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    • 1. 发明申请
    • Optical Microscope
    • 光学显微镜
    • US20110079712A1
    • 2011-04-07
    • US12995659
    • 2009-06-03
    • Yoshimasa KawataAtsuo Miyakawa
    • Yoshimasa KawataAtsuo Miyakawa
    • G01N23/22G01J1/58
    • G01Q30/02G01Q60/20G02B21/16G02B27/58H01J37/256H01J63/06H01J2237/2003
    • An optical microscope for optically measuring a sample (30) includes: a fluorescent thin membrane (13) which at least partly contains fluorescent substance and on which the sample (30) is placed; an electron source (11) for generating an electron beam; an electron lens (12) for focusing the electron beam generated by the electron source (11) in such a manner as to excite a minute light source having a wavelength shorter than a visible light wavelength from the fluorescent thin membrane (13) so as to irradiate the fluorescent thin membrane (13) with the electron beam, and further, scanning the focused electron beam; and an optical detector (22) for detecting a measurement light beam which is generated in the minute light source and acts on the sample (30).
    • 用于光学测量样品(30)的光学显微镜包括:荧光薄膜(13),其至少部分地含有荧光物质,并且所述样品(30)放置在所述荧光薄膜上; 用于产生电子束的电子源(11); 电子透镜(12),用于聚焦由电子源(11)产生的电子束,以便从荧光薄膜(13)激发具有比可见光波长短的波长的微小光源,以便 用电子束照射荧光薄膜(13),进一步扫描聚焦电子束; 以及用于检测在微小光源中产生并作用在样品(30)上的测量光束的光学检测器(22)。
    • 4. 发明授权
    • Optical microscope
    • 光学显微镜
    • US08217346B2
    • 2012-07-10
    • US12995659
    • 2009-06-03
    • Yoshimasa KawataAtsuo Miyakawa
    • Yoshimasa KawataAtsuo Miyakawa
    • G01N23/22
    • G01Q30/02G01Q60/20G02B21/16G02B27/58H01J37/256H01J63/06H01J2237/2003
    • An optical microscope for optically measuring a sample (30) includes: a fluorescent thin membrane (13) which at least partly contains fluorescent substance and on which the sample (30) is placed; an electron source (11) for generating an electron beam; an electron lens (12) for focusing the electron beam generated by the electron source (11) in such a manner as to excite a minute light source having a wavelength shorter than a visible light wavelength from the fluorescent thin membrane (13) so as to irradiate the fluorescent thin membrane (13) with the electron beam, and further, scanning the focused electron beam; and an optical detector (22) for detecting a measurement light beam which is generated in the minute light source and acts on the sample (30).
    • 用于光学测量样品(30)的光学显微镜包括:荧光薄膜(13),其至少部分地含有荧光物质,并且所述样品(30)放置在所述荧光薄膜上; 用于产生电子束的电子源(11); 电子透镜(12),用于聚焦由电子源(11)产生的电子束,以便从荧光薄膜(13)激发具有比可见光波长短的波长的微小光源,以便 用电子束照射荧光薄膜(13),进一步扫描聚焦电子束; 以及用于检测在微小光源中产生并作用在样品(30)上的测量光束的光学检测器(22)。