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1. 发明授权

US07554672B2 Phase-diversity wavefront sensor 有权
标题翻译：相位分集波前传感器
公开(公告)号：US07554672B2
公开(公告)日：2009-06-30
申请号：US10561206
申请日：2004-06-21
申请人： Alan Howard Greenaway , Heather Isla Campbell , Sijiong Zhang
发明人： Alan Howard Greenaway , Heather Isla Campbell , Sijiong Zhang
IPC分类号： G01B9/02
CPC分类号： G02B27/4233 , G01J9/00 , G02B27/1086 , G02B27/42 , G02B27/50
摘要： A measuring apparatus provides data relating to the shape of an input radiation wavefront, the wavefront shape being describable at a pre-determined location in an optical system. The apparatus includes an aberration device which provides an aberration to the input radiation wavefront, the shape of which is defined by a filter function that is complex valued and has non-mixed symmetry, and a detector having a radiation sensitive surface capable of detecting the intensity of incident radiation on the surface, the detector being coupled to an output device that provides a measure of the intensity of the incident radiation. The aberration device is configured to act on an input wavefront shape to produce first and second output radiation signals that are detected by the detector and in combination cause the output device to provide data indicating an extent to which the wavefront shape is non-planar.
摘要翻译：测量装置提供与输入辐射波前的形状有关的数据，波前形状可在光学系统中的预定位置描述。该装置包括像差装置，该像差装置为输入辐射波前提供像差，其形状由具有复数值且具有非混合对称性的滤光器函数限定，以及具有能够检测强度的辐射敏感表面的检测器的表面上的入射辐射，检测器耦合到输出装置，其提供入射辐射的强度的量度。像差装置被配置为作用于输入波前形状以产生由检测器检测到的第一和第二输出辐射信号，并且组合使得输出装置提供指示波阵面形状为非平面的程度的数据。

2. 发明授权

US5721615A Sensor system for measurement of temperature or strain 失效
标题翻译：用于测量温度或应变的传感器系统
公开(公告)号：US5721615A
公开(公告)日：1998-02-24
申请号：US591475
申请日：1996-01-25
申请人： Roy McBride , James G. Burnett , Alan Howard Greenaway , Julian D. C. Jones
发明人： Roy McBride , James G. Burnett , Alan Howard Greenaway , Julian D. C. Jones
IPC分类号： G08C23/04 , G01B9/02 , G01D5/353 , G01K5/52
CPC分类号： G01B9/02072 , G01B9/02023 , G01B9/0209 , G01D5/35303 , G01K5/52 , G01B2290/70
摘要： A sensor system in an interferometric arrangement has a sensor arm and a reference arm. The reference arm is in a stable environment and the sensor arm is arranged to be subject to variations in strain and/or temperature. Radiation from a broadband source propagates through the arrangement and a broadband interferogram is generated as an air gap is scanned. The interferogram is recorded on an oscilloscope and analyzed using signal processing software on a computer. From the analysis the changes in group delay and optical dispersion of the light in the sensor arm due to strain and temperature changes is measured, and values for the strain and/or temperature changes calculated. A narrowband light source may be used for accurate calibration of path length differences during scanning. The strain and temperature on the sensor arm may be calibrated or tested using clamps and a thermal enclosure. The system may also be configured in a tandem interferometry arrangement including a sensing interferometer and reference interferometer.
摘要翻译： PCT No.PCT / GB94 / 01388 Sec。 371日期：1996年1月25日 102（e）日期1996年1月25日PCT Filed 1994年6月27日PCT Pub。公开号WO95 / 02802 日期1995年1月26日干涉仪中的传感器系统具有传感器臂和参考臂。参考臂处于稳定的环境中，并且传感器臂被布置成经受应变和/或温度的变化。宽带源的辐射通过该布置传播，并且当扫描气隙时产生宽带干涉图。干涉图记录在示波器上，并使用计算机上的信号处理软件进行分析。从分析中，测量由于应变和温度变化导致的传感器臂中的光延迟和光学色散的变化，并且计算应变和/或温度变化的值。可以使用窄带光源来精确校准扫描期间的路径长度差异。传感器臂上的应变和温度可以使用夹具和热外壳进行校准或测试。该系统还可以被配置成包括感测干涉仪和参考干涉仪的串联干涉测量装置。

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