会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 2. 发明申请
    • TEST CIRCUIT FOR NETWORK INTERFACE
    • 网络接口测试电路
    • US20120029860A1
    • 2012-02-02
    • US12870992
    • 2010-08-30
    • ZUO-LIN HOU
    • ZUO-LIN HOU
    • G01R31/28
    • H04L43/50
    • A first output pin of a microcontroller is connected to a control pin of a high speed switch chip. A second output pin of the microcontroller is connected to two control pins of first and second switch chips. Two output pins of the high speed switch chip are connected to two input pins of the first switch chip. Two input pins of a third switch chip are connected to two output pins of the second switch chip. Two control pins of the third switch chip are connected to a third output pin of the microcontroller. Three input pins of a bus switch chip are connected to fourth to sixth output pins of the microcontroller. A load board is connected to six output pins of the bus switch chip and four switch pins of the first and second switch chips.
    • 微控制器的第一个输出引脚连接到高速开关芯片的控制引脚。 微控制器的第二输出引脚连接到第一和第二开关芯片的两个控制引脚。 高速开关芯片的两个输出引脚连接到第一开关芯片的两个输入引脚。 第三开关芯片的两个输入引脚连接到第二开关芯片的两个输出引脚。 第三开关芯片的两个控制引脚连接到微控制器的第三个输出引脚。 总线开关芯片的三个输入引脚连接到微控制器的第四至第六输出引脚。 负载板连接到总线开关芯片的六个输出引脚和第一和第二开关芯片的四个开关引脚。
    • 3. 发明申请
    • ELECTRONIC CONNECTION QUALITY TEST DEVICE FOR UNIVERSAL SERIAL BUS INTERFACES
    • 用于通用串行总线接口的电子连接质量测试设备
    • US20130151898A1
    • 2013-06-13
    • US13447290
    • 2012-04-16
    • ZUO-LIN HOU
    • ZUO-LIN HOU
    • G06F11/273
    • G01R31/045
    • An electronic connection quality test device includes a plurality of test circuits, a hot plug circuit, and a control circuit. The test circuits are respectively electrically connected to a plurality of universal serial bus (USB) interfaces. The hot plug circuit is electrically connected to each of the test circuits and a USB device. The control circuit is electrically connected to each of the test circuits and controls the test circuits to electrically connect selected ones of the USB interfaces with the USB device via the test circuits and the hot plug circuit, thereby forming tested electronic connections between the selected ones of the USB interfaces and the USB device.
    • 电子连接质量测试装置包括多个测试电路,热插拔电路和控制电路。 测试电路分别电连接到多个通用串行总线(USB)接口。 热插拔电路电连接到每个测试电路和USB设备。 控制电路电连接到每个测试电路,并且控制测试电路经由测试电路和热插拔电路将选定的USB接口与USB设备电连接,由此形成测试电子连接 USB接口和USB设备。
    • 4. 发明授权
    • Test circuit for network interface
    • 网络接口测试电路
    • US08374820B2
    • 2013-02-12
    • US12870992
    • 2010-08-30
    • Zuo-Lin Hou
    • Zuo-Lin Hou
    • G01R31/28
    • H04L43/50
    • A first output pin of a microcontroller is connected to a control pin of a high speed switch chip. A second output pin of the microcontroller is connected to two control pins of first and second switch chips. Two output pins of the high speed switch chip are connected to two input pins of the first switch chip. Two input pins of a third switch chip are connected to two output pins of the second switch chip. Two control pins of the third switch chip are connected to a third output pin of the microcontroller. Three input pins of a bus switch chip are connected to fourth to sixth output pins of the microcontroller. A load board is connected to six output pins of the bus switch chip and four switch pins of the first and second switch chips.
    • 微控制器的第一个输出引脚连接到高速开关芯片的控制引脚。 微控制器的第二输出引脚连接到第一和第二开关芯片的两个控制引脚。 高速开关芯片的两个输出引脚连接到第一开关芯片的两个输入引脚。 第三开关芯片的两个输入引脚连接到第二开关芯片的两个输出引脚。 第三开关芯片的两个控制引脚连接到微控制器的第三个输出引脚。 总线开关芯片的三个输入引脚连接到微控制器的第四至第六输出引脚。 负载板连接到总线开关芯片的六个输出引脚和第一和第二开关芯片的四个开关引脚。