会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明授权
    • Memory elements with increased write margin and soft error upset immunity
    • 存储器元件具有增加的写入裕度和软错误失真的抗扰度
    • US08711614B1
    • 2014-04-29
    • US13052374
    • 2011-03-21
    • Andy L. LeeIrfan RahimLu ZhouMadhuri MailavaramSrinivas Perisetty
    • Andy L. LeeIrfan RahimLu ZhouMadhuri MailavaramSrinivas Perisetty
    • G11C11/34
    • G11C8/10
    • Memory elements are provided that exhibit immunity to soft error upset events when subjected to radiation strikes such as high-energy atomic particle strikes. The memory elements may each have four inverter-like transistor pairs that form a bistable element and a pair of address transistors. There may be four nodes in the transistor each of which is associated with a respective one of the four inverter-like transistor pairs. There may be two control transistors each of which is coupled between the transistors in a respective one of the inverter-like transistor pairs. During data writing operations, the two control transistors may be turned off to temporarily decouple the transistors in two of the four inverter-like transistor pairs.
    • 提供了存储器元件,当受到诸如高能量原子粒子撞击的辐射攻击时,其表现出对软错误失调事件的抗扰性。 存储器元件可以各自具有形成双稳态元件和一对地址晶体管的四个反相器状晶体管对。 晶体管中可能存在四个节点,每个节点与四个逆变器状晶体管对中的相应一个相关联。 可以存在两个控制晶体管,每个控制晶体管耦合在逆变器状晶体管对的相应一个中的晶体管之间。 在数据写入操作期间,可以关闭两个控制晶体管,以暂时将四个反相器状晶体管对中的两个中的晶体管去耦。
    • 2. 发明授权
    • Memory elements with increased write margin and soft error upset immunity
    • 存储器元件具有增加的写入裕度和软错误失真的抗扰度
    • US07920410B1
    • 2011-04-05
    • US12391230
    • 2009-02-23
    • Andy L. LeeIrfan RahimLu ZhouMadhuri MailavaramSrinivas Perisetty
    • Andy L. LeeIrfan RahimLu ZhouMadhuri MailavaramSrinivas Perisetty
    • G11C11/00G11C5/06
    • G11C8/10
    • Memory elements are provided that exhibit immunity to soft error upset events when subjected to radiation strikes such as high-energy atomic particle strikes. The memory elements may each have four inverter-like transistor pairs that form a bistable element and a pair of address transistors. There may be four nodes in the transistor each of which is associated with a respective one of the four inverter-like transistor pairs. There may be two control transistors each of which is coupled between the transistors in a respective one of the inverter-like transistor pairs. During data writing operations, the two control transistors may be turned off to temporarily decouple the transistors in two of the four inverter-like transistor pairs.
    • 提供了存储器元件,当受到诸如高能量原子粒子撞击的辐射攻击时,其表现出对软错误失调事件的抗扰性。 存储器元件可以各自具有形成双稳态元件和一对地址晶体管的四个反相器状晶体管对。 晶体管中可能存在四个节点,每个节点与四个逆变器状晶体管对中的相应一个相关联。 可以存在两个控制晶体管,每个控制晶体管耦合在逆变器状晶体管对的相应一个中的晶体管之间。 在数据写入操作期间,可以关闭两个控制晶体管,以暂时将四个反相器状晶体管对中的两个中的晶体管去耦。
    • 8. 发明授权
    • Reconfigurable logic block with user RAM
    • 用户RAM可重构逻辑块
    • US08436646B1
    • 2013-05-07
    • US13175662
    • 2011-07-01
    • David W. MendelTriet M. NguyenLu ZhouGary Lai
    • David W. MendelTriet M. NguyenLu ZhouGary Lai
    • H03K19/173
    • H03K19/17724
    • A programmable logic device includes logic blocks such as a logic array blocks (LAB) that can be configured as a random access memory (RAM) or as a lookup table (LUT). A mode flag is provided to indicate the mode of operation of configuration logic such as a configuration RAM (CRAM) used during partial reconfiguration of a logic block. If the mode flag indicates a design state, the configuration logic associated with the logic block is included in data verification and correction processes. If the mode flag indicates a user defined state, the configuration logic associated with the logic block is excluded from data verification and correction processes. Thus, exclusion and inclusion of portions of a region of configuration logic from data verification and correction processes allow a region of configuration logic to store both a design state and a user defined state without causing deleterious effects.
    • 可编程逻辑器件包括诸如可被配置为随机存取存储器(RAM)或查找表(LUT)的逻辑阵列块(LAB)的逻辑块。 提供模式标志以指示诸如在逻辑块的部分重新配置期间使用的配置RAM(CRAM)的配置逻辑的操作模式。 如果模式标志指示设计状态,则与逻辑块相关联的配置逻辑被包括在数据验证和校正处理中。 如果模式标志指示用户定义的状态,则与逻辑块相关联的配置逻辑从数据验证和校正处理中排除。 因此,排除和包含来自数据验证和校正处理的配置逻辑区域的部分允许配置逻辑的区域既存储设计状态又限制用户定义的状态,而不会造成有害影响。
    • 10. 发明授权
    • Methods and systems for managing a write operation
    • 用于管理写入操作的方法和系统
    • US08242806B1
    • 2012-08-14
    • US12829206
    • 2010-07-01
    • David CashmanDavid LewisLu Zhou
    • David CashmanDavid LewisLu Zhou
    • G06F7/38
    • H03K19/17728
    • Systems and methods for managing a write operation are described. The systems include a logic element (LE) including an N-input look-up table (LUT) having a configurable random access memory (CRAM) including 2N memory cells. The systems further include a write address decoder coupled to the LE and a write address hard logic register that stores an address of one of the memory cells. N is an integer. The hard logic register removes a dependency of a timing relationship between a write address launch and a write to the CRAM on a design of an integrated circuit.
    • 描述用于管理写入操作的系统和方法。 该系统包括包括具有包括2N个存储单元的可配置随机存取存储器(CRAM))的N输入查找表(LUT)的逻辑元件(LE)。 系统还包括耦合到LE的写地址解码器和存储存储器单元之一的地址的写地址硬逻辑寄存器。 N是整数。 硬逻辑寄存器消除了对集成电路设计的写入地址启动和对CRAM的写入之间的定时关系的依赖性。