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    • 7. 发明授权
    • Fuse circuit for final test trimming of integrated circuit chip
    • 保险丝电路,用于集成电路芯片的最终测试修整
    • US08878304B2
    • 2014-11-04
    • US13358242
    • 2012-01-25
    • Li-Wen FangChih-Hao YangAn-Tung Chen
    • Li-Wen FangChih-Hao YangAn-Tung Chen
    • H01L27/06G11C29/00H01L27/02
    • G11C29/785H01L27/0255H01L27/0617
    • The present invention discloses a fuse circuit for final test trimming of an integrated circuit (IC) chip. The fuse circuit includes at least one electrical fuse, at least one control switch corresponding to the electrical fuse, and a resistant device. The electrical fuse is connected with the control switch in series between a predetermined pin and a grounding pin. The control switch receives a control signal to determine whether a predetermined current flows through the corresponding electrical fuse and breaks the electrical fuse. The resistant device is coupled between a bulk terminal and a source terminal to increase a resistance of a parasitic channel, such that an electrostatic discharge (ESD) protection is enhanced, and errors of final test trimming of an IC chip are avoided.
    • 本发明公开了一种用于集成电路(IC)芯片的最终测试修整的熔丝电路。 熔断器电路包括至少一个电熔丝,对应于电熔丝的至少一个控制开关和一个电阻装置。 电保险丝与控制开关串联连接在预定的引脚和接地引脚之间。 控制开关接收控制信号以确定预定电流是否流过相应的电熔丝并断开电熔丝。 电阻器件耦合在体端子和源极端子之间以增加寄生沟道的电阻,从而增强了静电放电(ESD)保护,并且避免了IC芯片的最终测试修整的误差。
    • 8. 发明申请
    • Dual-mode buck switching regulator and control circuit therefor
    • 双模降压开关稳压器及其控制电路
    • US20110018514A1
    • 2011-01-27
    • US12658692
    • 2010-02-12
    • An-Tung ChenLi-Wen Fang
    • An-Tung ChenLi-Wen Fang
    • G05F1/10
    • H02M3/1588H02M2001/0032H02M2001/0048Y02B70/1466Y02B70/1491Y02B70/16
    • The present invention discloses a dual-mode buck switching regulator, comprising: a first power transistor having an end coupled to an input voltage and another end coupled to a common node; an inductor having an end coupled to the common node and another end coupled to the input voltage; a second power transistor having an end coupled to ground; a diode having an end coupled to ground; and a control circuit generating a first and a second switch control signals for controlling operations of the first and the second power transistors according to a feedback signal, and generating a mode selection signal according a mode control signal to select a synchronous or an asynchronous mode, wherein the second power transistor has another end which is coupled to the common node in the synchronous mode, and the diode has another end which is coupled to the common node in the asynchronous mode, and in the asynchronous mode: the another end of the second power transistor is not coupled to the common mode, or the second power transistor maintains off. The present invention also relates to a control circuit of the dual-mode buck switching regulator.
    • 本发明公开了一种双模降压开关调节器,包括:第一功率晶体管,其一端耦合到输入电压,另一端耦合到公共节点; 电感器,其端部耦合到公共节点,另一端耦合到输入电压; 第二功率晶体管,其端部耦合到地; 二极管,其一端与地耦合; 以及控制电路,根据反馈信号产生用于控制第一和第二功率晶体管的操作的第一和第二开关控制信号,并且根据模式控制信号产生模式选择信号以选择同步或异步模式, 其中所述第二功率晶体管具有以同步模式耦合到所述公共节点的另一端,并且所述二极管具有以所述异步模式耦合到所述公共节点并且处于所述异步模式的另一端:所述第二功率晶体管的另一端 功率晶体管不耦合到共模,或者第二功率晶体管保持断开。 本发明还涉及双模降压开关调节器的控制电路。
    • 9. 发明申请
    • FUSE CIRCUIT FOR FINAL TEST TRIMMING OF INTEGRATED CIRCUIT CHIP
    • 用于集成电路芯片最终测试的保险丝电路
    • US20130113049A1
    • 2013-05-09
    • US13358242
    • 2012-01-25
    • LI-WEN FANGChih-Hao YangAn-Tung Chen
    • LI-WEN FANGChih-Hao YangAn-Tung Chen
    • H01L27/06
    • G11C29/785H01L27/0255H01L27/0617
    • The present invention discloses a fuse circuit for final test trimming of an integrated circuit (IC) chip. The fuse circuit includes at least one electrical fuse, at least one control switch corresponding to the electrical fuse, and a resistant device. The electrical fuse is connected with the control switch in series between a predetermined pin and a grounding pin. The control switch receives a control signal to determine whether a predetermined current flows through the corresponding electrical fuse and breaks the electrical fuse. The resistant device is coupled between a bulk terminal and a source terminal to increase a resistance of a parasitic channel, such that an electrostatic discharge (ESD) protection is enhanced, and errors of final test trimming of an IC chip are avoided.
    • 本发明公开了一种用于集成电路(IC)芯片的最终测试修整的熔丝电路。 熔断器电路包括至少一个电熔丝,对应于电熔丝的至少一个控制开关和一个电阻装置。 电保险丝与控制开关串联连接在预定的引脚和接地引脚之间。 控制开关接收控制信号以确定预定电流是否流过相应的电熔丝并断开电熔丝。 电阻器件耦合在体端子和源极端子之间以增加寄生沟道的电阻,从而增强了静电放电(ESD)保护,并且避免了IC芯片的最终测试修整的误差。