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    • 3. 发明申请
    • MIM CAPACITOR STRUCTURE AND METHOD OF MANUFACTURING THE SAME
    • MIM电容器结构及其制造方法
    • US20070145525A1
    • 2007-06-28
    • US11463893
    • 2006-08-11
    • Ching-Chiun WangCha-Hsin LinWen-Miao LoLurng-Shehng Lee
    • Ching-Chiun WangCha-Hsin LinWen-Miao LoLurng-Shehng Lee
    • H01L29/00
    • H01L28/75H01L28/65
    • A metal-insulator-insulator (MIM) capacitor structure is provided. The MIM capacitor includes a top electrode, a bottom electrode and a dielectric layer. The dielectric layer is disposed between the top electrode and the bottom electrode. The main feature for this kind of MIM capacitor is that the bottom electrode includes a conductive layer and a metal nitride with multi-layered structure. The metal nitride with multi-layered structure is disposed between the conductive layer and the dielectric layer. The nitrogen content in the metal nitride with multi-layered structure gradually increases toward the dielectric layer and the metal nitride belongs to the amorphous type. Due to the presence of the metal nitride, the dielectric layer is prevented from crystallization, thereby reducing the current leakage of the MIM capacitor.
    • 提供了一种金属绝缘体绝缘体(MIM)电容器结构。 MIM电容器包括顶电极,底电极和电介质层。 介电层设置在顶部电极和底部电极之间。 这种MIM电容器的主要特征在于,底部电极包括导电层和具有多层结构的金属氮化物。 具有多层结构的金属氮化物被设置在导电层和电介质层之间。 具有多层结构的金属氮化物中的氮含量朝向电介质层逐渐增加,并且金属氮化物属于非晶型。 由于金属氮化物的存在,阻止介电层结晶,从而减少MIM电容器的电流泄漏。