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    • 1. 发明授权
    • Broad-range ion mass spectrometer
    • 宽范围离子质谱仪
    • US4223223A
    • 1980-09-16
    • US886755
    • 1978-03-15
    • Wolfgang O. HoferJurgen KirschnerFranz Thum
    • Wolfgang O. HoferJurgen KirschnerFranz Thum
    • G01T1/28H01J49/02H01J3/14
    • H01J49/025G01T1/28
    • An essentially linear ion beam is derived from an ion emitting sample, inding a high-frequency mass filter of essentially linear ion beam path, the ion beam path extending towards an ion-electron converter of general rotation symmetrical shape with respect to an axis, the ion-electron converter having an axis aligned with the essentially linear ion beam path and including an electrode which has an aperture traversed by the beam from the source after having passed through the filter, the electrode having a secondary electron-emissive surface on a side thereof which is averted from the ion source and formed as a smoothly curved concave surface defining a converter chamber, the ions which have passed through the aperture being reflected back unto the secondary electron-emissive surface to then being detected by an electrode positioned within the converter chamber. Bias voltage sources bias the electrode with respect to the secondary electron-emissive surface to provide for reflection of ions on the secondary electron-emissive surface.
    • 基本上线性的离子束源自离子发射样品,包括基本线性离子束路径的高频质量过滤器,离子束路径相对于轴线向一般旋转对称形状的离子 - 电子转换器延伸, 离子 - 电子转换器具有与基本上线性的离子束路径对准的轴线,并且包括电极,该电极在已经通过过滤器之后具有由来自源的光束穿过的孔,该电极在其一侧具有二次电子发射表面 其从离子源避免并且形成为限定转换器室的平滑弯曲的凹面,已经穿过孔的离子被反射回到二次电子发射表面,然后由位于转换器室内的电极检测 。 偏置电压源相对于二次电子发射表面偏置电极以提供二次电子发射表面上的离子的反射。