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    • 4. 发明授权
    • Systems and methods for calibrating an optical non-contact surface roughness measurement device
    • 用于校准光学非接触表面粗糙度测量装置的系统和方法
    • US08582117B2
    • 2013-11-12
    • US13083130
    • 2011-04-08
    • Mark SouthwoodWayne Case
    • Mark SouthwoodWayne Case
    • G01B11/30
    • G01B11/303
    • A calibration apparatus for an optical non-contact surface roughness measurement device allowing for quick, accurate, and repeatable device calibration is described. In certain embodiments, the calibration apparatus may include a base, one or more calibration surfaces coupled to a top surface of the base, and an alignment collar coupled to the top surface of the base defining a window exposing the one or more calibration surfaces. By utilizing the mechanical structure of the alignment collar and base, the optical non-contact surface roughness measurement device may be accurately aligned with respect to the calibration surfaces, allowing for repeatable calibration measurements.
    • 描述了一种用于允许快速,精确和可重复的装置校准的光学非接触表面粗糙度测量装置的校准装置。 在某些实施例中,校准装置可以包括底座,联接到基座的顶表面的一个或多个校准表面,以及联接到基座的顶表面的对准套环,其限定露出一个或多个校准表面的窗口。 通过利用对准轴环和基座的机械结构,光学非接触表面粗糙度测量装置可以相对于校准表面精确对准,允许可重复的校准测量。
    • 6. 发明申请
    • SYSTEMS AND METHODS FOR CALIBRATING AN OPTICAL NON-CONTACT SURFACE ROUGHNESS MEASUREMENT DEVICE
    • 用于校准光学非接触表面粗糙度测量装置的系统和方法
    • US20120257217A1
    • 2012-10-11
    • US13083130
    • 2011-04-08
    • MARK SOUTHWOODWAYNE CASE
    • MARK SOUTHWOODWAYNE CASE
    • G01B11/30
    • G01B11/303
    • A calibration apparatus for an optical non-contact surface roughness measurement device allowing for quick, accurate, and repeatable device calibration is described. In certain embodiments, the calibration apparatus may include a base, one or more calibration surfaces coupled to a top surface of the base, and an alignment collar coupled to the top surface of the base defining a window exposing the one or more calibration surfaces. By utilizing the mechanical structure of the alignment collar and base, the optical non-contact surface roughness measurement device may be accurately aligned with respect to the calibration surfaces, allowing for repeatable calibration measurements.
    • 描述了一种用于允许快速,精确和可重复的装置校准的光学非接触表面粗糙度测量装置的校准装置。 在某些实施例中,校准装置可以包括底座,联接到基座的顶表面的一个或多个校准表面,以及联接到基座的顶表面的对准套环,其限定露出一个或多个校准表面的窗口。 通过利用对准轴环和基座的机械结构,光学非接触表面粗糙度测量装置可以相对于校准表面精确对准,允许可重复的校准测量。