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    • 4. 发明授权
    • Automatic analyzer
    • 自动分析仪
    • US08758684B2
    • 2014-06-24
    • US11833650
    • 2007-08-03
    • Kenichi YagiTakayuki NodaKenichi TakahashiKenji TeshigawaraAtsushi Suzuki
    • Kenichi YagiTakayuki NodaKenichi TakahashiKenji TeshigawaraAtsushi Suzuki
    • G01N35/02G01N35/00
    • G01N35/00603G01N35/02Y10T436/113332
    • An automatic analysis system, which is capable of quickly performing reinspection, includes a sample rack which holds a sample vessel containing a sample; a sample rack input unit in which the sample rack is input; a carrier line which carries the sample rack; a plurality of automatic analyzers arranged along the carrier line; a sample rack holding unit which holds the sample rack storing an analyzed sample; a sample rack collection unit which collects the sample rack storing an analyzed sample; a carrier line for reinspection which returns the sample rack containing a sample subjected to reinspection depending on analysis results; and a controller for returning the sample rack from the sample rack holding unit through the carrier line for reinspection and controlling any one of automatic analyzers different from one that has previously performed analysis to perform reanalysis of the sample.
    • 能够快速进行再检测的自动分析系统包括容纳样品的样品容器的样架, 样品架输入单元,其中输入样品架; 承载样品架的载体线; 沿着载体线布置的多个自动分析器; 样品架保持单元,其容纳存储分析样品的样品架; 样本架收集单元,其收集存储分析样本的样本架; 用于重新检查的载体线,其根据分析结果返回包含经受再检查的样品的样品架; 以及控制器,用于通过载体线从样品架保持单元返回样品架,用于再次检测,并且控制与先前进行的分析不同的自动分析仪之一以进行样品的再分析。