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1. 发明授权

US07876276B1 Antenna near-field probe station scanner 有权
标题翻译：天线近场探头台扫描仪
公开(公告)号：US07876276B1
公开(公告)日：2011-01-25
申请号：US11499982
申请日：2006-08-02
申请人： Afroz J. Zaman , Richard Q. Lee , William G. Darby , Philip J. Barr , Kevin M Lambert , Felix A. Miranda
发明人： Afroz J. Zaman , Richard Q. Lee , William G. Darby , Philip J. Barr , Kevin M Lambert , Felix A. Miranda
IPC分类号： G01R29/10
CPC分类号： G01R29/105 , H01Q3/08
摘要： A miniaturized antenna system is characterized non-destructively through the use of a scanner that measures its near-field radiated power performance. When taking measurements, the scanner can be moved linearly along the x, y and z axis, as well as rotationally relative to the antenna. The data obtained from the characterization are processed to determine the far-field properties of the system and to optimize the system. Each antenna is excited using a probe station system while a scanning probe scans the space above the antenna to measure the near field signals. Upon completion of the scan, the near-field patterns are transformed into far-field patterns. Along with taking data, this system also allows for extensive graphing and analysis of both the near-field and far-field data. The details of the probe station as well as the procedures for setting up a test, conducting a test, and analyzing the resulting data are also described.
摘要翻译：小型化天线系统通过使用测量其近场辐射功率性能的扫描仪非破坏性地表征。当进行测量时，扫描仪可以沿x，y和z轴线性移动，以及相对于天线旋转。处理从表征获得的数据以确定系统的远场属性并优化系统。每个天线使用探测台系统激励，而扫描探针扫描天线上方的空间来测量近场信号。扫描完成后，近场图案被转换为远场图案。随着采集数据，该系统还可以对近场和远场数据进行广泛的绘图和分析。还描述了探测台的细节以及建立测试，进行测试和分析所得数据的过程。

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