Hubert Murray Montague-Pollock , Michael Reading
发明人： Azzedine Hammiche , Hubert Murray Montague-Pollock , Michael Reading
IPC分类号： G01N2520
CPC分类号： G01Q60/58 , A61B18/149 , A61B2018/00589 , A61B2018/00601 , A61B2018/00607 , G01N3/60 , G01N25/4833 , G01N25/72 , G01N2203/0051 , G01N2203/0286 , Y10S977/849 , Y10S977/852 , Y10S977/86 , Y10S977/867 , Y10S977/881
摘要： A system and method for performing localized mechanothermal analysis with scanning probe microscopy (“MASM”) is disclosed. In a preferred embodiment an image of the surface or subsurface of a sample is created. A localized region of the sample is selected from the image. Using a scanning microscope, an active or passive thermal probe is positioned at the selected region. A temperature ramp is applied to the localized region. In addition, a dynamic or modulated stress or strain is applied to the localized region. Force data resulting from the applied temperature and stress or strain is collected and processed to produce a graph or fingerprint of the dynamic mechanical and/or calorimetric properties of the selected localized region.
摘要翻译：公开了一种使用扫描探针显微镜（“MASM”）进行局部机械温度分析的系统和方法。在优选实施例中，产生样品的表面或次表面的图像。从图像中选择样本的局部区域。使用扫描显微镜，主动或被动热探针位于所选区域。温度斜坡应用于局部区域。此外，动态或调制的应力或应变施加到局部区域。收集并处理由施加的温度和应力或应变产生的力数据，以产生所选择的局部区域的动态机械和/或量热特性的图表或指纹图。

5. 发明授权

US07665889B2 Quantitative calorimetry signal for sub-micron scale thermal analysis 有权
标题翻译：亚微米级热分析的定量量热信号
公开(公告)号：US07665889B2
公开(公告)日：2010-02-23
申请号：US11801254
申请日：2007-05-08
申请人： Kevin Kjoller , Azzedine Hammiche
发明人： Kevin Kjoller , Azzedine Hammiche
IPC分类号： G01K17/00
CPC分类号： G01Q60/58
摘要： The invention is a system and method for producing highly localized calorimetry data on a sample surface. The system is based on an SPM or other system with a probe and fine positioning capability. A heated probe is used to take a small sample (nano-sample) of a surface, and thereby make calorimetry measurements in a controlled manner.
摘要翻译：本发明是用于在样品表面上产生高度局部化的量热数据的系统和方法。该系统基于具有探头和精细定位能力的SPM或其他系统。使用加热的探针来取出表面的小样品（纳米样品），从而以受控的方式进行量热测量。

6. 发明申请

US20070263696A1 Quantitative calorimetry signal for sub-micron scale thermal analysis 有权
标题翻译：亚微米级热分析的定量量热信号
公开(公告)号：US20070263696A1
公开(公告)日：2007-11-15
申请号：US11801254
申请日：2007-05-08
申请人： Kevin Kjoller , Azzedine Hammiche
发明人： Kevin Kjoller , Azzedine Hammiche
IPC分类号： G01K17/00
CPC分类号： G01Q60/58
摘要： The invention is a system and method for producing highly localized calorimetry data on a sample surface. The system is based on an SPM or other system with a probe and fine positioning capability. A heated probe is used to take a small sample (nano-sample) of a surface, and thereby make calorimetry measurements in a controlled manner.
摘要翻译：本发明是用于在样品表面上产生高度局部化的量热数据的系统和方法。该系统基于具有探头和精细定位能力的SPM或其他系统。使用加热的探针来取出表面的小样品（纳米样品），从而以受控的方式进行量热测量。

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