专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US07646849B2 Ultra-small angle x-ray scattering measuring apparatus 有权
标题翻译：超小角度X射线散射测量装置
公开(公告)号：US07646849B2
公开(公告)日：2010-01-12
申请号：US11774138
申请日：2007-07-06
申请人： Yoshio Iwasaki , Yutaka Yokozawa
发明人： Yoshio Iwasaki , Yutaka Yokozawa
IPC分类号： G01N23/201 , G01N23/20
CPC分类号： G01N23/201 , B82Y10/00 , G21K2201/061
摘要： An ultra-small angle X-ray scattering measuring apparatus includes a detector for detecting X-rays emitted from a sample, an X-ray collimating mirror arranged between the X-ray real focus and the sample, a monochromator arranged between the X-ray collimating mirror and the sample and an analyzer arranged between the sample and the detector. The X-ray collimating mirror includes a pair of X-ray mirrors that are arranged orthogonally relative to each other. The X-ray mirrors are multilayer film mirrors and their X-ray reflection surfaces are paraboloidal. The interplanar spacing of lattice planes of each of the multilayer films is continuously changed along the paraboloid so as to meet the Bragg's condition. The monochromator and the analyzer are formed by using a channel-cut crystal. The analyzer is driven to rotate for scanning around a 2θ-axial line and diffracted rays reduced to a spectrum by the analyzer are detected by the detector.
摘要翻译：一种超小角度X射线散射测定装置，具备检测从样本发出的X射线的检测器，配置在X射线实际焦点与样本之间的X射线准直镜，配置在X射线准直镜和样品以及布置在样品和检测器之间的分析仪。 X射线准直镜包括相对于彼此正交布置的一对X射线镜。 X射线镜是多层膜反射镜，它们的X射线反射面是抛物面的。每个多层膜的晶格面的平面间距沿着抛物面连续变化，以满足布拉格条件。单色仪和分析器通过使用通道切割晶体形成。分析仪被驱动旋转以围绕2θ轴线进行扫描，并由检测器检测由分析仪降低到光谱的衍射光线。

2. 发明授权

US06418190B1 Imaging plate X-ray diffraction apparatus 有权
$Imaging plate X-ray diffraction apparatus$
标题翻译：成像板X射线衍射仪
公开(公告)号：US06418190B1
公开(公告)日：2002-07-09
申请号：US09743606
申请日：2001-01-12
申请人： Yutaka Yokozawa , Yuji Ohashi , Katsunari Sasaki
发明人： Yutaka Yokozawa , Yuji Ohashi , Katsunari Sasaki
IPC分类号： G01N23207
CPC分类号： G03B42/08 , G01N23/20 , G21K1/06
摘要： A space-efficient imaging-plate-type X-ray diffraction apparatus featuring an expanded 2&thgr; goniometry range, high speed, high resolution, and design for convenient use is provided. The imaging-plate-type X-ray diffraction apparatus includes an X-ray measurement device composed of an X-ray optical system (5) and a goniometer (1) and is adapted to cause a single-crystal sample (3) to diffract X-rays. A cylindrical imaging plate (21) is disposed vertically so as to record X-rays diffracted by the sample (3), and covering a 2&thgr; goniometry range of −60° to +144°. A drive motor (11) and a transmission mechanism (12) transfer the cylindrical imaging plate vertically; and a rotary reader (20) is disposed so as to be coaxial with the transferred cylindrical imaging plate (21) and is adapted to read data of diffracted X-rays from an inner cylindrical surface of the cylindrical imaging plate (21).
摘要翻译：提供了具有扩展的2θ测角范围，高速度，高分辨率和设计的节省空间的成像板型X射线衍射装置，方便使用。成像板型X射线衍射装置包括由X射线光学系统（5）和测角器（1）构成的X射线测量装置，并且适于使单晶样品（3）衍射 X光片。垂直设置圆柱形成像板（21），以记录由样品（3）衍射的X射线，并覆盖-60°至+ 144°的2θ测角范围。驱动马达（11）和传动机构（12）垂直传送圆柱形成像板; 并且旋转读取器（20）被布置成与所转印的圆柱形成像板（21）同轴，并且适于从圆柱形成像板（21）的内圆柱形表面读取衍射X射线的数据。

3. 发明申请

US20080013685A1 Ultra-Small Angle X-Ray Scattering Measuring Apparatus 有权
标题翻译：超小角度X射线散射测量仪器
公开(公告)号：US20080013685A1
公开(公告)日：2008-01-17
申请号：US11774138
申请日：2007-07-06
申请人： Yoshio Iwasaki , Yutaka Yokozawa
发明人： Yoshio Iwasaki , Yutaka Yokozawa
IPC分类号： G01N23/201
CPC分类号： G01N23/201 , B82Y10/00 , G21K2201/061
摘要： An ultra-small angle X-ray scattering measuring apparatus includes a detector for detecting X-rays emitted from a sample, an X-ray collimating mirror arranged between the X-ray real focus and the sample, a monochromator arranged between the X-ray collimating mirror and the sample and an analyzer arranged between the sample and the detector. The X-ray collimating mirror includes a pair of X-ray mirrors that are arranged orthogonally relative to each other. The X-ray mirrors are multilayer film mirrors and their X-ray reflection surfaces are paraboloidal. The interplanar spacing of lattice planes of each of the multilayer films is continuously changed along the paraboloid so as to meet the Bragg's condition. The monochromator and the analyzer are formed by using a channel-cut crystal. The analyzer is driven to rotate for scanning around a 2θ-axial line and diffracted rays reduced to a spectrum by the analyzer are detected by the detector.
摘要翻译：一种超小型X射线散射测定装置，具备检测从样品发出的X射线的检测器，配置在X射线实际焦点与样本之间的X射线准直镜，配置在X射线准直镜和样品以及布置在样品和检测器之间的分析仪。 X射线准直镜包括相对于彼此正交布置的一对X射线镜。 X射线镜是多层膜反射镜，它们的X射线反射面是抛物面的。每个多层膜的晶格面的平面间距沿着抛物面连续变化，以满足布拉格条件。单色仪和分析器通过使用通道切割晶体形成。分析仪被驱动旋转以围绕2θ轴线进行扫描，并由检测器检测由分析仪降低到光谱的衍射光线。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式