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1. 发明申请

US20190171001A1 THERMAL DRIVEN MEMS TUNABLE FILTER 审中-公开
公开(公告)号：US20190171001A1
公开(公告)日：2019-06-06
申请号：US15830834
申请日：2017-12-04
申请人： Agiltron, Inc.
发明人： Guanghai Jin , Congshun Wang , Luzhong Yin , Jing Zhao
IPC分类号： G02B26/00 , G02B6/293 , G01J3/26
CPC分类号： G02B26/001 , G01J3/26 , G02B6/29361 , G02B6/2938
摘要： A microelectrical mechanical system (MEMS) implementation of tunable Fabry Perot filter devices is disclosed. The advantages associated with the use of these tunable etalons include increases in aperture size, displacement, reliability, and a reduction in cost. In some examples, integrated tunable detectors in miniature spectrometers using a thermal driven MEMS Fabry-Perot tunable filter are provided. Other examples use integrated thermal driven tunable MEMS Fabry-Perot filter to select fiber optical communication channel.

2. 发明授权

US10429634B2 Thermal driven MEMS tunable filter 有权
公开(公告)号：US10429634B2
公开(公告)日：2019-10-01
申请号：US15830834
申请日：2017-12-04
申请人： Agiltron, Inc.
发明人： Guanghai Jin , Congshun Wang , Jing Zhao
IPC分类号： G02B26/00 , G01J3/26 , G02B6/293
摘要： A microelectrical mechanical system (MEMS) implementation of tunable Fabry Perot filter devices is disclosed. The advantages associated with the use of these tunable etalons include increases in aperture size, displacement, reliability, and a reduction in cost. In some examples, integrated tunable detectors in miniature spectrometers using a thermal driven MEMS Fabry-Perot tunable filter are provided. Other examples use integrated thermal driven tunable MEMS Fabry-Perot filter to select fiber optical communication channel.

3. 发明申请

US20170183217A1 MICROELECTROMECHANICAL DISPLACEMENT STRUCTURE AND METHOD FOR CONTROLLING DISPLACEMENT 审中-公开
公开(公告)号：US20170183217A1
公开(公告)日：2017-06-29
申请号：US15300212
申请日：2015-03-24
申请人： Agiltron, Inc.
发明人： Luzhong Yin , Jing Zhao , Guanghai Jin
IPC分类号： B81B3/00 , G02B26/02 , H02N10/00
CPC分类号： B81B3/0037 , B81B3/0024 , B81B2201/045 , B81B2203/0118 , B81B2203/0315 , B81B2203/0384 , B81B2203/051 , G02B26/02 , G02B26/023 , G02B26/04 , H02N2/043 , H02N10/00
摘要： The present disclosure provides a displacement amplification structure and a method for controlling displacement. In one aspect, the displacement amplification structure of the present disclosure includes a first beam and a second beam substantially parallel to the first beam, an end of the first beam coupled to a fixture site, and an end of the second beam coupled to a motion actuator; and a motion shutter coupled to an opposing end of the first and second beams. In response to a displacement of the motion actuator along an axis direction of the second beam, the motion shutter displaces a distance along a transversal direction substantially perpendicular to the axis direction.

4. 发明授权

US10752492B2 Microelectromechanical displacement structure and method for controlling displacement 有权
公开(公告)号：US10752492B2
公开(公告)日：2020-08-25
申请号：US15300212
申请日：2015-03-24
申请人： Agiltron, Inc.
发明人： Luzhong Yin , Jing Zhao , Guanghai Jin
IPC分类号： B81B3/00 , G02B26/04 , G02B26/02 , H02N2/04 , H02N10/00
摘要： The present disclosure provides a displacement amplification structure and a method for controlling displacement. In one aspect, the displacement amplification structure of the present disclosure includes a first beam and a second beam substantially parallel to the first beam, an end of the first beam coupled to a fixture site, and an end of the second beam coupled to a motion actuator; and a motion shutter coupled to an opposing end of the first and second beams. In response to a displacement of the motion actuator along an axis direction of the second beam, the motion shutter displaces a distance along a transversal direction substantially perpendicular to the axis direction.

5. 发明申请

US20160178528A1 DEVICES FOR DETECTING CONTAMINATION IN COATINGS 审中-公开
标题翻译：用于检测涂料中污染的装置
公开(公告)号：US20160178528A1
公开(公告)日：2016-06-23
申请号：US14578048
申请日：2014-12-19
申请人： Agiltron, Inc.
发明人： Wayne A. Weimer , Guanghai Jin
IPC分类号： G01N21/84 , G01N21/94 , G01N21/55
CPC分类号： G01N21/8422 , G01N21/55 , G01N21/94 , G01N2021/8427 , G01N2201/0221
摘要： A device disclosed herein includes an optical detector that detects a specular reflection from a test article having a coating thereon. The device also includes a processor operatively coupled to the optical detector and configured to determine whether a contaminant is present at the coating based on the specular reflection and based on a calibration measurement determined from a test article having a known contaminant-free sample of the coating thereon. Another device disclosed herein includes an optical detector that detects a specular reflection from the test article having a coating thereon, with the specular reflection at an angle of less than 20° with respect to an axis normal to the test article. The device can further include a processor configured to determine whether contamination is present at the coating. Embodiments enable rapid, sensitive testing of epoxy and paint surfaces by minimally trained personnel.
摘要翻译：本文公开的装置包括光学检测器，其检测来自其上具有涂层的测试制品的镜面反射。该装置还包括可操作地耦合到光学检测器的处理器，其被配置为基于镜面反射来确定污染物是否存在于涂层处，并且基于从具有已知的无污染涂层样品的测试制品确定的校准测量值上。本文公开的另一个装置包括光学检测器，其检测来自其上具有涂层的测试制品的镜面反射，其中镜面反射相对于与测试制品垂直的轴线成小于20°的角度。该装置还可以包括配置成确定涂层中是否存在污染物的处理器。实施方案能够由受过训练的人员对环氧树脂和油漆表面进行快速，灵敏的测试。

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