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    • 2. 发明授权
    • Method and system for extracting spectroscopic information from images and waveforms
    • 从图像和波形提取光谱信息的方法和系统
    • US08724774B2
    • 2014-05-13
    • US12850595
    • 2010-08-04
    • Willem Gerhardus Johannes Langeveld
    • Willem Gerhardus Johannes Langeveld
    • G01N23/04
    • G01N23/063G01N23/085G01N23/087
    • The application discloses systems and methods for determining an atomic number of a material being scanned by generating a predetermined number of transmission data samples, determining a variance of the transmission data samples, and determining the atomic number of the material being scanned by comparing the variance or a derivative of the variance of the transmission data samples to one or more predetermined variances. The application also discloses systems and methods for determining an atomic number of a material being scanned by deriving transmission signal samples of the material being scanned, determining a variance of the signal samples, and determining an atomic number of the material being scanned by comparing the variance of the signal samples, or a derivative of the variance, to one or more predetermined variances.
    • 该申请公开了用于通过生成预定数量的传输数据样本来确定被扫描的材料的原子序号,确定传输数据样本的方差以及通过比较方差来确定被扫描的材料的原子序号的系统和方法, 将传输数据样本的方差的导数代入一个或多个预定方差。 本申请还公开了通过导出正被扫描的材料的传输信号样本来确定被扫描的材料的原子序号,确定信号样本的方差,以及通过比较方差来确定被扫描的材料的原子序号来确定被扫描材料的​​原子序数的系统和方法 信号样本或方差的导数代表一个或多个预定方差。