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    • 2. 发明授权
    • Tunable broadband anti-relfection apparatus
    • 可调式宽带抗再感器
    • US08299435B2
    • 2012-10-30
    • US12855332
    • 2010-08-12
    • Xi-Cheng ZhangPengyu HanYuting W. Chen
    • Xi-Cheng ZhangPengyu HanYuting W. Chen
    • G01J5/08
    • G02B1/118
    • A broadband anti-reflection apparatus for use with terahertz radiation includes a layer having an outer surface comprising a plurality of pyramid structures having about a 30 μm to about a 110 μm period, and wherein reflectance of the terahertz radiation is reduced compared to a layer comprising a planar outer surface. Also disclosed is a method for modifying terahertz radiation which includes receiving terahertz radiation on a device having an anti-reflection layer having an outer surface comprising a plurality of pyramid structures having about a 30 μm to a 110 μm period, and modifying the terahertz radiation passing through the device or processing the terahertz radiation in the device.
    • 一种与太赫兹辐射一起使用的宽带抗反射装置包括具有外表面的层,该层具有包括大约30μm至大约110μm周期的多个金字塔结构,并且与包括以下的层相比,太赫兹辐射的反射率降低: 平面外表面。 还公开了一种用于修改太赫兹辐射的方法,其包括在具有抗反射层的装置上接收太赫兹辐射,所述抗反射层具有外表面,该外表面包括具有约30μm至110μm周期的多个金字塔结构,并且修改太赫兹辐射通过 通过设备或处理设备中的太赫兹辐射。
    • 4. 发明授权
    • T-ray Microscope
    • T型显微镜
    • US06977379B2
    • 2005-12-20
    • US10434329
    • 2003-05-08
    • Xi-Cheng ZhangJingzhou XuTao Yuan
    • Xi-Cheng ZhangJingzhou XuTao Yuan
    • G01N21/35G02B21/00
    • G01N21/3581G01N21/3563G02B21/00
    • A microscope for producing an image of a target using THz radiation. The microscope comprises a source for providing an optical pump pulse and an optical probe pulse; a THz emitter for activation by pump pulse to emit a THz pulse that irradiates the target to form a target-modified THz pulse; a THz detector for modulating the probe pulse with the target-modified THz pulse to create a modulated optical probe pulse characteristic of the target; an optical detection system for modifying and detecting the modulated optical probe pulse and converting the modulated optical probe pulse to electronic information; and a processor for receiving the electronic information and producing an image of the sample using the electronic information. The THz emitter and detector comprise one or more EO crystals. The target is positioned on one of the EO crystals in a near-field of the THz pulse.
    • 用于使用太赫兹辐射产生目标图像的显微镜。 显微镜包括用于提供光泵浦脉冲和光探针脉冲的源; 用于通过泵浦脉冲激活的THz发射器发射照射目标以形成目标修正的THz脉冲的THz脉冲; THz检测器,用于用目标修正的THz脉冲调制探针脉冲,以产生目标的调制光探针脉冲特性; 光学检测系统,用于修改和检测调制的光探针脉冲并将调制的光探针脉冲转换成电子信息; 以及处理器,用于接收电子信息并使用电子信息产生样本的图像。 太赫兹发射器和检测器包括一个或多个EO晶体。 目标位于太赫兹脉冲的近场中的一个EO晶体上。
    • 7. 发明授权
    • Microwave radiation source
    • 微波辐射源
    • US5420595A
    • 1995-05-30
    • US144724
    • 1993-10-28
    • Xi-Cheng ZhangDavid H. Auston
    • Xi-Cheng ZhangDavid H. Auston
    • H01Q3/26H01Q3/44H01Q3/22H01Q1/06H01Q3/24
    • H01Q3/44H01Q3/2676
    • A source of collimated beam or beams of microwave electromagnetic radiation pulses comprises a photoconductor substrate having a major surface and an optical radiation source providing a beam of optical radiation pulses for illuminating at least a relatively large aperture region of the major surface. A static electric field, intrinsic or applied, is present at the major surface for driving transient photocurrents generated by the beam of optical radiation pulses. Each beam of microwave electromagnetic radiation pulses emitted from the photoconductor substrate may be steered by varying the angle of incidence of the beam of optical radiation pulses illuminating the major surface, by varying the period of the spatial variation of a static electric field applied to the major surface by means of electrodes, or by varying the period or direction of a periodic intensity variation of a spatially modulated beam of optical radiation pulses on the major surface.
    • 微波电磁辐射脉冲的准直光束或光束的源包括具有主表面的光电导体基底和提供用于照射主表面的至少相对大的开口区域的光辐射脉冲束的光辐射源。 固有或应用的静电场存在于主表面上,用于驱动由光辐射脉冲束产生的瞬态光电流。 通过改变施加到主表面的静电场的空间变化的周期,可以通过改变照射主表面的光辐射脉冲束的入射角来控制从感光体基板发射的每束微波电磁辐射脉冲 或通过改变在主表面上的空间调制光束的光辐射脉冲的周期性强度变化的周期或方向。
    • 9. 发明申请
    • PLASMA DIAGNOSTIC METHOD USING TERAHERTZ-WAVE-ENHANCED FLUORESCENCE
    • 使用TERAHERTZ-WAVE增强荧光的等离子体诊断方法
    • US20120193535A1
    • 2012-08-02
    • US13097866
    • 2011-04-29
    • Xi-Cheng ZHANGJingle LIU
    • Xi-Cheng ZHANGJingle LIU
    • G01J5/10
    • G01N21/64G01N21/1702G01N21/3577G01N21/3586G01N2021/1704
    • Methods and systems for characterizing a plasma with radiation, particularly, terahertz (THz) radiation, are disclosed. The disclosed method of characterizing a plasma includes directing THz radiation into the plasma; and detecting an emission due to interaction of the THz radiation with the plasma to characterize the plasma. A disclosed plasma characterizing device includes a means for directing THz radiation into a plasma; and a detector adapted to detect an emission emitted by the plasma due to interaction of the THz radiation with the plasma to characterize the plasma. A plasma characterizing system is also disclosed. The emission detected may be a fluorescence, a variation in fluorescence and/or an acoustic emission.
    • 公开了用于表征具有辐射特别是太赫兹(THz)辐射的等离子体的方法和系统。 所公开的表征等离子体的方法包括将THz辐射引入等离子体; 并且检测由于THz辐射与等离子体的相互作用引起的发射以表征等离子体。 公开的等离子体表征装置包括用于将太赫兹辐射引导到等离子体中的装置; 以及检测器,其适于检测由于THz辐射与等离子体的相互作用而发射的等离子体的发射以表征等离子体。 还公开了等离子体表征系统。 检测到的发射可以是荧光,荧光和/或声发射的变化。