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1. 发明公开

US20240103037A1 TEST SYSTEM CONFIGURATION ADAPTER SYSTEMS AND METHODS 审中-公开
公开(公告)号：US20240103037A1
公开(公告)日：2024-03-28
申请号：US18528548
申请日：2023-12-04
申请人： Advantest Corporation
发明人： Eddy Wayne CHOW
IPC分类号： G01R1/04 , G01R31/3185 , G01R31/319
CPC分类号： G01R1/0441 , G01R31/318519 , G01R31/31905
摘要： Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. In one embodiment, a test system configuration adapter includes a tester side socket, a break out pin, and a device under test side slot. The tester side socket is configured to couple with a test equipment socket. The break out pin is configured to couple with the supplemental equipment. The device under test side slot is configured to couple with the tester side socket, the break out pin, and a device under test, wherein the tester side socket. The test system configuration adapter is configured to enable communication between test equipment coupled to the test equipment socket and supplemental equipment coupled to the breakout pin while the device under test remains coupled to the device under test side slot. In one exemplary implementation, the breakout pin and tester side socket are selectively coupled to the device under test side slot. The test system configuration adapter can include a switch configured to switch a portion of the coupling of the device under test side slot to the tester side socket and the break out pin.

2. 发明申请

US20220155342A1 TEST SYSTEM CONFIGURATION ADAPTER SYSTEMS AND METHODS 有权
公开(公告)号：US20220155342A1
公开(公告)日：2022-05-19
申请号：US17099610
申请日：2020-11-16
申请人： Advantest Corporation
发明人： Eddy Wayne CHOW
IPC分类号： G01R1/04 , G01R31/319 , G01R31/3185
摘要： Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. In one embodiment, a test system configuration adapter includes a tester side socket, a break out pin, and a device under test side slot. The tester side socket is configured to couple with a test equipment socket. The break out pin is configured to couple with the supplemental equipment. The device under test side slot is configured to couple with the tester side socket, the break out pin, and a device under test, wherein the tester side socket. The test system configuration adapter is configured to enable communication between test equipment coupled to the test equipment socket and supplemental equipment coupled to the breakout pin while the device under test remains coupled to the device under test side slot. In one exemplary implementation, the breakout pin and tester side socket are selectively coupled to the device under test side slot. The test system configuration adapter can include a switch configured to switch a portion of the coupling of the device under test side slot to the tester side socket and the break out pin.

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