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    • 3. 发明授权
    • Dual damascene
    • 双镶嵌
    • US06080663A
    • 2000-06-27
    • US191297
    • 1998-11-13
    • Chih-Rong ChenWen-Yuan Huang
    • Chih-Rong ChenWen-Yuan Huang
    • H01L21/3115H01L21/768H01L21/4763
    • H01L21/76825H01L21/76813H01L21/31155
    • A dual damascene process is provided. A dielectric layer is formed on a substrate having a conductive region. The dielectric layer is selectively doped to form a doped region aligned over the conductive region. The doped region, the dielectric layer underlying the doped region, and another part of the undoped dielectric layer are etched until the conductive region is exposed, so that a dual damascene opening exposing the conductive region and a trench are formed, wherein the dual damascene opening comprising a upper trench and a lower via hole. The dual damascene opening and the trench are filled with a conductive layer.
    • 提供了双镶嵌工艺。 在具有导电区域的基板上形成介电层。 电介质层被选择性地掺杂以形成在导电区域上对准的掺杂区域。 蚀刻掺杂区域,掺杂区域下面的电介质层和未掺杂电介质层的另一部分,直到导电区域被暴露,从而形成露出导电区域和沟槽的双镶嵌开口,其中双镶嵌开口 包括上沟槽和下通孔。 双镶嵌开口和沟槽填充有导电层。
    • 4. 发明授权
    • Method of manufacturing and application of dual alignment photomask
    • 双取向光掩模的制造和应用方法
    • US06171732B2
    • 2001-01-09
    • US09304627
    • 1999-05-04
    • Chih-Rong ChenWen-Yuan Huang
    • Chih-Rong ChenWen-Yuan Huang
    • G03F900
    • G03F1/38G03F7/70291
    • A method of forming a dual alignment photomask. The method includes the steps of depositing a light-blocking layer over a glass plate, and then patterning the light-blocking layer. Next, a switchable mask layer is deposited over the light-blocking layer and the glass plate, after which the switchable mask layer is patterned. Finally, a protective layer is formed over the switchable mask layer, the light-blocking layer and the glass plate. The switchable mask layer can be changed from a light-passing state to a light-blocking state by simply changing the surrounding temperature. Therefore, through proper setting the temperature, the same photomask can be used to form trenches and vias of dual damascene structures. Thus, some mask-making cost can be saved and errors due to mask misalignment can be avoided.
    • 形成双重取向光掩模的方法。 该方法包括以下步骤:在玻璃板上沉积遮光层,然后对遮光层进行图案化。 接下来,在遮光层和玻璃板上沉积可切割掩模层,然后对可切换掩模层进行图案化。 最后,在可切换掩模层,遮光层和玻璃板上形成保护层。 通过简单地改变周围温度,可切换掩模层可以从光通过状态变为遮光状态。 因此,通过适当设定温度,可以使用相同的光掩模来形成双镶嵌结构的沟槽和通孔。 因此,可以节省一些掩模制造成本,并且可以避免由于掩模不对准引起的误差。