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    • 1. 发明申请
    • Electrical device measurement probes
    • 电气设备测量探头
    • US20070171958A1
    • 2007-07-26
    • US11337641
    • 2006-01-23
    • Anh HoangTerry Stapleton
    • Anh HoangTerry Stapleton
    • G01J5/00G01K11/00
    • G01K11/3213G01J1/58G01J5/0037G01J5/029G01J5/041G01J5/042G01J5/045G01J5/046G01J5/048G01J5/08G01J5/0821G01J5/0896G01R31/027
    • A probe for use within a high voltage and high current electrical device is disclosed. The probe comprises an optical fiber, a substrate having a slot, and a photoluminescent material. The fiber has a first and second end and is configured to convey an activation light from the first to second end. A portion of the fiber is within the slot such that the slot receives the second end of the fiber. Emission of the photoluminescent material, as a function of temperature, is known. The photoluminescent material is disposed within at least a portion of the slot that faces the second end of the fiber so that they are in optical communication with each other. A change in intensity of a luminescent light emitted back into the fiber by the photoluminescent material when the activation light is conveyed by the fiber onto the photoluminescent material provides an indication of the integrity of the electrical device.
    • 公开了一种在高压和高电流电气装置内使用的探针。 探针包括光纤,具有狭缝的基底和光致发光材料。 光纤具有第一端和第二端,并且被配置为将激活光从第一端传送到第二端。 纤维的一部分在槽内,使得狭槽接收纤维的第二端。 作为温度的函数的光致发光材料的发射是已知的。 光致发光材料设置在与光纤的第二端相对的槽的至少一部分内,使得它们彼此光学连通。 当活化光被光纤输送到光致发光材料上时,通过光致发光材料发射回到光纤中的发光的强度变化提供了电器件的完整性的指示。
    • 3. 发明申请
    • TEST CIRCUIT AND METHODS FOR SPEED CHARACTERIZATION
    • 测试电路和速度特性的方法
    • US20130093488A1
    • 2013-04-18
    • US13459659
    • 2012-04-30
    • Ravi Karapatti RamaswamiVasu P. GantiAnh Hoang
    • Ravi Karapatti RamaswamiVasu P. GantiAnh Hoang
    • H03H11/26
    • G01R31/31725G01R31/3187
    • A system and method for efficiently performing timing characterization of regions of an integrated circuit. An integrated circuit has monitors distributed in different physical regions across its die. Each monitor includes timing characterization and self-test circuitry. This circuitry includes one or more tunable delay lines used during timing measurements. The circuitry verifies the tunable delay lines are defect free prior to the timing measurements. If defects are detected, but tunable delay lines may still be used, a scaling factor may be generated for a failing tunable delay line. The scaling factor may be used during subsequent timing measurements to maintain a high accuracy for the measurements. The timing measurements may determine a particular physical region of the die provides fast or slow timing values. The resulting statistics of the timing measurements may be used to change an operational mode of the IC in at least the particular region.
    • 一种用于有效地执行集成电路的区域的定时表征的系统和方法。 集成电路具有分布在其芯片上的不同物理区域中的监视器。 每个监视器包括时序表征和自检电路。 该电路包括在定时测量期间使用的一个或多个可调延迟线。 在定时测量之前,电路验证可调延迟线是无缺陷的。 如果检测到缺陷,但是仍然可以使用可调延迟线,则可能会为故障的可调延迟线产生缩放因子。 在随后的定时测量期间可以使用缩放因子以保持测量的高精度。 定时测量可以确定芯片的特定物理区域提供快速或慢速定时值。 所得到的定时测量统计可用于至少在特定区域中改变IC的操作模式。
    • 7. 发明授权
    • Test circuit and methods for speed characterization
    • 测试电路和速度表征方法
    • US08593196B2
    • 2013-11-26
    • US13459659
    • 2012-04-30
    • Ravi Karapatti RamaswamiVasu P. GantiAnh Hoang
    • Ravi Karapatti RamaswamiVasu P. GantiAnh Hoang
    • H03H11/26
    • G01R31/31725G01R31/3187
    • A system and method for efficiently performing timing characterization of regions of an integrated circuit. An integrated circuit has monitors distributed in different physical regions across its die. Each monitor includes timing characterization and self-test circuitry. This circuitry includes one or more tunable delay lines used during timing measurements. The circuitry verifies the tunable delay lines are defect free prior to the timing measurements. If defects are detected, but tunable delay lines may still be used, a scaling factor may be generated for a failing tunable delay line. The scaling factor may be used during subsequent timing measurements to maintain a high accuracy for the measurements. The timing measurements may determine a particular physical region of the die provides fast or slow timing values. The resulting statistics of the timing measurements may be used to change an operational mode of the IC in at least the particular region.
    • 一种用于有效地执行集成电路的区域的定时表征的系统和方法。 集成电路具有分布在其芯片上的不同物理区域中的监视器。 每个监视器包括时序表征和自检电路。 该电路包括在定时测量期间使用的一个或多个可调延迟线。 在定时测量之前,电路验证可调延迟线是无缺陷的。 如果检测到缺陷,但是仍然可以使用可调延迟线,则可能会为故障的可调延迟线产生缩放因子。 在随后的定时测量期间可以使用缩放因子以保持测量的高精度。 定时测量可以确定芯片的特定物理区域提供快速或慢速定时值。 所得到的定时测量统计可用于至少在特定区域中改变IC的操作模式。
    • 9. 发明申请
    • Systems and methods for monitoring temperature during electrosurgery or laser therapy
    • 在电外科或激光治疗期间监测温度的系统和方法
    • US20080033300A1
    • 2008-02-07
    • US11499530
    • 2006-08-04
    • Anh HoangJi-Dih Hu
    • Anh HoangJi-Dih Hu
    • A61B6/00A61B18/18
    • A61B18/20A61B18/14A61B2017/0007
    • Systems that measure temperatures of tissue during electrosurgery or laser therapy of the tissue or organs is provided. One system provides a pyrometer that measures infrared electromagnetic energy emitted by a surface of a tissue or organ thereby determining a sub-surface temperature of the tissue or organ. The system further has an energy generator and an ablation electrode or laser probe that delivers energy from the energy generator to a tissue or organ, responsive to a sub-surface temperature determined by the pyrometer. The pyrometer can be calibrated using a luminescent material having known optical properties as a function of temperature. The luminescent material can be positioned on the surface of the tissue or organ or inserted directly into the tissue or organ using a catheter. Methods in which the surface or sub-surface temperature of the tissue is measured during therapy are also provided.
    • 提供了测量组织或器官的电外科手术或激光治疗期间组织温度的系统。 一个系统提供测量由组织或器官的表面发射的红外电磁能的高温计,从而确定组织或器官的表面下温度。 该系统还具有能量发生器和消融电极或激光探针,其响应于由高温计确定的次表面温度,将能量从能量发生器传递到组织或器官。 可以使用具有已知光学性质的发光材料作为温度的函数校准高温计。 发光材料可以定位在组织或器官的表面上,或者使用导管直接插入到组织或器官中。 还提供了在治疗期间测量组织的表面或亚表面温度的方法。