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    • 8. 发明申请
    • Multi-Parameter X-Ray Computed Tomography
    • 多参数X射线计算机断层扫描
    • US20100310037A1
    • 2010-12-09
    • US12794160
    • 2010-06-04
    • Ge WANGWenxiang Cong
    • Ge WANGWenxiang Cong
    • G01N23/201A61B6/03
    • A61B6/06A61B6/032A61B6/4291A61B6/583
    • The present invention relates to the field of x-ray imaging. More particularly, embodiments of the invention relate to methods, systems, and apparatus for imaging, which can be used in a wide range of applications, including medical imaging, security screening, and industrial non-destructive testing to name a few. Specifically provided as embodiments of the invention are systems for x-ray imaging comprising: a) a first collimator-and-detector assembly having a first operable configuration to provide at least one first dataset comprising primary x-ray signals as a majority component of its data capable of being presented as a first image of an object subjected to x-ray imaging; b) a second collimator-and-detector assembly having a second operable configuration or wherein the first collimator-and-detector assembly is adjustable to a second configuration to provide at least one second dataset comprising primary and dark-field x-ray signals as a majority component of its data capable of being presented as a second image of the object; and c) a computer operably coupled with the collimator-and-detector assemblies comprising a computer readable medium embedded with processing means for combining the first dataset and the second dataset to extract the dark-field x-ray signals and produce a target image having higher contrast quality than the images based on the first or second dataset alone. Such systems can be configured to comprise at least two collimator-and-detector assemblies or configurations differing with respect to collimator height, collimator aperture, imaging geometry, or distance between an object subjected to the imaging and the collimator-and-detector assembly.
    • 本发明涉及X射线成像领域。 更具体地,本发明的实施例涉及用于成像的方法,系统和装置,其可以用于广泛的应用,包括医学成像,安全性筛选和工业非破坏性测试等等。 作为本发明的实施例具体提供的是用于x射线成像的系统,包括:a)第一准直仪和检测器组件,其具有第一可操作配置,以提供至少一个第一数据集,所述第一数据集包括主X射线信号作为其主要成分 能够被呈现为经受X射线成像的物体的第一图像的数据; b)具有第二可操作构型的第二准直器和检测器组件,或者其中第一准直器和检测器组件可调整到第二配置以提供包括主场和暗场x射线信号的至少一个第二数据集,作为 其数据的多数分量能够被呈现为对象的第二图像; 以及c)与所述准直仪和检测器组件可操作地耦合的计算机,包括嵌入有处理装置的计算机可读介质,所述处理装置用于组合所述第一数据集和所述第二数据集以提取所述暗场x射线信号并产生具有较高 对比质量比基于第一或第二数据集的图像单独。 这样的系统可以被配置为包括关于准直器高度,准直器孔径,成像几何形状或经受成像的物体与准直器和检测器组件之间的距离不同的至少两个准直器和检测器组件或构造。