会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明授权
    • Semiconductor integrated circuit
    • 半导体集成电路
    • US07911874B2
    • 2011-03-22
    • US12129433
    • 2008-05-29
    • Kuninori KawabataYoshiyuki IshidaSatoshi Eto
    • Kuninori KawabataYoshiyuki IshidaSatoshi Eto
    • G11C8/18
    • G11C7/10
    • An interface conversion macro converts a signal compliant with a system interface specification output from a controller to a signal compliant with a memory interface specification, and outputs the same to a memory interface part, and it also converts a signal output from the memory macro to a signal compliant with the system interface specification and outputs the same to the controller. By converting the system interface specification and the memory interface specification to each other by an interface conversion macro, a common memory macro can be mounted on a semiconductor integrated circuit even when the system interface specification differs. Accordingly, when designing a system, the design verification time, evaluation time, and test time of the semiconductor integrated circuit can be reduced. As a result, the design time and design cost of the semiconductor integrated circuit can be reduced.
    • 接口转换宏将符合从控制器输出的系统接口规范的信号转换为符合存储器接口规范的信号,并将其输出到存储器接口部分,并且还将从存储器宏输出的信号转换为 信号符合系统接口规范,并将其输出到控制器。 通过接口转换宏将系统接口规范和存储器接口规范相互转换,即使系统接口规范不同,公共存储器宏也可以安装在半导体集成电路上。 因此,当设计系统时,可以减少半导体集成电路的设计验证时间,评估时间和测试时间。 结果,可以减少半导体集成电路的设计时间和设计成本。
    • 8. 发明申请
    • SEMICONDUCTOR INTEGRATED CIRCUIT
    • 半导体集成电路
    • US20080298159A1
    • 2008-12-04
    • US12129433
    • 2008-05-29
    • Kuninori KawabataYoshiyuki IshidaSatoshi Eto
    • Kuninori KawabataYoshiyuki IshidaSatoshi Eto
    • G11C8/18
    • G11C7/10
    • An interface conversion macro converts a signal compliant with a system interface specification output from a controller to a signal compliant with a memory interface specification, and outputs the same to a memory interface part, and it also converts a signal output from the memory macro to a signal compliant with the system interface specification and outputs the same to the controller. By converting the system interface specification and the memory interface specification to each other by an interface conversion macro, a common memory macro can be mounted on a semiconductor integrated circuit even when the system interface specification differs. Accordingly, when designing a system, the design verification time, evaluation time, and test time of the semiconductor integrated circuit can be reduced. As a result, the design time and design cost of the semiconductor integrated circuit can be reduced.
    • 接口转换宏将符合从控制器输出的系统接口规范的信号转换为符合存储器接口规范的信号,并将其输出到存储器接口部分,并且还将从存储器宏输出的信号转换为 信号符合系统接口规范,并将其输出到控制器。 通过接口转换宏将系统接口规范和存储器接口规范相互转换,即使系统接口规范不同,公共存储器宏也可以安装在半导体集成电路上。 因此,当设计系统时,可以减少半导体集成电路的设计验证时间,评估时间和测试时间。 结果,可以减少半导体集成电路的设计时间和设计成本。
    • 9. 发明授权
    • Semiconductor integrated circuit device, and adjustment method of semiconductor integrated circuit device
    • 半导体集成电路器件及半导体集成电路器件的调整方法
    • US07459960B2
    • 2008-12-02
    • US11444401
    • 2006-06-01
    • Yasushige OgawaYoshiyuki IshidaMasato Matsumiya
    • Yasushige OgawaYoshiyuki IshidaMasato Matsumiya
    • G05F1/10
    • H03M1/1019G01R31/3167H03M1/66
    • It is intended to provide a semiconductor integrated circuit device and adjustment method of the same semiconductor integrated circuit device, capable of adjusting an analog signal outputted from an incorporated analog signal generating section without outputting it outside as an analog value. An analog signal AOUT is outputted from an analog signal generating section 3 in which an adjustment signal AD is inputted. The analog signal AOUT is inputted to a judgment section 1, in which it is compared and judged with a predetermined value and then a judgment signal JG is outputted. The judgment signal JG acts on a predetermined signal storing section 4 as an internal signal and the adjustment signal AD is fetched into the predetermined signal storing section 4. Further, the judgment signal JG is outputted as digital signal through an external terminal T2 and an external tester device acquires the adjustment signal and stores the acquired adjustment signal in the predetermined signal storing section 4. Consequently, the analog signal can be adjusted as analog value without being outputted outside and an adjustment test can be carried out with a simple tester device and according to a simple test method accurately and rapidly.
    • 本发明旨在提供一种半导体集成电路器件的半导体集成电路器件和调整方法,该半导体集成电路器件能够调整从内置的模拟信号产生部分输出的模拟信号而不将其输出为模拟值。 从输入调整信号AD的模拟信号生成部3输出模拟信号AOUT。 模拟信号AOUT被输入到判断部分1,在判定部分1中,以预定值进行比较和判断,然后输出判断信号JG。 判断信号JG作为内部信号作用在预定信号存储部分4上,并且调节信号AD被取出到预定信号存储部分4.此外,判断信号JG通过外部端子T2和外部信号作为数字信号输出 测试器装置获取调整信号并将获取的调节信号存储在预定信号存储部分4中。因此,可以将模拟信号调整为模拟值而不输出到外部,并且可以使用简单的测试装置进行调整测试,并根据 准确快速地进行简单的测试方法。
    • 10. 发明申请
    • Semiconductor integrated circuit device, and adjustment method of semiconductor integrated circuit device
    • 半导体集成电路器件及半导体集成电路器件的调整方法
    • US20060214724A1
    • 2006-09-28
    • US11444401
    • 2006-06-01
    • Yasushige OgawaYoshiyuki IshidaMasato Matsumiya
    • Yasushige OgawaYoshiyuki IshidaMasato Matsumiya
    • G05F1/10
    • H03M1/1019G01R31/3167H03M1/66
    • It is intended to provide a semiconductor integrated circuit device and adjustment method of the same semiconductor integrated circuit device, capable of adjusting an analog signal outputted from an incorporated analog signal generating section without outputting it outside as an analog value. An analog signal AOUT is outputted from an analog signal generating section 3 in which an adjustment signal AD is inputted. The analog signal AOUT is inputted to a judgment section 1, in which it is compared and judged with a predetermined value and then a judgment signal JG is outputted. The judgment signal JG acts on a predetermined signal storing section 4 as an internal signal and the adjustment signal AD is fetched into the predetermined signal storing section 4. Further, the judgment signal JG is outputted as digital signal through an external terminal T2 and an external tester device acquires the adjustment signal and stores the acquired adjustment signal in the predetermined signal storing section 4. Consequently, the analog signal can be adjusted as analog value without being outputted outside and an adjustment test can be carried out with a simple tester device and according to a simple test method accurately and rapidly.
    • 本发明旨在提供一种半导体集成电路器件的半导体集成电路器件和调整方法,该半导体集成电路器件能够调整从内置的模拟信号产生部分输出的模拟信号而不将其输出为模拟值。 从输入调整信号AD的模拟信号生成部3输出模拟信号AOUT。 模拟信号AOUT被输入到判断部分1,在判定部分1中,以预定值进行比较和判断,然后输出判断信号JG。 判断信号JG作为内部信号作用在预定信号存储部分4上,并且将调整信号AD提取到预定信号存储部分4中。 此外,判断信号JG通过外部端子T 2作为数字信号输出,外部测试装置获取调整信号,并将取得的调整信号存储在规定的信号存储部4中。 因此,可以将模拟信号调整为模拟值而不输出到外部,并且可以使用简单的测试装置并且根据简单的测试方法准确而快速地进行调整测试。