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    • 3. 发明授权
    • Method of and measuring arrangement for contactless on-line measurement
    • 非接触式在线测量方法和测量方法
    • US5352038A
    • 1994-10-04
    • US185168
    • 1994-01-24
    • Hugo SchmidtManfred RuckszioRaimund HaasWalter Mackert
    • Hugo SchmidtManfred RuckszioRaimund HaasWalter Mackert
    • G01B11/30G01N25/00G01N21/55
    • G01B11/303
    • With an infrared radiator, the surface temperature of which is kept constant during measurement, a measuring area on a roughened material surface is thermally irradiated with oblique incidence of the rays. The temperature of the reflected thermal radiation is measured by an infrared thermometer, which is arranged above the measuring area in such a way that the reflected radiation falls into the area of coverage of the infrared thermometer. The entire measuring area of the material surface which lies in the field of coverage of the infrared thermometer must be thermally irradiated. The measured temperature variation of the reflected radiation in dependence on the known surface roughness of the material is stored in a comparison device. This comparison device is fed a set value for the desired surface roughness. The infrared temperature of a material surface, initially unknown with respect to its surface roughness, is measured and compared with the stored temperature variation, in order to determine the magnitude of the surface roughness. From the value thus obtained and the set value fed in, a differential signal is formed, which is fed via the output of the comparison device to a control of a treatment device for the material.
    • 使用红外辐射器,其表面温度在测量期间保持恒定,粗糙材料表面上的测量区域被光线的倾斜入射热照射。 反射热辐射的温度由红外线温度计测量,红外线温度计设置在测量区域的上方,使得反射的辐射落入红外线温度计的覆盖区域。 位于红外线温度计覆盖范围内的材料表面的整个测量区域必须进行热照射。 根据材料的已知表面粗糙度测量的反射辐射的测量温度变化被存储在比较装置中。 该比较装置被馈送用于所需表面粗糙度的设定值。 测量材料表面的相对于其表面粗糙度最初未知的红外温度,并与存储的温度变化进行比较,以确定表面粗糙度的大小。 根据这样获得的值和输入的设定值,形成差分信号,该差分信号通过比较装置的输出馈送到材料的处理装置的控制。