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    • 1. 发明申请
    • MEMORY BUILT-IN SELF-TEST FOR A DATA PROCESSING APPARATUS
    • 用于数据处理设备的内存内置自检
    • US20150371718A1
    • 2015-12-24
    • US14310162
    • 2014-06-20
    • ARM LIMITED
    • Alan Jeremy BECKERChiloda Ashan Senerath PATHIRANERobert Campbell AITKEN
    • G11C29/14
    • G11C29/14G06F11/008G11C29/16G11C2029/0409
    • A data processing apparatus has at least one memory and processing circuitry. A memory built-in self-test (MBIST) interface receives a MBIST request indicating that a test procedure is to be performed for testing at least one target memory location. Control circuitry detects the MBIST request and reserves for testing at least one reserved memory location including the target memory location. During the test procedure, the memory continues servicing memory transactions issued by the processing circuitry that target a memory location other than the reserved location reserved by the control circuitry. The processing circuitry is stalled if it attempts to access a reserved memory location. Testing consists of short bursts of transactions which occur infrequently. In this way, MBIST testing may continue while the processor is operation in the field with reduced performance impact.
    • 数据处理装置具有至少一个存储器和处理电路。 存储器内置自检(MBIST)接口接收MBIST请求,指示要执行测试程序来测试至少一个目标存储器位置。 控制电路检测MBIST请求并保留用于测试至少一个保留的存储器位置,包括目标存储器位置。 在测试过程期间,存储器继续服务处理电路所发出的存储器事务,该处理电路针对存储器位置而不是由控制电路保留的保留位置。 如果处理电路尝试访问保留的存储器位置,则停止处理。 测试包括不经常发生的短突发事件。 这样,当处理器在现场运行时,MBIST测试可能会持续下去,从而降低性能影响。
    • 2. 发明申请
    • EXECUTING DEBUG PROGRAM INSTRUCTIONS ON A TARGET APPARATUS PROCESSING PIPELINE
    • 目标设备加工管道执行调试程序指令
    • US20150363293A1
    • 2015-12-17
    • US14685799
    • 2015-04-14
    • ARM LIMITED
    • Chiloda Ashan Senerath PATHIRANEAllan John SKILLMAN
    • G06F11/36
    • G06F11/3636G06F11/3648G06F11/3664
    • A target apparatus 2 for debug includes a processing pipeline 18 for executing a sequence of program instructions. A debug interface 26 receives debug command signals corresponding directly or indirectly to debug program instructions to be executed. An instruction buffer 24 stores both the debug program instructions and non-debug program instructions. An arbiter 30 selects between both the debug program instructions and the non-debug program instructions stored within the instruction buffer to form the sequence of program instructions to be executed by the processing pipeline. A complex coherent memory system 4, 6, 8, 10, 12, 14, 32 is shared by the debug program instructions and the non-debug program instructions such that they obtain the same coherent view of memory.
    • 用于调试的目标装置2包括用于执行程序指令序列的处理流水线18。 调试接口26接收直接或间接对应于要执行的调试程序指令的调试命令信号。 指令缓冲器24存储调试程序指令和非调试程序指令。 仲裁器30在调试程序指令和存储在指令缓冲器内的非调试程序指令之间进行选择,以形成由处理管线执行的程序指令序列。 复杂的相干存储器系统4,6,8,10,12,14和32由调试程序指令和非调试程序指令共享,使得它们获得相同的存储器的相干视图。
    • 6. 发明申请
    • BRANCH TARGET ADDRESS CACHE USING HASHED FETCH ADDRESSES
    • 分支目标地址使用HASHED地址寻址
    • US20140122846A1
    • 2014-05-01
    • US13664659
    • 2012-10-31
    • ARM LIMITED
    • Vladimir VASEKINAllan John SKILLMANChiloda Ashan Senerath PATHIRANEJean-Baptiste BRELOT
    • G06F9/38
    • G06F9/3806
    • An integrated circuit 2 incorporates prefetch circuitry 12 for prefetching program instructions from a memory 6. The prefetch circuitry 12 includes a branch target address cache 28. The branch target address cache 28 stores data indicative of branch target addresses of previously encountered branch instructions fetched from the memory 6. For each previously encountered branch instructions, the branch target address cache stores a tag value indicative of a fetch address of that previously encountered branch instruction. The tag values stored are generated by tag value generating circuitry 32 which performs a hashing function upon a portion of the fetch address such that the tag value has a bit length less than the bit length of the portion of the fetch address concerned.
    • 集成电路2包含用于从存储器6预取程序指令的预取电路12.预取电路12包括分支目标地址高速缓存28.分支目标地址高速缓存28存储指示从先前遇到的分支指令的分支目标地址 对于每个先前遇到的分支指令,分支目标地址高速缓存存储指示先前遇到的分支指令的获取地址的标签值。 存储的标签值由标签值生成电路32产生,标签值生成电路32对获取地址的一部分执行散列函数,使得标签值的位长度小于相关提取地址的位长度。